Yuenie S Lau from Palm Springs, CA, age 42

Manually Adjustable Attenuator
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US Patent:

7952450, May 31, 2011
Filed:

Sep 29, 2008
Appl. No.:

12/240039
Inventors:

Yuenie S. Lau - San Jose CA, US
Anthony Denning - San Martin CA, US
Assignee:

OML, Inc. - Morgan Hill CA
International Classification:

H01P 1/22
US Classification:

333 81B, 333211
Abstract:

An improved manually adjustable wave attenuator for a waveguide comprises a resistive portion sandwiched between two dielectric portions. In a preferred embodiment the adjustable attenuator comprises a first card further comprising a dielectric portion and a resistive portion and a second dielectric card of substantially the same thickness as said first card, thereby minimizing the possibility of the resistive material coming into contact with and shorting to the resistive card opening, and reducing the required width of the card channel, while many of the problems regarding RF leakages that occur in conventional systems. Finally, more precisely centering the resistive material to the waveguide center is possible because process of affixing the two cards reduces warpage therein, and puts the resistive film symmetrically between the dielectric portions.

Self Keying And Orientation System For A Repeatable Waveguide Calibration And Connection
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US Patent:

20130342288, Dec 26, 2013
Filed:

Jun 21, 2013
Appl. No.:

13/924406
Inventors:

Yuenie Lau - San Jose CA, US
International Classification:

H01P 1/04
H01P 3/127
H01P 11/00
US Classification:

333255, 29600
Abstract:

The self-keying waveguide interconnection system for repeatable waveguide calibration and connection comprises a plug with a centrally disposed aperture, a jack provided with a counterbore to accept a plug diameter. The jack includes a plurality of self-keying channels. A shim having a shape complementary to the plurality of self keying thru slots has a plurality of self keying thru slots for aligning the centrally disposed aperture of the plug to the centrally disposed aperture of the jack. The system identifies the orientation and flange face polarity of the line or adapter without the use of alignment pins as two or more of these independent waveguide interfaces are coupled. In use, the device functions as a self-keying shim/spacer/adapter for a calibration kit or adapter in waveguide sections.

Measuring Parameters Of Dut At Specified Frequency Using Vector Network Analyzer
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US Patent:

6590399, Jul 8, 2003
Filed:

Apr 27, 2000
Appl. No.:

09/560050
Inventors:

Eric Branden Karl - Morgan Hill CA
Yuenie Lau - San Jose CA
Assignee:

Anritsu Company - Morgan Hill CA
International Classification:

G01R 2728
US Classification:

324637, 324639, 324642, 324 7641
Abstract:

A method for taking measurements using a vector network analyzer (VNA) enables a reduction in interference created when the VNA is operated in the presence of external signals. For the method, three measurements are taken, one at a desired measurement frequency, another at a frequency slightly less than the desired measurement frequency, and another at a slightly greater frequency than the desired measurement frequency. An interfering signal may occur at or near the frequency of one of the three measurements. To eliminate measurement error from the interfering signal, the measurement signal with the median, or middle, magnitude is selected to provide the measurement results.