Clayton Howard Williams

US Patent:

20130325795, Dec 5, 2013

Filed:

Mar 4, 2013

Appl. No.:

13/784294

Inventors:

Luiz Amaral Franca Pereira Filho - Jersey City NJ, US
Isabella Ip - New York NY, US
Clayton Williams - New York NY, US

Assignee:

Google Inc. - Mountain View CA

International Classification:

H04L 29/06

US Classification:

707608

Abstract:

In a collaborative online document environment, a first user device is provided access to a document, via a network. A second user device is provided access to the document via the network. A list of fonts available to the second user device is received. The list is transmitted to the first user device. A request is received from the first user device to provide at least one of the fonts identified in the list. The at least one font is provided to the first user device.

US Patent:

20130326348, Dec 5, 2013

Filed:

Mar 4, 2013

Appl. No.:

13/784179

Inventors:

Jeff Scott Harris - New York NY, US
Luiz Amaral Franca Pereira Filho - Jersey City NJ, US
Hironori Bono - Tokyo, JP
Clayton Williams - New York NY, US

Assignee:

Google Inc. - Mountain View CA

International Classification:

G06F 17/21

US Classification:

715269

Abstract:

A server dynamically provides fonts to a user device. The user device is provided with access to a document via a network. An update to a language parameter associated with the document is detected. Fonts associated with the update to the language parameter are determined. It is determined at least one of the fonts is not available on the user device. The at least one of the fonts is provided to the user device.

US Patent:

49470345, Aug 7, 1990

Filed:

Apr 28, 1989

Appl. No.:

7/344621

Inventors:

Hemantha K. Wickramasinghe - Chappaqua NY
Clayton C. Williams - Peekskill NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

H01J 314

US Classification:

250216

Abstract:

A near field optical microscopy method and apparatus eliminates the necessity of an aperture for scanning a sample surface and greatly reduces the detected background signal. A small dimension tip, on the order of atomic dimension, is disposed in close proximity to the sample surface. A dither motion is applied to the tip at a first frequency in a direction substantially normal to the plane of the sample surface. Dither motion is simultaneously applied to the sample at a second frequency in a direction substantially parallel to the plane of the sample surface. The amplitude of the motions are chosen to be comparable to the desired measurement resolution. The end of the tip is illuminated by optical energy. The scattered light from the tip and surface is detected at the difference frequency for imaging the sample surface at sub-wavelength resolution without the use of an aperture. Alternatively, the tip is maintained stationary and the sample undergoes motion in the two directions.

US Patent:

47476982, May 31, 1988

Filed:

Apr 30, 1986

Appl. No.:

6/858320

Inventors:

Hermantha K. Wickramasinghe - Chappaqua NY
Clayton C. Williams - Peekskill NY

Assignee:

International Business Machines Corp. - Armonk NY

International Classification:

G01N 2500

US Classification:

374 6

Abstract:

Apparatus is provided for investigating surface structures irrespective of the materials involved. A fine scanning tip is heated to a steady state temperature at a location remote from the structure to be investigated. Thereupon, the scanning tip is moved to a position proximate to, but spaced from the structure. At the proximate position, the temperature variation from the steady state temperature is detected. The scanning tip is scanned across the surface sturcture with the aforesaid temperature variation maintained constant. Piezo electric drivers move the scanning tip both transversely of, and parallel to, the surface structure. Feedback control assures the proper transverse positioning of the scanning tip and voltages thereby generated replicate the surface structure to be investigated.

US Patent:

50610708, Oct 29, 1991

Filed:

Apr 22, 1988

Appl. No.:

7/184639

Inventors:

John S. Batchelder - Tarrytown NY
Donald M. DeCain - New York NY
Marc A. Taubenblatt - Tarrytown NY
Hermantha K. Wickramasinghe - Chappaqua NY
Clayton C. Williams - Peekskill NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01B 902

US Classification:

356345

Abstract:

A method and apparatus for monitoring process fluids used in the manufacture of semiconductor components and other microelectronic devices relies upon detection of the phase shift of a pair of optical energy beams encountering a bubble or particle in the fluid. The system distinguishes between bubbles and particles having indices of refraction greater than the surrounding fluid and between different types and sizes of particles.