Apple
Gpu Physical Design Engineer
Marvell Semiconductor May 2014 - Jan 2017
Cpu and Soc Physical Design Engineer
Intel Corporation Aug 2011 - May 2014
Soc Physical Design Engineer
Marvell Semiconductor Nov 2006 - Aug 2011
Soc and Physical Design Lead
Intel Corporation Jan 1996 - Nov 2006
Cpu Physical Design Engineer
Education:
University of Phoenix 1998 - 1999
Master of Business Administration, Masters, Management
University of North Carolina at Charlotte 1995 - 1995
Master of Science, Masters, Engineering
Maharaja Sayajirao University 1986 - 1990
Bachelor of Engineering, Bachelors, Electrical Engineering
Skills:
Floorplanning Primetime Logic Synthesis Physical Design Dft Modelsim Asic Ic Soc Clock Tree Synthesis Synopsys Tools Timing Static Timing Analysis Microprocessors Compilers Formal Verification Signal Integrity Crosstalk Redhawk Apache Processors Application Specific Integrated Circuits System on A Chip
Interests:
Environment Education Poverty Alleviation Disaster and Humanitarian Relief Human Rights Animal Welfare
Lawrence T. Clark - Phoenix AZ Vikas R. Amrelia - Gilbert AZ Raphael A. Soetan - Chandler AZ Eric J. Hoffman - Chandler AZ Tuan X. Do - Chandler AZ
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H01L 2352
US Classification:
257691, 257356, 257357
Abstract:
An integrated circuit biases the substrate and well using voltages other than those used for power and ground. Tap cells inside the standard cell circuits are removed. New tap cells used to bias the substrate and well reside outside the standard cell circuits. The location of the new voltage power rails is designated prior to placement of the tap cells in the integrated circuit. The tap cells are then strategically placed near the power rails such that metal connections are minimized. Circuit density is thus not adversely impacted by the addition of the new power rails. Transistors are also placed inside the tap cells to address electrostatic discharge issues during fabrication.
Tap Connections For Circuits With Leakage Suppression Capability
Lawrence T. Clark - Phoenix AZ, US Vikas R. Amrelia - Gilbert AZ, US Raphael A. Soetan - Chandler AZ, US Eric J. Hoffman - Chandler AZ, US Tuan X. Do - Chandler AZ, US
An integrated circuit biases the substrate and well using voltages other than those used for power and ground. Tap cells inside the standard cell circuits are removed. New tap cells used to bias the substrate and well reside outside the standard cell circuits. The location of the new voltage power rails is designated prior to placement of the tap cells in the integrated circuit. The tap cells are then strategically placed near the power rails such that metal connections are minimized. Circuit density is thus not adversely impacted by the addition of the new power rails. Transistors are also placed inside the tap cells to address electrostatic discharge issues during fabrication.
Tap Connections For Circuits With Leakage Suppression Capability
Lawrence T. Clark - Phoenix AZ, US Vikas R. Amrelia - Gilbert AZ, US Raphael A. Soetan - Chandler AZ, US Eric J. Hoffman - Chandler AZ, US Tuan X. Do - Chandler AZ, US
An integrated circuit biases the substrate and well using voltages other than those used for power and ground. Tap cells inside the standard cell circuits are removed. New tap cells used to bias the substrate and well reside outside the standard cell circuits. The location of the new voltage power rails is designated prior to placement of the tap cells in the integrated circuit. The tap cells are then strategically placed near the power rails such that metal connections are minimized. Circuit density is thus not adversely impacted by the addition of the new power rails. Transistors are also placed inside the tap cells to address electrostatic discharge issues during fabrication.
Tap Connections For Circuits With Leakage Suppression Capability
Lawrence Clark - Phoenix AZ, US Vikas Amrelia - Gilbert AZ, US Raphael Soetan - Chandler AZ, US Eric Hoffman - Chandler AZ, US Tuan Do - Chandler AZ, US
International Classification:
G06F019/00
US Classification:
700/121000
Abstract:
An integrated circuit biases the substrate and well using voltages other than those used for power and ground. Tap cells inside the standard cell circuits are removed. New tap cells used to bias the substrate and well reside outside the standard cell circuits. The location of the new voltage power rails is designated prior to placement of the tap cells in the integrated circuit. The tap cells are then strategically placed near the power rails such that metal connections are minimized. Circuit density is thus not adversely impacted by the addition of the new power rails. Transistors are also placed inside the tap cells to address electrostatic discharge issues during fabrication.
Tap Connections For Circuits With Leakage Suppression Capability
An integrated circuit biases the substrate and well using voltages other than those used for power and ground. Tap cells inside the standard cell circuits are removed. New tap cells used to bias the substrate and well reside outside the standard cell circuits. The location of the new voltage power rails is designated prior to placement of the tap cells in the integrated circuit. The tap cells are then strategically placed near the power rails such that metal connections are minimized. Circuit density is thus not adversely impacted by the addition of the new power rails. Transistors are also placed inside the tap cells to address electrostatic discharge issues during fabrication.
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