Chris Genau - Seattle WA, US Edward M. Boyle - Bend OR, US Andrew Jones - Bend OR, US John F. Harris - Medina WA, US Andrew D. Firlik - Darien CT, US Navroze S. Mehta - Boca Raton FL, US
International Classification:
A61B 17/22
US Classification:
606159
Abstract:
A surgical tool for the obliteration of spider veins.
Apparatus For Handling Sensitive Material Such As Semiconductor Wafers
Edward F. Boyle - Gig Harbor WA G. Scott Wilkins - Gig Harbor WA
Assignee:
Roboptek, Inc. - Gig Harbor WA
International Classification:
B65G 6534 B65H 508
US Classification:
414217
Abstract:
An apparatus for handling or inspecting a sensitive material such as a semiconductor wafer or mask in a self-contained environment, such that the apparatus can be used outside a clean room. The apparatus incorporates a standardized mechanical interface for transferring the wafers or other sensitive material to and from the apparatus in a box having a cover, a bottom, a latch assembly releasably connecting and sealing the cover to the bottom, and a carrier such as a cassette for supporting the wafers. The apparatus includes a base and a canopy attached to the base so as to create an enclosed space between the base and canopy. The canopy includes a port door releasably secured to the canopy, the port door including an upper surface adapted for supporting the bottom of the box. The apparatus also includes a manipulator and electronic control for controlling the manipulator. The manipulator is operable when the box has been positioned on the port door for moving the cassette out of the cover, and is operable when the cassette has been moved out of the cover for transferring wafers between the cassette to a working area, such as the viewing stage of a microscope assembly, within the enclosed space.
Gregory G. Baker - Gig Harbor WA Edward F. Boyle - Gig Harbor WA
Assignee:
Roboptek, Inc. - Gig Harbor WA
International Classification:
G01P 1300
US Classification:
414331
Abstract:
A monitoring device for determining the presence or absence of wafer-like objects in a carrier having a plurality of shelves, each shelf being constructed to support one such object in an orientation normal to a carrier axis. The monitoring device may advantageously be used in an apparatus for handling wafer-like objects in a self-contained environment. The monitoring device includes a first detector capable of detecting movement of a body past the detector and generating a corresponding first signal. A translation member is physically coupled to the carrier, such that movement of the translation member results in movement of the carrier. The translation member is moved such that the carrier, and any objects such as wafers supported in the carrier, move along the carrier axis past the first detector. As the translation member moves, a position signal is generated, such that the position signal encodes the position of the translation member. The first detection signal and the position signal are processed to determine the presence or absence of an object on each shelf, and the position of each object.
Gregory G. Baker - Gig Harbor WA Edward F. Boyle - Gig Harbor WA
Assignee:
Roboptek, Inc. - Gig Harbor WA
International Classification:
B65G 4724
US Classification:
414783
Abstract:
A device for centering an object and rotating it to a desired angular position relative to a discerning feature. The centration device is particularly adapted for use as a station in a semiconductor wafer handling apparatus, and includes a rotatably driven chuck on which a wafer may be placed by a robot manipulator arm. The perimeter of the wafer is rotated between a light source and a linear array of charge coupled device elements, casting a shadow on the light sensitive elements as the wafer is rotated. A processor connected to the charge couple devices and to an angular position encoder on a shaft of the chuck rotating the wafer is operative to collect data relating the displacement of the perimeter from a reference point to the angular position of the wafer. The processor determines from the data a distance over which the wafer should be shifted on the chuck to center it relative to the reference point. Once the robot manipulator arm has centered the wafer, a minimum displacement of a point on the perimeter corresponding to a flat or notch on the wafer is located and positioned at the desired angular orientation.
Inovia Vein Specialty Center 2200 NE Neff Rd STE 204, Bend, OR 97701 541 382-8346 (phone), 541 382-5796 (fax)
Education:
Medical School University of Minnesota Medical School at Minneapolis Graduated: 1992
Procedures:
Varicose Vein Procedures
Conditions:
Breast Disorders Varicose Veins
Languages:
English
Description:
Dr. Boyle graduated from the University of Minnesota Medical School at Minneapolis in 1992. He works in Bend, OR and specializes in Vascular Surgery and Thoracic Surgery.
Wikipedia References
Edward C . Boyle
About:
Died:
1981
Work:
Edward C. Boyle " Edward C. Boyle " ( died 1981 ) was the Allegheny County District Attorney in Pittsburgh, Pennsylvania from January 3, 1956 until January 6, 1964.
Isbn (Books And Publications)
The Politics Of Education:edward Boyle And Anthony Crosland In Conversation With Maurice Kogan: Edward Boyle And Anthony Crosland In Conversation With Maurice Kogan