Search

Mark F Garringer

age ~42

from Eaton, IN

Mark Garringer Phones & Addresses

  • 6200 E County Road 1100 N, Eaton, IN 47338
  • Speedwell, TN
  • La Follette, TN
  • Terre Haute, IN
  • Redkey, IN

Work

  • Company:
    Remote sales force
    Dec 2016
  • Position:
    Principle software engineer

Education

  • Degree:
    Bachelors, Bachelor of Science
  • School / High School:
    Rose - Hulman Institute of Technology
    2001 to 2005
  • Specialities:
    Computer Engineering

Skills

Linux • Rest • Jquery • Visual Studio • Web Design • Web Development • Agile Methodologies • Ajax • Mobile Applications • Xml • Oop • Php • Javascript • Software Engineering • Sql • Software Development • Web Developers • Mobile Devices • C# • Object Oriented Design

Industries

Computer Software

Resumes

Mark Garringer Photo 1

Principle Software Engineer

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Location:
Eaton, IN
Industry:
Computer Software
Work:
Remote Sales Force
Principle Software Engineer

Pictometry International Corp. May 2011 - Mar 2014
Senior Software Engineer

Geoestimator 2008 - May 2011
Director of Software Development

Thornberry Consulting, Llc, Sdvosb Jun 2004 - May 2011
Lead Developer

Rose-Hulman Ventures Jun 2003 - Aug 2004
Software Engineering Intern
Education:
Rose - Hulman Institute of Technology 2001 - 2005
Bachelors, Bachelor of Science, Computer Engineering
Skills:
Linux
Rest
Jquery
Visual Studio
Web Design
Web Development
Agile Methodologies
Ajax
Mobile Applications
Xml
Oop
Php
Javascript
Software Engineering
Sql
Software Development
Web Developers
Mobile Devices
C#
Object Oriented Design

Us Patents

  • System And Process For Roof Measurement Using Aerial Imagery

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  • US Patent:
    8515125, Aug 20, 2013
  • Filed:
    Jan 25, 2013
  • Appl. No.:
    13/750449
  • Inventors:
    Dale R. Thornberry - Carmel IN, US
    Mark F. Garringer - Eaton IN, US
  • Assignee:
    Pictometry International Corp. - Rochester NY
  • International Classification:
    G06K 9/00
  • US Classification:
    382100
  • Abstract:
    The present disclosure shows creating a first layer and a second layer, in computer memory and substantially overlapping at least a segment of line from said first layer with at least a segment of another line from said second layer. A first non-dimensional attribute is different from said second non-dimensional attribute of the two lines. A user length field enabling a client with said interactive file to override at least one of said length numeric values, where said area operator may automatically recalculate area based on said length field override is shown. Also, providing a visual marker that is moveable on said computer monitor around said aerial imagery region, which may be moved, to more precisely identify the location of the building roof structure is shown.
  • System And Process For Roof Measurement Using Aerial Imagery

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  • US Patent:
    8542880, Sep 24, 2013
  • Filed:
    Feb 22, 2013
  • Appl. No.:
    13/774478
  • Inventors:
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • Assignee:
    Pictometry International Corp. - Rochester NY
  • International Classification:
    G06K 9/00
  • US Classification:
    382103
  • Abstract:
    Processes and systems are disclosed for determining attributes of a roof structure of real-world three-dimensional building(s), including providing computer input field(s) for a user to input location data generally corresponding to the location of the building, providing visual access to a nadir image of a region including the roof structure of the building; on the nadir image of the region, providing a visual marker that is moveable on the computer monitor around the region, the visual marker initially corresponding to the location data but which may be moved to a final location, having location coordinates, on top of the building to more precisely identify the location of the building roof structure; providing a computer input capable of signaling user-acceptance of the final location of the marker; and, providing visual access to one or more oblique images of an aerial imagery database corresponding to location coordinates of the final location.
  • System And Process For Roof Measurement Using Aerial Imagery

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  • US Patent:
    20100296693, Nov 25, 2010
  • Filed:
    May 22, 2009
  • Appl. No.:
    12/470984
  • Inventors:
    Dale R. Thornberry - Carmel IN, US
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • International Classification:
    G06K 9/00
  • US Classification:
    382100
  • Abstract:
    The present disclosure shows creating a first layer and a second layer, in computer memory and substantially overlapping at least a segment of line from said first layer with at least a segment of another line from said second layer. A first non-dimensional attribute is different from said second non-dimensional attribute of the two lines. A user length field enabling a client with said interactive file to override at least one of said length numeric values, where said area operator may automatically recalculate area based on said length field override is shown. Also, providing a visual marker that is moveable on said computer monitor around said aerial imagery region, which may be moved, to more precisely identify the location of the building roof structure is shown.
  • System And Process For Roof Measurement Using Aerial Imagery

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  • US Patent:
    20130138401, May 30, 2013
  • Filed:
    Jan 25, 2013
  • Appl. No.:
    13/750355
  • Inventors:
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • Assignee:
    Pictometry International Corp. - Rochester NY
  • International Classification:
    G06F 17/50
  • US Classification:
    703 1
  • Abstract:
    The present disclosure shows creating a first layer and a second layer, in computer memory and substantially overlapping at least a segment of line from said first layer with at least a segment of another line from said second layer. A first non-dimensional attribute is different from said second non-dimensional attribute of the two lines. A user length field enabling a client with said interactive file to override at least one of said length numeric values, where said area operator may automatically recalculate area based on said length field override is shown. Also, providing a visual marker that is moveable on said computer monitor around said aerial imagery region, which may be moved, to more precisely identify the location of the building roof structure is shown.
  • System And Process For Roof Measurement Using Aerial Imagery

    view source
  • US Patent:
    20130212536, Aug 15, 2013
  • Filed:
    Mar 6, 2013
  • Appl. No.:
    13/786699
  • Inventors:
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • Assignee:
    Pictometry International Corp. - Rochester NY
  • International Classification:
    G01B 11/28
    G06F 3/0481
  • US Classification:
    715848, 382100
  • Abstract:
    The present disclosure shows creating a first layer and a second layer, in computer memory and substantially overlapping at least a segment of line from said first layer with at least a segment of another line from said second layer. A first non-dimensional attribute is different from said second non-dimensional attribute of the two lines. A user length field enabling a client with said interactive file to override at least one of said length numeric values, where said area operator may automatically recalculate area based on said length field override is shown. Also, providing a visual marker that is moveable on said computer monitor around said aerial imagery region, which may be moved, to more precisely identify the location of the building roof structure is shown.
  • System And Process For Roof Measurement Using Aerial Imagery

    view source
  • US Patent:
    20140003707, Jan 2, 2014
  • Filed:
    Sep 5, 2013
  • Appl. No.:
    14/018943
  • Inventors:
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • Assignee:
    Pictometry International Corp. - Rochester NY
  • International Classification:
    G06K 9/00
  • US Classification:
    382154
  • Abstract:
    Processes and systems are disclosed for determining attributes of a roof structure of real-world three-dimensional building(s), including providing computer input field(s) for a user to input location data generally corresponding to the location of the building, providing visual access to a nadir image of a region including the roof structure of the building; on the nadir image of the region, providing a visual marker that is moveable on the computer monitor around the region, the visual marker initially corresponding to the location data but which may be moved to a final location, having location coordinates, on top of the building to more precisely identify the location of the building roof structure; providing a computer input capable of signaling user-acceptance of the final location of the marker; and, providing visual access to one or more oblique images of an aerial imagery database corresponding to location coordinates of the final location.
  • System And Process For Roof Measurement Using Imagery

    view source
  • US Patent:
    20210341285, Nov 4, 2021
  • Filed:
    Jul 12, 2021
  • Appl. No.:
    17/373048
  • Inventors:
    - Rochester NY, US
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • International Classification:
    G01B 11/28
    G06T 7/62
    G06F 30/13
    G06K 9/00
    G06F 3/0481
  • Abstract:
    The present disclosure describes systems and processes, including a computer process, comprising: determining, with one or more computer processors, attributes of a roof of a real-world three-dimensional building by: creating, with the one or more computer processors, a first electronic line drawing of a first plane of a roof of a building in a first drawing layer overlaid on an image depicting the roof of the building; creating, with the one or more computer processors, a second electronic line drawing of a second plane of the roof of the building in a second drawing layer on the image depicting the roof of the building, the first electronic line drawing and the second electronic line drawing having one or more overlapping lines; and assigning, with the one or more computer processors, one or more non-dimensional attributes to the overlapping lines, the non-dimensional attributes identifying one or more types of roof structures.
  • System And Process For Roof Measurement Using Imagery

    view source
  • US Patent:
    20200386543, Dec 10, 2020
  • Filed:
    May 11, 2020
  • Appl. No.:
    16/871596
  • Inventors:
    - Rochester NY, US
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • International Classification:
    G01B 11/28
    G06T 7/62
    G06F 30/13
    G06K 9/00
    G06F 3/0481
  • Abstract:
    The present disclosure describes systems and processes, including processes in which first location data is received. Visual access to a first image corresponding to the first location data is provided, the first image including a roof structure of a building. A first computer input capable of signaling a designation from the user of a building roof structure location within the first image is provided. A designation of the building roof structure location within the first image is received. Responsive to receiving the designation of the building roof structure location, a second computer input capable of signaling user-acceptance of the building roof structure location within the first image is provided. Subsequent to receiving the user-acceptance confirming the designation of the building roof structure location, a report of the roof structure is provided.

Flickr

Facebook

Mark Garringer Photo 10

Mark Shane Garringer Ind...

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Mark Shane Garringer (Indianapolis, IN)
Mark Garringer Photo 11

Mark Shane Garringer

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Myspace

Mark Garringer Photo 12

Mark Garringer

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Birthday:
1945
Mark Garringer Photo 13

Mark Garringer

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Locality:
Eaton, Indiana
Birthday:
1942
Mark Garringer Photo 14

Mark Garringer

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Locality:
FORT WAYNE, Indiana
Birthday:
1912

Googleplus

Mark Garringer Photo 15

Mark Garringer

Education:
Marion High School
Relationship:
Married
About:
Mark Garringer, father, hippie, husband, programmer, rpg gamer, runner, vegetarian, world traveler. I am currently running a Pathfinder homebrew set in Numeria codenamed: Lords of Light. I share info...
Mark Garringer Photo 16

Mark Garringer

Classmates

Mark Garringer Photo 17

Marion High School, Mario...

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Graduates:
Mark Garringer (1988-1992),
Amy Swierk (1995-1999),
Laurie Brown (1976-1980),
Tiffany Bowden (1993-1997),
Nancy Sufficool (1968-1972)

Youtube

Scottish bagpipe performance by Mark Garringer

  • Duration:
    54s

JCJSHS Christmas

  • Duration:
    32m 55s

Game Master's Journey 52 - Writing for Paizo ...

Mark Garringer returns to the show today with some tips on writing for...

  • Duration:
    37m 11s

Mariana bike #1

  • Duration:
    37s

Builders are building something?

My son trying to tell me something?

  • Duration:
    1m

Congrats to Obama!

Congrats to Obama!

  • Duration:
    4s

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