Walter H Edmondson

US Patent:

7496820, Feb 24, 2009

Filed:

Mar 7, 2006

Appl. No.:

11/369670

Inventors:

Conrad A. Theron - San Jose CA, US
Michael L. Simmons - Monte Sereno CA, US
Walter H. Edmondson - Morgan Hill CA, US
Mihai G. Statovici - Santa Barbara CA, US

Assignee:

Xilinx, Inc. - San Jose CA

International Classification:

G06F 11/00

US Classification:

714738, 714742, 714725, 714726, 714727, 714 25, 714724, 714741, 716 4, 716 5, 716 16, 716 17, 716 18, 703 15, 703 20

Abstract:

Method, apparatus, and computer readable medium for generating test vectors for an integrated circuit (IC) under test is described. In one example, a test function is specified using at least one elementary function that encapsulates program code associated with an architecture of the IC under test. An engine is configured with device description data for the IC under test. The engine is executed with the test function as parametric input to generate the test vectors. In one example, the IC under test comprises a programmable logic device (PLD) and the test vectors include configuration data for configuring a pattern in the PLD and at least one test vector for exercising the pattern. The test vectors may be applied directly to the device or through automatic test equipment (ATE). Alternatively, the test vectors may be applied to a IC design simulation of the device.

US Patent:

6393591, May 21, 2002

Filed:

Feb 12, 1999

Appl. No.:

09/249907

Inventors:

Walter H. Edmondson - Morgan Hill CA

Assignee:

Xilinx, Inc. - San Jose CA

International Classification:

G01R 3128

US Classification:

714725, 714726, 714727

Abstract:

The Internet is used to test an integrated circuit chip that is provided with boundary scan circuitry and plugged into a circuit board at a customers location. A host computer at the manufacturers location runs a web page server having the ability to remotely test a customers chip. The process is initiated by the customer connecting the circuit board to his own computer and logging onto the web site. The customer transmits customer identification and other data to the web server, which then transmits a downloader program and a JAVA program script to the customers computer. The customers computer then uses the downloader program to transmit high and low level device data describing the functionality of the chip to the host computer, which then generates and transmits a set of suitable test vectors to the customers computer. Then, the customers computer tests the chip using the boundary scan circuitry and test vectors and transmits the test results to the host computer, which then produces and transmits an evaluation of the results to the customers computer.