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James M Pak

age ~59

from Sunnyvale, CA

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Also known as:
  • Jim Pak
Phone and address:
621 Santa Catalina Ter, Sunnyvale, CA 94085
408 746-3970
Related to:
Connected to:

James Pak Phones & Addresses

  • 621 Santa Catalina Ter, Sunnyvale, CA 94085 • 408 746-3970
  • 730 Evelyn Ave, Sunnyvale, CA 94086
  • San Marcos, TX
  • Puyallup, WA
  • San Jose, CA
  • Santa Clara, CA
  • Seattle, WA
  • 921 Sutter Ave, Sunnyvale, CA 94086 • 510 205-6385

Work

  • Position:
    Production Occupations

Education

  • Degree:
    High school graduate or higher

Emails

j***k@gci.net
Name / Title
Company / Classification
Phones & Addresses
James Pak
President
Ist Engineering, Inc.
Hotels and Motels
2299 Ringwood Ave. Unit C-2, San Jose, CA 95131
James Pak
Administrator Executive
James M Pak
Eating Places
411 N Capitol Ave, San Jose, CA 95133
James Pak
Owner
Melange Market
Eating Places
1201 3Rd Ave Ste 210, Seattle, WA 98101
James Pak
Owner
Best Image
Photographic Studios, Portrait
2186 N Orange Mall, Seattle, WA 98195
James Pak
Network Administrator
R. A. Phillips Industries, Inc.
Security Brokers, Dealers, and Flotation Comp...
12070 Burke St, Seattle, WA 98195
James Pak
Owner
Melange Market
Photography · Eating Place · Full-Service Restaurants
1201 3 Ave STE 210, Seattle, WA 98101
206 224-7007, 206 442-1588
James M. Pak
President
IST ENGINEERING, INC
Engineering Services
881 Yosemite Way, Milpitas, CA 95035
408 586-8988
James Pak
Administrator Executive
James M Pak
Full-Service Restaurants
411 N Capitol Ave, San Jose, CA 95133
408 923-9492

Lawyers & Attorneys

James Pak Photo 1

James L Pak, Scottsdale AZ - Lawyer

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Address:
8930 E Raintree Dr Suite 100, Scottsdale, AZ 85260
480 444-9999 (Office)
1201 Pacific Avenue Suite 600, Tacoma, WA 98402
206 315-9934 (Office), 866 997-5728 (Office)
Licenses:
Arizona - Active 1998
Washington - Active 1998
Experience:
Managing Member at Pak & Moring PLC - 2006-present
Member at James L. Pak, P.L.L.C. - 2000-2006
Associate at Doherty & Alex - 1999-2000
Education:
Gonzaga University School of Law
Degree - JD - Juris Doctor - Law
Graduated - 1997
University of Washington -Seattle
Degree - BA - Bachelor of Arts - Business Administration
Graduated - 1994
Specialties:
Personal Injury - 30%, 26 years
Business - 25%, 26 years
Real Estate - 25%, 26 years
Litigation - 15%, 26 years
Criminal Defense - 5%, 26 years
Languages:
Korean
Associations:
Maricopa County Bar Association - Member, 1998-present
State Bar of Arizona - Member, 1998-present
Washington State Bar Association - Member, 1998-present
James Pak Photo 2

James Pak - Lawyer

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ISLN:
1001066108
Admitted:
2021

Medicine Doctors

James Pak Photo 3

James P. Pak

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Specialties:
Diagnostic Radiology
Work:
Southwest Imaging Interventional Specialists
8230 Walnut Hl Ln STE 700, Dallas, TX 75231
214 345-6905 (phone), 214 987-1845 (fax)

Radiology Associates TarrantRadiology Associates Of North Texas
1650 W College St, Grapevine, TX 76051
877 718-5728 (phone), 888 960-9875 (fax)

Radiology Associates TarrantRadiology Associates Of North Texas
816 W Cannon St, Fort Worth, TX 76104
817 321-0404 (phone), 817 321-0486 (fax)

Radiology Associates TarrantEnvision Imaging Radiology
815 Pennsylvania Ave, Fort Worth, TX 76104
817 321-0470 (phone), 817 882-3560 (fax)

Radiology Associates TarrantEnvision Imaging
900 8 Ave FL 2, Fort Worth, TX 76104
817 321-0300 (phone), 817 321-0399 (fax)

Radiology Associates North Texas
8200 Walnut Hl Ln, Dallas, TX 75231
214 345-7770 (phone), 214 345-4361 (fax)

Radiology Associates TarrantRadiology Associates Of North Texas
815 Pennsylvania Ave, Fort Worth, TX 76104
817 885-7739 (phone), 817 321-0459 (fax)

Radiology Associates TarrantRadiology Associates Of North Texas
8230 Walnut Hl Ln STE 100, Dallas, TX 75231
214 345-6905 (phone), 214 345-6230 (fax)

Methodist CDI Legacy
5425 W Spg Crk Pkwy STE 110, Plano, TX 75024
972 920-0120 (phone), 214 778-0102 (fax)

Radiology Associates TarrantRadiology Associates Of North Texas
6316 Precinct Line Rd, Hurst, TX 76054
877 718-5728 (phone), 817 321-0342 (fax)

Radiology Associates TarrantRadiology Associates Of North Texas
108 Denver Trl, Azle, TX 76020
817 444-8640 (phone), 817 444-8738 (fax)

Radiology Associates Of North Texas
5900 Altamesa Blvd, Fort Worth, TX 76132
877 718-5728 (phone), 817 321-0321 (fax)
Education:
Medical School
University of Texas Medical School at San Antonio
Graduated: 1992
Languages:
English
Spanish
Description:
Dr. Pak graduated from the University of Texas Medical School at San Antonio in 1992. He works in Fort Worth, TX and 11 other locations and specializes in Diagnostic Radiology. Dr. Pak is affiliated with Baylor All Saints Medical Center, Baylor Regional Medical Center At Grapevine, Baylor Surgical Hospital Fort Worth, Cook Childrens Medical Center, Cook Childrens Northeast Hospital, North
James Pak Photo 4

James H. Pak

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Specialties:
Anesthesiology
Work:
Anesthesia & Analgesic MedAnesthesia & Analgesia Medical Group
837 5 St FL 2, Santa Rosa, CA 95404
707 522-1800 (phone), 707 524-4687 (fax)
Education:
Medical School
University of Rochester School of Medicine and Dentistry
Graduated: 1998
Languages:
English
Description:
Dr. Pak graduated from the University of Rochester School of Medicine and Dentistry in 1998. He works in Santa Rosa, CA and specializes in Anesthesiology. Dr. Pak is affiliated with Petaluma Valley Hospital, Queen Of The Valley Medical Center, Santa Rosa Memorial Hospital and Sutter Santa Rosa Regional Hospital.

Resumes

James Pak Photo 5

James Pak

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Location:
United States
James Pak Photo 6

James Pak

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Location:
United States
James Pak Photo 7

James Pak Puyallup, WA

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Work:
UW Weightlifting Club

Jan 2013 to 2000
Officer and Founding Member Mathnasium
Kent, WA
Dec 2013 to Apr 2014
Branch Manager Dream Project
Seattle, WA
Sep 2012 to Dec 2012
Volunteer Mentor Dream Project
Seattle, WA
Sep 2012 to Dec 2012
Volunteer Math Tutor Baskin Robbins
Bonney Lake, WA
Jul 2009 to Sep 2011
Team Leader Camp of Champions
Puyallup, WA
Jun 2008 to Jul 2011
Counselor/Tournament Organizer Camp of Champions
Seattle, WA
Jun 2008 to Sep 2008
Intern
Education:
UNIVERSITY OF WASHINGTON
Seattle, WA
Jun 2013
Bachelor of Arts in Mathematics

Us Patents

  • Method For Detecting Sequential Processing Effects Using On-Tool Randomization

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  • US Patent:
    6947804, Sep 20, 2005
  • Filed:
    Jan 10, 2003
  • Appl. No.:
    10/340124
  • Inventors:
    James M. Pak - Sunnyvale CA, US
    Steven J. Zika - Austin TX, US
  • Assignee:
    Advanced Micro Devices, Inc. - Sunnyvale CA
  • International Classification:
    G06F019/00
  • US Classification:
    700121, 700100, 700108
  • Abstract:
    A method for detecting sequential processing effects on integrated circuits to be manufactured in a manufacturing process, includes: determining a first random sequence for a plurality of wafers; performing a first process step on the plurality of wafers by a first process tool in accordance with the first random sequence; determining a second random sequence for the plurality of wafers; and performing a second process step on the plurality of wafers by a second process tool in accordance with the second random sequence. The method performs randomization of wafer processing sequences at the process tool itself. By performing randomization of wafer processing sequences at the process tool, the need for separate wafer handlers is eliminated, resulting in significant cost reduction, clean-room space savings, improved yield, improved manufacturing cycle time, and improved signal-detection capabilities.

  • Process Of Fabricating A Workpiece Using A Test Mask

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  • US Patent:
    20100055809, Mar 4, 2010
  • Filed:
    Sep 8, 2008
  • Appl. No.:
    12/206310
  • Inventors:
    James M. Pak - Sunnyvale CA, US
    Mien Li - Sunnyvale CA, US
    Go Nagatani - Mountain View CA, US
    Yana Matsushita - Mountain View CA, US
    Julie Diane Segal - Palo Alto CA, US
  • Assignee:
    SPANSION LLC - Sunnyvale CA
  • International Classification:
    H01L 21/66
  • US Classification:
    438 17, 257E21531
  • Abstract:
    A product workpiece can be processed to form product dice. A test mask can allow intentional changes to be made to a feature on the product workpiece to examine how the altered feature performs. Use of the test mask may be used or not used based on the needs or desires of skilled artisans. By using the test mask, a separate dedicated test structure is not required to be formed in a scribe lane or within an area that could otherwise be used for a product die. Thus, the sampling level by using the test mask can be varied. Also, separate test workpieces, which may not be processed using a significantly different process flow or at significantly different times as compared to product workpieces, are not required. The product workpiece with the altered feature can be electrically tested without the need to form test or bond pads.

  • Adaptively Programming Or Erasing Flash Memory Blocks

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  • US Patent:
    20130258775, Oct 3, 2013
  • Filed:
    Apr 2, 2012
  • Appl. No.:
    13/437324
  • Inventors:
    Tio Wei NEO - Fremont CA, US
    Shivananda SHETTY - San Jose, JP
    James PAK - Sunnyvale CA, US
  • Assignee:
    Spansion LLC - Sunnyvale CA
  • International Classification:
    G11C 16/04
  • US Classification:
    36518511
  • Abstract:
    Embodiments described herein generally relate to programming and erasing a FLASH memory. In an embodiment, a method of programming or erasing the contents of a block of a FLASH memory includes determining a voltage of a pulse based on an age of the block and outputting the pulse to at least a portion of the block. The pulse is used to program or erase the block.

  • Arrangement And Method For Detecting Sequential Processing Effects In Manufacturing Using Predetermined Sequences Within Runs

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  • US Patent:
    59301384, Jul 27, 1999
  • Filed:
    Sep 10, 1997
  • Appl. No.:
    8/926487
  • Inventors:
    Zhi-Min Ling - San Jose CA
    James Pak - Sunnyvale CA
    Ying Shiau - San Jose CA
  • Assignee:
    Advanced Micro Devices, Inc. - Sunnyvale CA
  • International Classification:
    G06F 1900
    G06G 764
    G06G 766
  • US Classification:
    36446815
  • Abstract:
    An arrangement and method for detecting sequential processing effects on products to be manufactured in a manufacturing process orders a first set of the products in a first specified processing sequence for a first process step in the manufacturing process. In order to prevent any positional trend created at one process step from being carried over into the next process step, the first set of the products is re-ordered into a second, different specified processing sequence for a second process step in the manufacturing process. Data regarding responses of the first set of the products to the process steps are extracted. The extracted data are correlated with the first and second processing sequences and data analysis is performed on the correlated extracted data. These steps are repeated for subsequent sets of the products, so that although the specified processing sequence is different for each of the individual process steps for a set of products, the same processing sequences for the individual processing steps are used for subsequent sets of the products to be manufactured. Since the processing sequences are not randomized from set to set and do not have to be provided to a database, the amounts of interfacing and disk storage needed are greatly reduced.

  • Arrangement And Method For Detecting Sequential Processing Effects In Manufacturing

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  • US Patent:
    57610657, Jun 2, 1998
  • Filed:
    Mar 30, 1995
  • Appl. No.:
    8/413990
  • Inventors:
    Richard Charles Kittler - Sunnyvale CA
    Zhi-Min Ling - San Jose CA
    James Minsu Pak - Sunnyvale CA
    Ying Shiau - San Jose CA
  • Assignee:
    Advanced Micro Devices, Inc. - Sunnyvale CA
  • International Classification:
    C07C 268
  • US Classification:
    36446824
  • Abstract:
    An arrangement and method for detecting sequential processing effects on devices to be manufactured in a manufacturing process extracts data regarding responses of the devices to a process step in the manufacturing process and data regarding a processing sequence of the devices in that process step. The extracted data is refined before analysis and control chart rules are then applied to the refined data. These control chart rules detect whether there are any unusual processing effects caused by the sequence of processing of the devices in any one of the individual processing steps. Application of control chart rules to the refined data allows an automatic determination of whether there are any rule violations. One or more control charts which have a rule violation are automatically generated when it is determined that there is a rule violation. Process engineers may then use the automatically generated charts to direct their efforts at improving the manufacturing process.

  • Arrangement And Method For Detecting Sequential Processing Effects In Manufacturing Using Predetermined Sequences Within Runs

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  • US Patent:
    57168563, Feb 10, 1998
  • Filed:
    Aug 22, 1995
  • Appl. No.:
    8/517960
  • Inventors:
    Zhi-Min Ling - San Jose CA
    James Pak - Sunnyvale CA
    Ying Shiau - San Jose CA
  • Assignee:
    Advanced Micro Devices, Inc. - Sunnyvale CA
  • International Classification:
    H01L 2166
  • US Classification:
    437 8
  • Abstract:
    An arrangement and method for detecting sequential processing effects on products to be manufactured in a manufacturing process orders a first set of the products in a first specified processing sequence for a first process step in the manufacturing process. In order to prevent any positional trend created at one process step from being carried over into the next process step, the first set of the products is re-ordered into a second, different specified processing sequence for a second process step in the manufacturing process. Data regarding responses of the first set of the products to the process steps are extracted. The extracted data are correlated with the first and second processing sequences and data analysis is performed on the correlated extracted data. These steps are repeated for subsequent sets of the products, so that although the specified processing sequence is different for each of the individual process steps for a set of products, the same processing sequences for the individual processing steps are used for subsequent sets of the products to be manufactured. Since the processing sequences are not randomized from set to set and do not have to be provided to a database, the amounts of interfacing and disk storage needed are greatly reduced.

  • Method Of Forming High-Voltage Transistor With Thin Gate Poly

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  • US Patent:
    20210296343, Sep 23, 2021
  • Filed:
    May 18, 2021
  • Appl. No.:
    17/323819
  • Inventors:
    - San Jose CA, US
    James Pak - Sunnyvale CA, US
    Unsoon KIM - San Jose CA, US
    Inkuk Kang - San Jose CA, US
    Kuo Tung Chang - Saratoga CA, US
  • Assignee:
    Cypress Semiconductor Corporation - San Jose CA
  • International Classification:
    H01L 27/11573
    H01L 21/28
    H01L 27/1157
    H01L 29/66
    H01L 29/792
    H01L 21/265
    H01L 21/285
    H01L 27/11521
    H01L 27/11546
    H01L 27/11568
    H01L 29/423
    H01L 29/45
    H01L 29/49
    H01L 29/78
  • Abstract:
    A semiconductor device and method of fabricating the same are disclosed. The method includes depositing a polysilicon gate layer over a gate dielectric formed over a surface of a substrate in a peripheral region, forming a dielectric layer over the polysilicon gate layer and depositing a height-enhancing (HE) film over the dielectric layer. The HE film, the dielectric layer, the polysilicon gate layer and the gate dielectric are then patterned for a high-voltage Field Effect Transistor (HVFET) gate to be formed in the peripheral region. A high energy implant is performed to form at least one lightly doped region in a source or drain region in the substrate adjacent to the HVFET gate. The HE film is then removed, and a low voltage (LV) logic FET formed on the substrate in the peripheral region. In one embodiment, the LV logic FET is a high-k metal-gate logic FET.

  • Embedded Non-Volatile Memory Device And Fabrication Method Of The Same

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  • US Patent:
    20210134811, May 6, 2021
  • Filed:
    Nov 20, 2020
  • Appl. No.:
    16/953643
  • Inventors:
    - San Jose CA, US
    James Pak - Sunnyvale CA, US
    Unsoon Kim - San Jose CA, US
    Inkuk Kang - San Jose CA, US
    Kuo Tung Chang - Saratoga CA, US
  • Assignee:
    Cypress Semiconductor Corporation - San Jose CA
  • International Classification:
    H01L 27/1157
    H01L 27/11573
    H01L 29/423
  • Abstract:
    Systems and methods of forming such include method, forming a memory gate (MG) stack in a first region, forming a sacrificial polysilicon gate on a high-k dielectric in a second region, wherein the first and second regions are disposed in a single substrate. Then a select gate (SG) may be formed adjacent to the MG stack in the first region of the semiconductor substrate. The sacrificial polysilicon gate may be replaced with a metal gate to form a logic field effect transistor (FET) in the second region. The surfaces of the substrate in the first region and the second region are substantially co-planar.

Googleplus

James Pak Photo 8

James Pak

Lived:
Hayward, CA
Tracy, CA
Irvine, CA
Education:
Golden Gate University - Finance, University of California, Irvine - Sociology
About:
안녕 people.  
Tagline:
"Google Me"
James Pak Photo 9

James Pak

Work:
MAVCAP - Senior IM
Education:
University of Western Sydney - MBA, University of Portsmouth - BSc(Hons)in Computing
James Pak Photo 10

James Pak

Education:
Rutgers University - Computer Science
About:
You know, that cool guy that talks a little too much about net neutrality or computers?
Tagline:
Herps derps.
James Pak Photo 11

James Pak

Work:
US Army - IT (2007)
James Pak Photo 12

James Pak

Work:
Melange - Cleaner
Tagline:
The winners in life think constantly in terms of I can, I will and I am in Christ !
James Pak Photo 13

James Pak

About:
Photographer based out of Toronto, Canada.
Tagline:
Follow your passions, be kind, live well.
James Pak Photo 14

James Pak

James Pak Photo 15

James Pak

Youtube

James Pak - PaXz

James Pak - PaXz

James Pak's SPRING BREAK SAMPLER =) 4.17.06

  • Category:
    Comedy
  • Uploaded:
    17 Apr, 2006
  • Duration:
    3m 55s

Susan Johnson speaks about James Pak's senten...

Susan Johnson speaks about James Pak's sentencing

Johnson's son Derrick Thompson, 19, and his girlfriend, Alivia Welch, ...

  • Duration:
    3m 26s

James Pak: the future of Artificial Intellige...

James Pak: the future of Artificial Intelligence

What is the level of maturity of Artificial Intelligence? What kind of...

  • Duration:
    3m 27s

Pak Reaction To | Dino James - Girlfriend

Pak Reaction To | Dino James - Girlfriend

Humary Page ko like karen . Watch more Pak Reaction : Like My Page On ...

  • Duration:
    8m 20s

James Pak to be arraigned

James Pak to be arraigned

This afternoon a Biddeford man is expected to be arraigned in the shoo...

  • Duration:
    1m 20s

911 transcripts released in killing of Biddef...

911 transcripts released in killing of Biddeford c...

Maine's attorney general released the transcripts Wednesday of the eme...

  • Duration:
    3m 12s

Facebook

James Pak Photo 16

Ng James Pak Yin

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James Pak Photo 17

James Pak Chiu Leung

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James Pak Photo 18

James Pak

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James Pak Photo 19

James Pak

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James Pak Photo 20

James Pak

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James Pak Photo 21

James Pak

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James Pak Photo 22

James Sangyeon Pak

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James Pak Photo 23

James Pak

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Plaxo

James Pak Photo 24

James Pak

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Hong Kong
James Pak Photo 25

James L. Pak

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Scottsdale, ArizonaManaging Member at Pak & Moring PLC
James Pak Photo 26

James Pak

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The UPS Store

Classmates

James Pak Photo 27

James Pak

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Schools:
Salisbury Middle School Salisbury MD 1998-2002
Community:
Calvin Hills, Tomisha Stanford, Talise Ward, Travon Schoolfield, Varun Katragadda, Crystal Pearson
James Pak Photo 28

James Pak

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Schools:
Chapel Square Elementary Square Annandale VA 1976-1980
Community:
Mark Greinke, Sheri Kellam, Scott Dau, Suzi Moulton, Jennifer Sozio, Kathryn Kirkman
James Pak Photo 29

James L Pak

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Schools:
Clover Park High School Tacoma WA 1986-1990
Community:
Diana Hudson, Pamela Plummer
James Pak Photo 30

James Pak

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Schools:
Winona Public School Winona Morocco 1989-1995, McMaster Public School Ottawa Morocco 2003-2007
Community:
Scott Fuller, Stacey Calligan, Andrea Gregg, Daniel Konior, Jonathan Mahn, Leah Jutzi, Liisa Morley, Shane Ethier, Chuang Yi, Alexandra Ponikvar, Kenji Chan
James Pak Photo 31

Chapel Square Elementary ...

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Graduates:
James Pak (1976-1980),
Carlisle Williams (1969-1974),
Valerie Zipf (1971-1979),
Romano Gregorio (1983-1983),
Andrea Anelli (1972-1979)
James Pak Photo 32

Salisbury Middle School, ...

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Graduates:
Eric Jacobs (1988-1992),
Steven Sterling (2004-2008),
Sammuel Russ (2004-2008),
James Pak (1998-2002),
Sara Forest (2001-2005)
James Pak Photo 33

Winona Public School, Win...

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Graduates:
James Pak (1989-1995),
Wendy Mans (1961-1972),
Fay Janzen (1955-1963),
Leslie Puddicombe (1960-1969),
Jennifer Hobbs (1984-1992)
James Pak Photo 34

McMaster Public School, O...

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Graduates:
Mohammad Afsar (1963-1967),
Ruth Bell (1971-1975),
Julie Curran (1973-1977),
Diane Morrison (1963-1967),
James Pak (2003-2007)

Flickr

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James Pak Photo 41
James Pak Photo 42

News

Lawyer: Maine Landlord To Plead Guilty To Killing 2 Tenants

Lawyer: Maine Landlord to Plead Guilty to Killing 2 Tenants

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  • The Portland Press Herald (http://bit.ly/1PajEjM) reports that 77-year-old James Pak will plead guilty Wednesday to murder and attempted murder. Attorney Joel Vincent said Pak wants to spare his family and the victims' families the ordeal of a trial.
  • Date: Feb 01, 2016
  • Category: U.S.
  • Source: Google
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