Theodore R Haining

US Patent:

20040250243, Dec 9, 2004

Filed:

Jun 3, 2003

Appl. No.:

10/453703

Inventors:

Niloy Banerjee - Fremont CA, US
Bret Foreman - San Francisco CA, US
Theodore Haining - San Bruno CA, US
Parikshit Bhaduri - Foster City CA, US
Brom Mahbod - San Carlos CA, US
Michael Kavanaugh - San Francisco CA, US
Dhaval Shah - Foster City CA, US
William Manry - Monte Sereno CA, US
Henry Willard - San Francisco CA, US
John John So - Dubin CA, US

Assignee:

ORACLE INTERNATIONAL CORPORATION - Redwood Shores CA

International Classification:

G06F009/44

US Classification:

717/134000

Abstract:

Techniques for testing subsystems on a platform for a software application are provided. A test application receives instructions for calling platform dependent subsystems directly. The instructions can be designed to fully test the capabilities of the subsystems. Once the instructions are executed, the results of the subsystems can be analyzed for platform certification, performance, reliability, and/or characteristics.