Yi Mei Feng

age ~47

from Flushing, NY

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Also known as:

Feng Y Mei
Feng Mei Feng
Feng Yi Mei
Feng Yi Meifeng
Mei Y Feng
Feng J Mer
Mei Fengyi

Connected to:

Yi Feng Phones & Addresses

Flushing, NY
Brooklyn, NY
New Paltz, NY
New York, NY

Medicine Doctors

Yi M. Feng

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Specialties:

Hematology/Oncology, Medical Oncology

Work:

Tennessee Cancer Specialists
7551 Dannaher Dr, Powell, TN 37849
865 859-7200 (phone), 865 512-6748 (fax)

Tennessee Cancer Specialists
9430 Park West Blvd STE 120, Knoxville, TN 37923
865 693-2255 (phone), 865 691-7888 (fax)

Education:

Medical School
North China Med Coll For the Coal Industry, Tangshan, Hebei, China
Graduated: 1982

Procedures:

Bone Marrow Biopsy
Chemotherapy

Conditions:

Anemia
Iron Deficiency Anemia
Multiple Myeloma
Bladder Cancer
Breast Neoplasm, Malignant

Languages:

Chinese
English

Description:

Dr. Feng graduated from the North China Med Coll For the Coal Industry, Tangshan, Hebei, China in 1982. He works in Powell, TN and 1 other location and specializes in Hematology/Oncology and Medical Oncology. Dr. Feng is affiliated with North Knoxville Medical Center, Parkwest Medical Center and Physicians Regional Medical Center.

Yi Feng

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Specialties:

Anesthesiology

Work:

Houston Cypress Anesthesia LLC
10655 Steepletop Dr, Houston, TX 77065
281 580-9030 (phone), 281 580-2725 (fax)

Education:

Medical School
Wayne State University School of Medicine
Graduated: 2001

Languages:

English
Spanish

Description:

Dr. Feng graduated from the Wayne State University School of Medicine in 2001. She works in Houston, TX and specializes in Anesthesiology. Dr. Feng is affiliated with Cypress Fairbanks Medical Center Hospital.

Us Patents

Probe-Able Voltage Contrast Test Structures
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US Patent:

8350583, Jan 8, 2013
Filed:

Aug 12, 2009
Appl. No.:

12/539732
Inventors:

William J. Cote - Hopewell Junction NY, US
Yi Feng - Hopewell Junction NY, US
Oliver D. Patterson - Hopewell Junction NY, US
Assignee:

International Business Machines Corporation - Armonk NY
International Classification:

G01R 31/20
G01R 1/067
US Classification:

32475401, 32475501
Abstract:

Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end portion of each floating tine, and connecting the floating tines to the second probe pad, and the third probe pad being a control pad which controls the switching devices. A probe-able VC serpentine test structure that includes first, second, third and fourth probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines and each floating tine connected together between the second and third probe pads, switching devices connected to an end portion of each floating tine and connecting the floating tines to the second and third probe pads, and the fourth probe pad being a control pad which controls the switching devices.

Probe-Able Voltage Contrast Test Structures
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US Patent:

20120319714, Dec 20, 2012
Filed:

Aug 24, 2012
Appl. No.:

13/593983
Inventors:

William J. Cote - Hopewell Junction NY, US
Yi Feng - Hopewell Junction NY, US
Oliver D. Patterson - Hopewell Junction NY, US
Assignee:

INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY
International Classification:

G01R 31/02
G01R 1/067
US Classification:

32475403
Abstract:

Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end portion of each floating tine, and connecting the floating tines to the second probe pad, and the third probe pad being a control pad which controls the switching devices. A probe-able VC serpentine test structure that includes first, second, third and fourth probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines and each floating tine connected together between the second and third probe pads, switching devices connected to an end portion of each floating tine and connecting the floating tines to the second and third probe pads, and the fourth probe pad being a control pad which controls the switching devices.

Probe-Able Voltage Contrast Test Structures
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US Patent:

20120319715, Dec 20, 2012
Filed:

Aug 24, 2012
Appl. No.:

13/593961
Inventors:

William J. Cote - Hopewell Junction NY, US
Yi Feng - Hopewell Junction NY, US
Oliver D. Patterson - Hopewell Junction NY, US
Assignee:

INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY
International Classification:

G01R 1/067
US Classification:

3247551
Abstract:

Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end portion of each floating tine, and connecting the floating tines to the second probe pad, and the third probe pad being a control pad which controls the switching devices. A probe-able VC serpentine test structure that includes first, second, third and fourth probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines and each floating tine connected together between the second and third probe pads, switching devices connected to an end portion of each floating tine and connecting the floating tines to the second and third probe pads, and the fourth probe pad being a control pad which controls the switching devices.

Probe-Able Voltage Contrast Test Structures
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US Patent:

20120319716, Dec 20, 2012
Filed:

Aug 24, 2012
Appl. No.:

13/593975
Inventors:

William J. Cote - Hopewell Junction NY, US
Yi Feng - Hopewell Junction NY, US
Oliver D. Patterson - Hopewell Junction NY, US
Assignee:

INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY
International Classification:

G01R 1/067
US Classification:

32475501
Abstract:

Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end portion of each floating tine, and connecting the floating tines to the second probe pad, and the third probe pad being a control pad which controls the switching devices. A probe-able VC serpentine test structure that includes first, second, third and fourth probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines and each floating tine connected together between the second and third probe pads, switching devices connected to an end portion of each floating tine and connecting the floating tines to the second and third probe pads, and the fourth probe pad being a control pad which controls the switching devices.

Name / Title

Company / Classification

Phones & Addresses

Yi Feng

Exit Kingdom Realty

6856 Groton St, Forest Hills, NY 11375
718 268-8868

Yi Yue Feng

LOYAL MARK DEVELOPMENT LIMITED

Yi Yue Feng

EVERBRIGHT TRANSPORT COMPANY LIMITED

Yi Feng
Principal

F & G INT'L TRADING INC
Whol Nondurable Goods

1693 Dekalb Ave, Brooklyn, NY 11237

Resumes

Yi Feng

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Yi Feng

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Yi Heng Feng

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Yi Feng

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Yi Feng

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Location:

United States

Account Manager At Mcc-Ceri

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Position:

Account Manager at MCC-CERI

Location:

Beijing Suburb, China

Industry:

Mining & Metals

Work:

MCC-CERI since Sep 2010
Account Manager
Harbin City Administration Bureau Dec 2003 - May 2007
Accountant

Education:

Lamar University 2007 - 2009
Master, MBA

Yi Feng Rahway, NJ

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Work:

China Investment Securities
Changzhou, CN
Jul 2014 to Aug 2014
Investment Advisor Intern Minsheng Life Insurance Co., Ltd
Changzhou, CN
Mar 2014 to Apr 2014
Sales Intern

Education:

Columbia University New York
New York, NY
Dec 2014
M.S. in Operations Research University of Minnesota
Minneapolis, MN
May 2013
B.S. in Mathematics