Ka Y Chui

US Patent:

20080106292, May 8, 2008

Filed:

Nov 2, 2006

Appl. No.:

11/592565

Inventors:

Ka Ng Chui - Menlo Park CA, US
Hyoseok Daniel Yang - Santa Clara CA, US
Leonid Skorobogatov - Sunnyvale CA, US

Assignee:

Corad Technology, Inc. - Santa Clara CA

International Classification:

G01R 31/02

US Classification:

324758, 324754

Abstract:

A probe card includes a printed circuit board (PCB) and a probe ring coupled to the PCB. The probe card further includes a plurality of probes coupled to the PCB and to the probe card, and includes a plurality of tubes respectively associated with the plurality of probes. Each tube is configured to surround at least a portion of the probe that the tube is associated with. Each tube includes an inner dielectric portion and an outer conductive portion. The conductive portion of each tube is electrically coupled to the PCB.

US Patent:

20130021050, Jan 24, 2013

Filed:

Jul 20, 2011

Appl. No.:

13/137084

Inventors:

Ka Ng Chui - Menlo Park CA, US
Wang Zhili - Fengtai District, CN

Assignee:

Corad Technology Inc. - Santa Clara CA

International Classification:

G01R 31/20

US Classification:

32475403

Abstract:

A resonant test probe for testing high-speed integrated circuit devices. The test probe includes a probe tip that makes electrical contact with a device under test to receive a test signal from the device, and an output circuit transmits the received test signal to a testing apparatus. The test probe also includes tuning circuitry coupled between the probe tip and the output circuit. The tuning circuitry is configured to tune a resonance frequency of the test probe to be substantially equal to an operating frequency of the device under test to enable the test probe to transmit the test signal to the device under test.

US Patent:

20080048685, Feb 28, 2008

Filed:

Aug 28, 2006

Appl. No.:

11/511843

Inventors:

Ka Ng Chui - Menlo Park CA, US
Hyoseok Daniel Yang - Santa Clara CA, US

Assignee:

Corad Technology Inc. - Santa Clara CA

International Classification:

G01R 31/02

US Classification:

324754

Abstract:

A probe card includes a first probe plate having a first plurality of tapered apertures formed therein. Each of the tapered apertures has a first opening that is smaller than a second opening. The first openings and the second openings are on opposite surfaces of the first probe plate. The probe card further includes a second probe plate having a second plurality of tapered apertures formed therein. Each of the tapered apertures has a first opening that is smaller than a second opening. The first openings and the second openings are on opposite surfaces of the second probe plate. The surfaces having the second openings are disposed adjacent to one another. Pairs of the tapered apertures of the first and second probe plates substantially align. The probe card further includes a plurality of probes, wherein each of the probes is disposed in one of the pairs of the tapered apertures.

US Patent:

20170110820, Apr 20, 2017

Filed:

Dec 27, 2016

Appl. No.:

15/391672

Inventors:

- Santa Clara CA, US
Ka Ng Chui - Menlo Park CA, US

International Classification:

H01R 13/24

Abstract:

A compressible contact pin. The contact pin includes a first contact element and a second contact element. A compressible member is coupled between the first contact element and the second contact element to compress when one or more external forces are applied between the first contact element and the second contact element. In addition, the compressible member maintains a separation distance between the first and second contact elements when no external forces are applied. A plurality of conductive particles is bounded by the compressible member to form an electrical connection between the first contact element and the second contact element. The conductive particles are configured to compress with one another when the compressible member is compressed.

US Patent:

20140199895, Jul 17, 2014

Filed:

Mar 17, 2014

Appl. No.:

14/216103

Inventors:

- Santa Clara CA, US
Ka Ng Chui - Menlo Park CA, US

Assignee:

Corad Technology Inc. - Santa Clara CA

International Classification:

H01R 13/17

US Classification:

439824

Abstract:

A compressible contact pin. The contact pin includes a first contact element and a second contact element. A compressible member is coupled between the first contact element and the second contact element to compress when one or more external forces are applied between the first contact element and the second contact element. In addition, the compressible member maintains a separation distance between the first and second contact elements when no external forces are applied. An elastomeric connector is coupled between the first contact element and the second contact element. The elastomeric connector electrically couples the first contact element to the second contact element by deforming when the one or more external forces are applied between the first contact element and the second contact element.

US Patent:

20140091818, Apr 3, 2014

Filed:

Oct 3, 2012

Appl. No.:

13/644162

Inventors:

CORAD TECHNOLOGY INC. - , US
Ka Ng Chui - Menlo Park CA, US

Assignee:

CORAD TECHNOLOGY INC. - Santa Clara CA

International Classification:

G01R 1/04
G01R 31/00

US Classification:

32475001, 32475603

Abstract:

A probe card for testing integrated circuit devices. The probe card includes a first circuit having a plurality of traces disposed thereon. The probe card also includes a plurality of pins to couple to a device under test. An interface element interfaces a first set of pins of the plurality of pins with the plurality of traces on the first circuit. The interface element includes a conductive plane coupled to a second set of pins of the plurality of pins to provide power and ground to the device under test.

US Patent:

20140091825, Apr 3, 2014

Filed:

Dec 7, 2012

Appl. No.:

13/707966

Inventors:

Corad Technology Inc. - , US
Ka Ng Chui - Menlo Park CA, US

Assignee:

CORAD TECHNOLOGY INC. - Santa Clara CA

International Classification:

G01R 31/28

US Classification:

32475603, 32475606

Abstract:

A probe card interface for interfacing a probe head with a first circuit. The probe card interface includes an impedance control element to interface a first set of pins of the probe head with the first circuit. The impedance control element is further configured to control the impedance of the first set of pins. The probe card interface includes a conductive plane to interface a second set of pins of the probe head with the first circuit. The conductive plane is further coupled to provide at least one of power or ground to the second set of pins.

US Patent:

20140091826, Apr 3, 2014

Filed:

Jul 3, 2013

Appl. No.:

13/935112

Inventors:

- Santa Clara CA, US
Ka Ng Chui - Menlo Park CA, US

International Classification:

G01R 1/073

US Classification:

32475603

Abstract:

A probe card interface for interfacing a probe head with a first circuit. The probe card interface includes an impedance control element to interface a first set of pins of the probe head with the first circuit. The impedance control element is further configured to control the impedance of the first set of pins. The probe card interface includes a printed circuit board (PCB) to interface a second set of pins of the probe head with the first circuit. The PCB is further coupled to provide at least one of power or ground to the second set of pins. For some embodiments, the PCB comprises a flexible polyimide substrate coupled between a first conductive layer and a second conductive layer. The first conductive layer is coupled to ground. The second conductive layer is coupled to a power source on the first circuit.