Wayne R Merryman

US Patent:

41017617, Jul 18, 1978

Filed:

Nov 26, 1976

Appl. No.:

5/745283

Inventors:

Wayne R. Merryman - Lafayette CA

Assignee:

Pacific Western Systems - Mountain View CA

International Classification:

G06M 302

US Classification:

235 92CA

Abstract:

A timing pulse generator for testing electronic components such as semiconductor memories, which tests require time accuracy and repeatability. A number of registers are provided for registering digital words which correspond to timing pulses to be generated. Each word includes information in a first portion as to the coarse start time of a particular pulse and information in a second portion as to the fine start time of the pulse. A counter circuit is provided with means for starting and stepping the counter in pedetermined increments through a plurality of states. A digital comparator compares the state of the counter with the coarse start time portion of the word stored in the register and generates an output pulse when the two coincide. A digitally controlled variable delay circuit is provided corresponding to each register. An output from the register corresponding to the fine start time portion of the word sets the amount of delay introduced by the delay circuit.