Travis S Longenbach

US Patent:

20170000277, Jan 5, 2017

Filed:

Jun 30, 2015

Appl. No.:

14/788314

Inventors:

- Armonk NY, US
TRAVIS LONGENBACH - ESSEX JUNCTION VT, US
NICOLAS E. PIZZUTI - ESSEX JUNCTION VT, US

International Classification:

A47G 25/14
G08B 21/18

Abstract:

A monitoring system including one or more processors communicatively connected with a memory, one or more output interfaces, one or more connectivity interfaces and one or more sensors, is attached to a clothing frame. The one or more sensors sense one or more indicators of a status of a clothing item attached to the clothing frame, the one or more sensors attached to the clothing frame and connected to one or more processors, one or more output interfaces, and one or more connectivity interfaces. The monitoring system determines the status information for the clothing item based on the one or more indicators. The monitoring system selectively adjusts an output interface to display the status information. The monitoring system communicates the status information to one or more additional clothing frames via the one or more connectivity interfaces.

US Patent:

20160321547, Nov 3, 2016

Filed:

Apr 30, 2015

Appl. No.:

14/700254

Inventors:

- GRAND CAYMAN, KY
Travis S. Longenbach - Essex Junction VT, US
Nicolas E. Pizzuti - South Burlington VT, US

International Classification:

G06N 5/04

Abstract:

A computer receives information detailing the wardrobe of the user, including apparel and accessories, stored in a wardrobe database. The computer receives the schedule of the user and searches the schedule for keywords associated with dress codes and locational information in order to identify the dress code and locations of scheduled events. The computer cross references the determined dress code and weather conditions with suitable clothing in the wardrobe of the user then sends a signal to receivers in the wardrobe to indicate to the user which articles of clothing are appropriate for the weather and occasions of a particular day.

US Patent:

20160290905, Oct 6, 2016

Filed:

Mar 30, 2015

Appl. No.:

14/672331

Inventors:

- Armonk NY, US
Eric G. Liniger - Sandy Hook CT, US
Travis S. Longenbach - Essex Junction VT, US

International Classification:

G01N 3/42

Abstract:

A method for predicting the electrical functionality of a semiconductor package, the method includes performing a first stiffness test for a first semiconductor package, receiving failure data for the first semiconductor package, the failure data includes results of an electrical test performed after the first semiconductor package is assembled on a printed circuit board, generating a database comprising results of the first stiffness test as a function of the failure data for the first semiconductor package, performing a second stiffness test for a second semiconductor package, identifying a unique result from the results of the first stiffness test in the database, the unique result aligns with a result of the second stiffness test, and predicting a failure data for the second semiconductor package based on the failure data for the first semiconductor package which corresponds to the unique result of the first stiffness test identified in the database.

US Patent:

20160079059, Mar 17, 2016

Filed:

Sep 17, 2014

Appl. No.:

14/488617

Inventors:

- Armonk NY, US
Dylan J. Fath - Winooski VT, US
Michael C. Johnson - Burlington VT, US
Travis S. Longenbach - South Burlington VT, US
Nicolas E. Pizzuti - South Burlington VT, US

International Classification:

H01L 21/02
H01L 31/0352
H01L 29/06
H01L 31/18
H01L 21/78
H01L 29/04

Abstract:

An approach to manufacturing an elliptical semiconductor wafer includes a structure for an elliptical semiconductor wafer with a crystal direction, wherein the crystal direction is provided by a seed crystal orientation. The structure of the elliptical semiconductor wafer has a minor radius for the elliptical semiconductor wafer and a major radius for the elliptical semiconductor wafer wherein the major radius is greater than the minor radius.