James D Hopkins

US Patent:

7388390, Jun 17, 2008

Filed:

Jul 25, 2007

Appl. No.:

11/782927

Inventors:

Roger Brueckner - Phoenix AZ, US
Michael Costello - Queen Creek AZ, US
James Hopkins - Mesa AZ, US
Rudy Sterbenz - Chandler AZ, US

Assignee:

Telco Testing Systems LLC - Tempe AZ

International Classification:

G01R 31/02

US Classification:

324755

Abstract:

A testing apparatus is described with a housing, a power source, a carrier assembly, and a backbone connecting the carrier assembly to the power source. A resource board is disposed on the carrier assembly and is connected thereto, thereby receiving power from the power source through the carrier assembly. The resource board is adapted to perform a test on a device under test and to generate data reflecting results of the test on the device under test. A test pin assembly is disposed at one end of the resource board and is connectable with a loadboard. A controller operatively connects to the power supply, the carrier assembly, and the resource board. The controller is adapted to communicate with the resource board to execute instructions to test the device under test. The controller also receives the result data from the resource board, permitting analysis of the device under test.

US Patent:

7443190, Oct 28, 2008

Filed:

Apr 12, 2007

Appl. No.:

11/786746

Inventors:

James E. Hopkins - Mesa AZ, US
Michael Peter Costello - Queen Creek AZ, US
Herbert Tsai - Kaohsiung, TW

Assignee:

Chroma Ate Inc - Taoyuan Hsien

International Classification:

G01R 31/26
G01R 31/02

US Classification:

324765, 324754

Abstract:

A method for testing micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests at least a predetermined portion of the devices in such trays at the same time. The method of the illustrative embodiment include the steps of: providing a test hive comprising a plurality of test circuits corresponding in number to at least a predetermined portion of said cells and comprising a plurality of groups of test contacts, each group of said groups of test contacts being coupled to one of said test circuits and being oriented to engage said plurality of electrical contacts of a micro SD device disposed in a corresponding one of said cells; moving each said tray from said stack one at a time to a position proximate said test hive; causing relative movement of said tray proximate said test hive whereby said test hive engages said tray of micro SD device and said test hive such that electrical connection is made simultaneously by each of said groups of test contacts with said electrical contacts of a micro SD device disposed in said corresponding of said cells; and simultaneously, electrically testing at least a predetermined portion of said micro SD devices in each tray engaged by said hive without removing said micro SD devices from said tray.

US Patent:

7489155, Feb 10, 2009

Filed:

Apr 12, 2007

Appl. No.:

11/786779

Inventors:

James E. Hopkins - Mesa AZ, US
Michael Peter Costello - Queen Creek AZ, US
Herbert Tsai - Kaohsiung, TW

Assignee:

Chroma Ate Inc - Taoyuan Hsien

International Classification:

G01R 31/26
G01R 31/02

US Classification:

324765, 324754

Abstract:

A method for testing System-In-Package (SIP) devices such as micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.

US Patent:

7489156, Feb 10, 2009

Filed:

Apr 12, 2007

Appl. No.:

11/786780

Inventors:

James E. Hopkins - Mesa AZ, US
Michael Peter Costello - Queen Creek AZ, US
Herbert Tsai - Kaohsiung, TW

Assignee:

Chruma Ate Inc. - Taoyuan Hsien

International Classification:

G01R 31/26
G01R 31/02

US Classification:

324765, 324754

Abstract:

A method and apparatus for testing micro SD devices each having a plurality of electrical leads is described. The method and apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.

US Patent:

7514914, Apr 7, 2009

Filed:

Apr 12, 2007

Appl. No.:

11/786760

Inventors:

James E. Hopkins - Mesa AZ, US
Michael Peter Costello - Queen Creek AZ, US
Herbert Tsai - Kaohsiung, TW

Assignee:

Chroma Ate Inc - Taoyuan Hsien

International Classification:

G01R 31/02

US Classification:

3241581, 324754, 324755

Abstract:

Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus of the illustrative embodiment comprises a test hive comprising: a plurality of test circuits corresponding in number to the number of cells in the tray; and a plurality of groups of test contacts, each of the groups of the test contacts being coupled to one of the test circuits and being oriented to engage the plurality of electrical contacts of SIP device disposed in a corresponding one of the cells, the test hive being operable to simultaneously, electrically test all of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray.

US Patent:

7518356, Apr 14, 2009

Filed:

Apr 12, 2007

Appl. No.:

11/786747

Inventors:

James E. Hopkins - Mesa AZ, US
Michael Peter Costello - Queen Creek AZ, US
Herbert Tsai - Kaohsiung, TW

Assignee:

Chroma Ate Inc. - Taoyuan Hsien

International Classification:

G01R 31/02

US Classification:

3241581, 324754, 324755

Abstract:

Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The apparatus comprises a JEDEC standard tray receiving apparatus comprising a plurality of tray aligners to align the tray into a predetermined position to account for dimensional tolerances of the tray. The apparatus further comprises a test assembly proximate the tray receiving apparatus. The assembly comprises; a plurality of test circuits corresponding in number to the number of cells in the tray, a plurality of groups of test contacts, each of group of the test contacts being coupled to one of the test circuits and being oriented to engage a plurality of electrical contacts of a SIP device disposed in a corresponding one of the cell, the plurality of test circuits being operable to simultaneously, electrically test a predetermined number of SIP devices in a JEDEC standard tray engaged by the receiving apparatus without removing the SIP devices from the tray.

US Patent:

7518357, Apr 14, 2009

Filed:

Apr 12, 2007

Appl. No.:

11/786768

Inventors:

James E. Hopkins - Mesa AZ, US
Michael Peter Costello - Queen Creek AZ, US
Herbert Tsai - Kaohsiung, TW

Assignee:

Chroma Ate Inc. - Taoyuan Hsien

International Classification:

G01R 31/02

US Classification:

3241581, 324754, 324755

Abstract:

Apparatus for testing micro SD devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test circuits corresponding in number to at least a predetermined number of cells in the tray; and a plurality of groups of test contacts, each group is coupled to one of the test circuits and is oriented to engage the plurality of electrical contacts of a micro SD device disposed in a corresponding one of the cells. The test hive is operable to simultaneously, electrically test at least a predetermined number of the number of the micro SD devices in each tray engaged by the hive without removing the micro SD devices that did pass electrical testing until a tray of electrically tested micro SD devices is fully populated with micro SD devices that did pass electrical testing.

US Patent:

7535214, May 19, 2009

Filed:

Apr 12, 2007

Appl. No.:

11/786778

Inventors:

James E. Hopkins - Mesa AZ, US
Michael Peter Costello - Queen Creek AZ, US
Herbert Tsai - Kaohsiung, TW

Assignee:

Chroma Ate Inc - Taoyuan Hsien

International Classification:

G01R 31/02

US Classification:

3241581, 324754, 324755

Abstract:

Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test circuits corresponding in number to at least a predetermined number of cells in the tray; and a plurality of groups of test contacts, each group is coupled to one of the test circuits and is oriented to engage the plurality of electrical contacts of a SIP device disposed in a corresponding one of the cells. The test hive is operable to simultaneously, electrically test at least a predetermined number of the number of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray. The apparatus also includes a sorter automatically operable to remove each SIP device that did not pass electrical testing with SIP devices that did pass electrical testing until a tray of electrically tested SIP devices is fully populated with SIP devices that did pass electrical testing.

Author:

James F. Hopkins

ISBN #:

0813100518

Author:

James F. Hopkins

ISBN #:

0813100534

Author:

James F. Hopkins

ISBN #:

0813100569

Author:

James F. Hopkins

ISBN #:

0813109302

Author:

James Hopkins

ISBN #:

0631175717

Author:

James Hopkins

ISBN #:

0809505185

Author:

James Hopkins

ISBN #:

0893703931

Author:

James Hopkins

ISBN #:

0893704938