Paul Marcoux from Fort Collins, CO

Us Patents

Process And System For Identifying Wires At Risk Of Electromigration
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US Patent:

6857113, Feb 15, 2005
Filed:

Sep 11, 2002
Appl. No.:

10/241623
Inventors:

Jason T Gentry - Wellington CO, US
David D. Balhiser - Fort Collins CO, US
Ronald G Harber - Loveland CO, US
Bryan Haskin - Ft. Collins CO, US
Gayvin E Stong - Fort Collins CO, US
Paul J. Marcoux - Fort Collins CO, US
Assignee:

Agilent Technologies, Inc. - Palo Alto CA
International Classification:

G06F017/50
G06F019/00
G06F017/11
US Classification:

716 5, 716703, 716 15
Abstract:

A method and system of identifying one or more nets in a digital IC design that are at risk of electromigration comprises selecting a manufacturing process for the digital IC design and obtaining a clock period and process voltage. A voltage waveform transition time and effective capacitance is calculated for one or more of the nets. A maximum allowable effective capacitance for each one of the nets is calculated based upon a peak current analysis or an RMS current analysis. The effective capacitance for each net is compared against the maximum allowable capacitance to identify those nets that are at risk of failure due to the effects of electromigration.

Resumes

Manager

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Location:

Fort Collins, CO

Industry:

Semiconductors

Work:

Agilent Technologies 1999 - 2005
Project Manager
Opelin 1979 - 2000
Project Manager
Avago Technologies 1979 - 2000
Manager

Education:

Kansas State University 1970 - 1976
Doctorates, Doctor of Philosophy, Philosophy, Chemistry Villanova University 1966 - 1970
Bachelors, Chemistry

Skills:

Semiconductors
Ic
Asic
Semiconductor Industry
Failure Analysis
Soc
Program Management
Electronics
Cmos
Engineering Management
R&D
Cross Functional Team Leadership
Manufacturing
Mixed Signal
Spc
Characterization
Reliability
Analog
Design of Experiments