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Mark A Garringer

age ~50

from Fishers, IN

Also known as:
  • Mark Alan Garringer
  • Mark R
Phone and address:
8523 Legacy Ct, Fishers, IN 46038
317 910-5974

Mark Garringer Phones & Addresses

  • 8523 Legacy Ct, Fishers, IN 46038 • 317 910-5974
  • 2013 Buckingham Dr NW, Cedar Rapids, IA 52405 • 319 363-2574
  • 247 38Th Street Dr SE, Cedar Rapids, IA 52403
  • 4404 Armar Dr SE, Cedar Rapids, IA 52403
  • Phoenix, AZ
  • Marion, IA
  • Colorado Springs, CO

Work

  • Company:
    Navient
    May 2014
  • Position:
    Senior systems administrator

Education

  • School / High School:
    Marion High School
    1988 to 1992

Skills

System Administration • Disaster Recovery • Storage • Netbackup • Hp Ux • Hardware • Vmware • Dell Computers • Servers • Dns • Rhce • Rhel • San • Red Hat Linux • Unix • Linux • Troubleshooting • Unix Shell Scripting • Emc Storage • Shell Scripting • Virtualization • Vsphere • Netapp • Vmware Esx • Brocade • Storage Area Networks • Solaris • Redhat • Storage Area Network

Industries

Information Technology And Services

Resumes

Mark Garringer Photo 1

Senior Systems Administrator

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Location:
Fishers, IN
Industry:
Information Technology And Services
Work:
Navient
Senior Systems Administrator

Sallie Mae Aug 2007 - Apr 2014
Senior Systems Administrator

Godaddy Jul 2006 - Jul 2007
Email Administrator

Apac Customer Services Jul 1997 - Jun 2006
Systems Administration

Parsons Corporation Jan 1996 - Jun 1997
Customer Service Representative
Education:
Marion High School 1988 - 1992
Skills:
System Administration
Disaster Recovery
Storage
Netbackup
Hp Ux
Hardware
Vmware
Dell Computers
Servers
Dns
Rhce
Rhel
San
Red Hat Linux
Unix
Linux
Troubleshooting
Unix Shell Scripting
Emc Storage
Shell Scripting
Virtualization
Vsphere
Netapp
Vmware Esx
Brocade
Storage Area Networks
Solaris
Redhat
Storage Area Network

Us Patents

  • System And Process For Roof Measurement Using Aerial Imagery

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  • US Patent:
    8515125, Aug 20, 2013
  • Filed:
    Jan 25, 2013
  • Appl. No.:
    13/750449
  • Inventors:
    Dale R. Thornberry - Carmel IN, US
    Mark F. Garringer - Eaton IN, US
  • Assignee:
    Pictometry International Corp. - Rochester NY
  • International Classification:
    G06K 9/00
  • US Classification:
    382100
  • Abstract:
    The present disclosure shows creating a first layer and a second layer, in computer memory and substantially overlapping at least a segment of line from said first layer with at least a segment of another line from said second layer. A first non-dimensional attribute is different from said second non-dimensional attribute of the two lines. A user length field enabling a client with said interactive file to override at least one of said length numeric values, where said area operator may automatically recalculate area based on said length field override is shown. Also, providing a visual marker that is moveable on said computer monitor around said aerial imagery region, which may be moved, to more precisely identify the location of the building roof structure is shown.
  • System And Process For Roof Measurement Using Aerial Imagery

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  • US Patent:
    8542880, Sep 24, 2013
  • Filed:
    Feb 22, 2013
  • Appl. No.:
    13/774478
  • Inventors:
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • Assignee:
    Pictometry International Corp. - Rochester NY
  • International Classification:
    G06K 9/00
  • US Classification:
    382103
  • Abstract:
    Processes and systems are disclosed for determining attributes of a roof structure of real-world three-dimensional building(s), including providing computer input field(s) for a user to input location data generally corresponding to the location of the building, providing visual access to a nadir image of a region including the roof structure of the building; on the nadir image of the region, providing a visual marker that is moveable on the computer monitor around the region, the visual marker initially corresponding to the location data but which may be moved to a final location, having location coordinates, on top of the building to more precisely identify the location of the building roof structure; providing a computer input capable of signaling user-acceptance of the final location of the marker; and, providing visual access to one or more oblique images of an aerial imagery database corresponding to location coordinates of the final location.
  • System And Process For Roof Measurement Using Aerial Imagery

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  • US Patent:
    20100296693, Nov 25, 2010
  • Filed:
    May 22, 2009
  • Appl. No.:
    12/470984
  • Inventors:
    Dale R. Thornberry - Carmel IN, US
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • International Classification:
    G06K 9/00
  • US Classification:
    382100
  • Abstract:
    The present disclosure shows creating a first layer and a second layer, in computer memory and substantially overlapping at least a segment of line from said first layer with at least a segment of another line from said second layer. A first non-dimensional attribute is different from said second non-dimensional attribute of the two lines. A user length field enabling a client with said interactive file to override at least one of said length numeric values, where said area operator may automatically recalculate area based on said length field override is shown. Also, providing a visual marker that is moveable on said computer monitor around said aerial imagery region, which may be moved, to more precisely identify the location of the building roof structure is shown.
  • System And Process For Roof Measurement Using Aerial Imagery

    view source
  • US Patent:
    20130138401, May 30, 2013
  • Filed:
    Jan 25, 2013
  • Appl. No.:
    13/750355
  • Inventors:
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • Assignee:
    Pictometry International Corp. - Rochester NY
  • International Classification:
    G06F 17/50
  • US Classification:
    703 1
  • Abstract:
    The present disclosure shows creating a first layer and a second layer, in computer memory and substantially overlapping at least a segment of line from said first layer with at least a segment of another line from said second layer. A first non-dimensional attribute is different from said second non-dimensional attribute of the two lines. A user length field enabling a client with said interactive file to override at least one of said length numeric values, where said area operator may automatically recalculate area based on said length field override is shown. Also, providing a visual marker that is moveable on said computer monitor around said aerial imagery region, which may be moved, to more precisely identify the location of the building roof structure is shown.
  • System And Process For Roof Measurement Using Aerial Imagery

    view source
  • US Patent:
    20130212536, Aug 15, 2013
  • Filed:
    Mar 6, 2013
  • Appl. No.:
    13/786699
  • Inventors:
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • Assignee:
    Pictometry International Corp. - Rochester NY
  • International Classification:
    G01B 11/28
    G06F 3/0481
  • US Classification:
    715848, 382100
  • Abstract:
    The present disclosure shows creating a first layer and a second layer, in computer memory and substantially overlapping at least a segment of line from said first layer with at least a segment of another line from said second layer. A first non-dimensional attribute is different from said second non-dimensional attribute of the two lines. A user length field enabling a client with said interactive file to override at least one of said length numeric values, where said area operator may automatically recalculate area based on said length field override is shown. Also, providing a visual marker that is moveable on said computer monitor around said aerial imagery region, which may be moved, to more precisely identify the location of the building roof structure is shown.
  • System And Process For Roof Measurement Using Aerial Imagery

    view source
  • US Patent:
    20140003707, Jan 2, 2014
  • Filed:
    Sep 5, 2013
  • Appl. No.:
    14/018943
  • Inventors:
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • Assignee:
    Pictometry International Corp. - Rochester NY
  • International Classification:
    G06K 9/00
  • US Classification:
    382154
  • Abstract:
    Processes and systems are disclosed for determining attributes of a roof structure of real-world three-dimensional building(s), including providing computer input field(s) for a user to input location data generally corresponding to the location of the building, providing visual access to a nadir image of a region including the roof structure of the building; on the nadir image of the region, providing a visual marker that is moveable on the computer monitor around the region, the visual marker initially corresponding to the location data but which may be moved to a final location, having location coordinates, on top of the building to more precisely identify the location of the building roof structure; providing a computer input capable of signaling user-acceptance of the final location of the marker; and, providing visual access to one or more oblique images of an aerial imagery database corresponding to location coordinates of the final location.
  • System And Process For Roof Measurement Using Imagery

    view source
  • US Patent:
    20210341285, Nov 4, 2021
  • Filed:
    Jul 12, 2021
  • Appl. No.:
    17/373048
  • Inventors:
    - Rochester NY, US
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • International Classification:
    G01B 11/28
    G06T 7/62
    G06F 30/13
    G06K 9/00
    G06F 3/0481
  • Abstract:
    The present disclosure describes systems and processes, including a computer process, comprising: determining, with one or more computer processors, attributes of a roof of a real-world three-dimensional building by: creating, with the one or more computer processors, a first electronic line drawing of a first plane of a roof of a building in a first drawing layer overlaid on an image depicting the roof of the building; creating, with the one or more computer processors, a second electronic line drawing of a second plane of the roof of the building in a second drawing layer on the image depicting the roof of the building, the first electronic line drawing and the second electronic line drawing having one or more overlapping lines; and assigning, with the one or more computer processors, one or more non-dimensional attributes to the overlapping lines, the non-dimensional attributes identifying one or more types of roof structures.
  • System And Process For Roof Measurement Using Imagery

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  • US Patent:
    20200386543, Dec 10, 2020
  • Filed:
    May 11, 2020
  • Appl. No.:
    16/871596
  • Inventors:
    - Rochester NY, US
    Chris T. Thornberry - Indianapolis IN, US
    Mark F. Garringer - Eaton IN, US
  • International Classification:
    G01B 11/28
    G06T 7/62
    G06F 30/13
    G06K 9/00
    G06F 3/0481
  • Abstract:
    The present disclosure describes systems and processes, including processes in which first location data is received. Visual access to a first image corresponding to the first location data is provided, the first image including a roof structure of a building. A first computer input capable of signaling a designation from the user of a building roof structure location within the first image is provided. A designation of the building roof structure location within the first image is received. Responsive to receiving the designation of the building roof structure location, a second computer input capable of signaling user-acceptance of the building roof structure location within the first image is provided. Subsequent to receiving the user-acceptance confirming the designation of the building roof structure location, a report of the roof structure is provided.

Flickr

Facebook

Mark Garringer Photo 10

Mark Shane Garringer Ind...

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Mark Shane Garringer (Indianapolis, IN)
Mark Garringer Photo 11

Mark Shane Garringer

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Myspace

Mark Garringer Photo 12

Mark Garringer

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Birthday:
1945
Mark Garringer Photo 13

Mark Garringer

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Locality:
Eaton, Indiana
Birthday:
1942
Mark Garringer Photo 14

Mark Garringer

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Locality:
FORT WAYNE, Indiana
Birthday:
1912

Googleplus

Mark Garringer Photo 15

Mark Garringer

Education:
Marion High School
Relationship:
Married
About:
Mark Garringer, father, hippie, husband, programmer, rpg gamer, runner, vegetarian, world traveler. I am currently running a Pathfinder homebrew set in Numeria codenamed: Lords of Light. I share info...
Mark Garringer Photo 16

Mark Garringer

Classmates

Mark Garringer Photo 17

Marion High School, Mario...

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Graduates:
Mark Garringer (1988-1992),
Amy Swierk (1995-1999),
Laurie Brown (1976-1980),
Tiffany Bowden (1993-1997),
Nancy Sufficool (1968-1972)

Youtube

Scottish bagpipe performance by Mark Garringer

  • Duration:
    54s

JCJSHS Christmas

  • Duration:
    32m 55s

Game Master's Journey 52 - Writing for Paizo ...

Mark Garringer returns to the show today with some tips on writing for...

  • Duration:
    37m 11s

Mariana bike #1

  • Duration:
    37s

Builders are building something?

My son trying to tell me something?

  • Duration:
    1m

Congrats to Obama!

Congrats to Obama!

  • Duration:
    4s

Good News?

Hey Emma, did you hear the good news?

  • Duration:
    3s

MOV02524

  • Duration:
    2m 3s

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