William H Heffner

US Patent:

62557076, Jul 3, 2001

Filed:

Aug 24, 1998

Appl. No.:

9/138527

Inventors:

Richard B. Bylsma - Allentown PA
Gustav E. Derkits - New Providence NJ
William R. Heffner - Sinking Spring PA

Assignee:

Lucent Technologies, Inc. - Murray Hill NJ

International Classification:

H01L 2714

US Classification:

257414

Abstract:

The invention relates to semiconductor lasers and more particularly to structures which enable the semiconductor lasers to be tested for reliability. The invention further relates to methods for testing the reliability of semiconductor lasers in wafer or chip form. The invention also relates to methods for the fabrication of semiconductor lasers which includes the use of reliability tests in the fabrication process where the reliability tests includes measuring the voltage drop or drops across one or more levels of a laser structure during the passage of current through the structure.