Vahe A Adamian

Address:

1497 Doral Cir, Westlake Vlg, CA 91362

VIN:

JTJZB1BA4A2001653

Make:

LEXUS

Model:

RX 450H

Year:

2010

US Patent:

6653848, Nov 25, 2003

Filed:

Sep 18, 2001

Appl. No.:

09/954962

Inventors:

Vahe Adamian - Lexington MA
Peter V. Phillips - Leominster MA
Patrick J. Enquist - Worcester MA
J. Bradford Cole - Westford MA

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

G01R 2704

US Classification:

324638, 324601, 324615, 702 85, 702109, 702117, 703 2, 703 14

Abstract:

A method and apparatus for characterizing a device under test (âDUTâ) calibrates a multiport test set and measures S-parameters [S] of the DUT. The method and apparatus further involves determining elements of a scalar orthogonal matrix [M] corresponding to terminals of the DUT and DUT modes of operation. The scalar orthogonal matrix [M] comprises a row of elements representing a single-ended terminal of the DUT, and four rows of elements representing a balanced terminal of the DUT. The S-parameters of the DUT are then transformed into mixed-mode S-parameters [S ] according to S =MSM. A method of and apparatus for characterizing a DUT involves calibrating a multiport test set, coupling the DUT to the multiport test set, and measuring S-parameters of the DUT. The S-parameters are converted to a time domain representation and at least one of the S-parameters is convolved with a simulated input signal to generate an output response. The output response is then displayed.

US Patent:

6744262, Jun 1, 2004

Filed:

Mar 14, 2002

Appl. No.:

10/098040

Inventors:

Vahe A. Adamian - Lexington MA

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

G01R 2732

US Classification:

324638, 324601, 324612, 702 57, 703 2

Abstract:

A method, apparatus and article of manufacture to aid in the characterization of a device establishes a device S-parameter matrix (S ) to represent electrical behavior of the device, an adapter T-parameter matrix (T ) to represent all possible electrical paths through circuits to all device ports of the device, and a cascaded S-parameter matrix (S ) to represent the circuits cascaded with the device. Values for the adapter T-parameter matrix are obtained either through measurement or modeling. The device cascaded with the circuits is measured to obtain values for the cascaded S-parameter matrix, permitting use of a general solution for the device S-parameter matrix as a function of the adapter T-parameter matrix and the cascaded S-parameter matrix.

US Patent:

6853198, Feb 8, 2005

Filed:

Nov 14, 2002

Appl. No.:

10/294317

Inventors:

Ali Boudiaf - Malden MA, US
Vahe Adamian - Lexington MA, US
Peter Phillips - Leominister MA, US

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

G01R035/00
G01R027/04

US Classification:

324601, 324638

Abstract:

A method and apparatus for calibrating a measurement path of 2N measurement ports comprises presenting a high reflect calibration standard at each measurement port and measuring a reflection characteristic for each measurement port, presenting a line calibration standard and a through calibration standard between each one of N direct pairs of the measurement ports and measuring forward and reverse reflection and transmission responses and calculating a load match error coefficient for each measurement port, and presenting only the through calibration standard between indirect pairs of measurement ports and calculating the forward and reverse transmission tracking for each indirect pairs of measurement ports.

US Patent:

7068049, Jun 27, 2006

Filed:

Aug 5, 2003

Appl. No.:

10/635395

Inventors:

Vahe Adamian - Westlake Village CA, US

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

G01R 27/04
G01R 27/28

US Classification:

324638, 324612

Abstract:

A method of measuring a DUT provides a vector network analyzer with at least two measurement ports and measures characteristics of thru, reflect, and line calibration standards at the measurement ports. Error coefficients are calculated as well as a shifted electrical length attributable to the measured calibration standards. S-parameters of the DUT are measured and corrected based upon the error coefficients. A reference plane is shifted for each element of the corrected S-parameter matrix to a measurement reference plane, and.

US Patent:

20040160230, Aug 19, 2004

Filed:

Feb 17, 2004

Appl. No.:

10/780054

Inventors:

Vahe Adamian - Lexington MA, US

International Classification:

G01R035/00
G01R027/04
G01R027/32

US Classification:

324/638000

Abstract:

A method, apparatus and article of manufacture to aid in the characterization of a device establishes a device S-parameter matrix (S) to represent electrical behavior of the device, an adapter T-parameter matrix (T) to represent all possible electrical paths through circuits to all device ports of the device, and a cascaded S-parameter matrix (S) to represent the circuits cascaded with the device. Values for the adapter T-parameter matrix are obtained either through measurement or modeling. The device cascaded with the circuits is measured to obtain values for the cascaded S-parameter matrix, permitting use of a general solution for the device S-parameter matrix as a function of the adapter T-parameter matrix and the cascaded S-parameter matrix.

US Patent:

20050091015, Apr 28, 2005

Filed:

Oct 28, 2003

Appl. No.:

10/695850

Inventors:

Vahe Adamian - Westlake Village CA, US

International Classification:

G06F017/10

US Classification:

703002000

Abstract:

A method and apparatus for modeling a uniform transmission line obtains measured s-parameters of an connectivity system in combination with the uniform transmission line and mathematically isolates a representative portion of the uniform transmission line from the connectivity system by identifying an electrical position of the representative portion as distinct from the connectivity system. The measured s-parameters are adjusted to represent s-parameters of only the representative portion. Telegrapher's Equation transmission parameters are then extracted from the adjusted measured s-parameters.

US Patent:

20050138577, Jun 23, 2005

Filed:

Dec 18, 2003

Appl. No.:

10/739588

Inventors:

Vahe Adamian - Westlake Village CA, US

International Classification:

G06F017/50

US Classification:

716001000, 717100000

Abstract:

A method, apparatus and article of manufacture for manufacturing a balanced circuit obtains S-parameters for the balanced circuit and determines a delay value embedded at one of the single-ended terminals of the balanced circuit that reduces a differential to common mode conversion mixed-mode transmission S-parameter.

US Patent:

20060181286, Aug 17, 2006

Filed:

May 23, 2005

Appl. No.:

11/391737

Inventors:

Vahe Adamian - Lexington MA, US

International Classification:

G01R 35/00

US Classification:

324601000

Abstract:

A method and system of calibrating first and second adapters comprises the steps of calibrating coaxial ports of a vector network analyzer to traceable standards and connecting a symmetrical through circuit path between the coaxial ports. The through circuit path comprises a cascaded combination of the first and second adapters. The first adapter is passive and substantially identical to the second adapter and uncascaded first and second adapters comprise a measurement device path. The through circuit path and the measurement device path have substantially equivalent S-parameters. S-parameters of the through circuit path are measured and then the first and second adapters are characterized based upon the measured S-parameters. The method and system may be applied to two port adapters and devices under test and may also be scaled for multi-port adapters and devices under test.