Hematology Oncology Associates Of Boca Raton 9970 Central Park Blvd N STE 304, Boca Raton, FL 33428 561 482-6611 (phone), 561 482-3056 (fax)
Education:
Medical School Baroda Medical College, Gujarat, India Graduated: 1979
Procedures:
Bone Marrow Biopsy Chemotherapy
Conditions:
Hemolytic Anemia Iron Deficiency Anemia Leukemia Multiple Myeloma Anemia
Languages:
English
Description:
Dr. Patel graduated from the Baroda Medical College, Gujarat, India in 1979. He works in Boca Raton, FL and specializes in Hematology/Oncology. Dr. Patel is affiliated with Boca Raton Regional Hospital, Delray Medical Center and West Boca Medical Center.
Dr. Patel graduated from the B J Med Coll, Gujarat Univ, Ahmedabad, Gujarat, India in 1981. He works in Olympia Fields, IL and specializes in Internal Medicine. Dr. Patel is affiliated with Franciscan Saint James Health - Olympia Fields.
Male Infertility Prostatitis Benign Prostatic Hypertrophy Bladder Cancer Calculus of the Urinary System
Languages:
English Spanish
Description:
Dr. Patel graduated from the UMDNJ New Jersey Medical School at Newark in 1998. He works in Fairfax, VA and specializes in Urology. Dr. Patel is affiliated with Inova Fairfax Medical Campus and Reston Hospital Center.
Benign Polyps of the Colon Cholelethiasis or Cholecystitis Cirrhosis Constipation Diverticulitis
Languages:
Chinese English French Spanish
Description:
Dr. Patel graduated from the Univ of Bristol, the Med Sch, Bristol (352 02 Prior 1/71) in 1986. He works in Staten Island, NY and 1 other location and specializes in Gastroenterology. Dr. Patel is affiliated with Richmond University Medical Center, Staten Island University Hospital North and Staten Island University Hospital South Campus.
Cardiac Consultants PC 2112 Harrisburg Pike STE 100, Lancaster, PA 17601 717 299-5000 (phone), 717 431-1205 (fax)
Education:
Medical School B J Med Coll, Gujarat Univ, Ahmedabad, Gujarat, India Graduated: 1992
Procedures:
Angioplasty Cardiac Catheterization Cardiac Stress Test Cardioversion Continuous EKG Echocardiogram Electrocardiogram (EKG or ECG) Pacemaker and Defibrillator Procedures
Conditions:
Angina Pectoris Aortic Valvular Disease Atrial Fibrillation and Atrial Flutter Cardiomyopathy Congenital Anomalies of the Heart
Languages:
English Spanish
Description:
Dr. Patel graduated from the B J Med Coll, Gujarat Univ, Ahmedabad, Gujarat, India in 1992. He works in Lancaster, PA and specializes in Cardiovascular Disease. Dr. Patel is affiliated with Heart Of Lancaster Regional Medical Center, Lancaster General Hospital and Lancaster Regional Medical Center.
Erie County Medical Center Transplant 462 Grider St FL 10, Buffalo, NY 14215 716 898-5001 (phone), 716 961-6048 (fax)
Education:
Medical School B.j. Med Coll, Poona Univ, Pune, Maharashtra, India Graduated: 1994
Procedures:
Kidney Transplant
Conditions:
Chronic Renal Disease
Languages:
English Spanish
Description:
Dr. Patel graduated from the B.j. Med Coll, Poona Univ, Pune, Maharashtra, India in 1994. He works in Buffalo, NY and specializes in Transplant Surgery. Dr. Patel is affiliated with Erie County Medical Center.
Dr. Patel graduated from the UMDNJ New Jersey Medical School at Newark in 2001. He works in Rockford, IL and specializes in Gastroenterology. Dr. Patel is affiliated with OSF Saint Anthony Medical Center and Swedish American Hospital.
Kishor V. Desai - Fremont CA Maniam Alagaratnam - Cupertino CA Sunil A. Patel - Los Altos CA
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
G01R 3102
US Classification:
324755, 324765
Abstract:
A test fixture for a ball grid array package is disclosed that includes a test ball grid array package having a plurality of coarse pitch contacts formed on a coarse pitch surface of the test ball grid array package and a plurality of wafer bumps formed on a fine pitch surface of the test ball grid array package and an interposer coupled to the plurality of wafer bumps formed on the fine pitch surface of the test ball grid array package for coupling to a plurality of wafer bumps formed on a fine pitch surface of a subject ball grid array package.
Integrated Heat Spreader/Stiffener With Apertures For Semiconductor Package
John P. McCormick - Palo Alto CA Sunil A. Patel - Los Altos CA
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
H01L 2302 H01L 2334 H05K 720
US Classification:
257704
Abstract:
Provided is a single-piece integrated heat spreader/stiffener which is bonded to the substrate and die in a semiconductor package following electrical bonding of the die to the substrate, a packaging method using the integrated heat spreader/stiffener, and a semiconductor package incorporating the integrated heat spreader/stiffener. In a preferred embodiment, the integrated heat spreader/stiffener is a piece of high modulus, high thermal conductivity material shaped to attach over a die on the surface of a packaging substrate. The heat spreader/stiffener is equipped with a plurality of apertures to provide access to the top surface of the die for adhesive to bond the heat spreader/stiffener to the die, and to its perimeter to provide access for dispensation of underfill material between the die and the substrate. Once the adhesive and underfill materials are in place, the adhesive and underfill resins are cured by heating. A ball grid array (BGA) process may then be used to apply solder balls to the underside of the substrate for subsequent bonding of the package to a circuit board for use.
Integrated Heat Spreader/Stiffener Assembly And Method Of Assembly For Semiconductor Package
Kishor V. Desai - Livermore CA Sunil A. Patel - Los Altos CA John P. McCormick - Palo Alto CA
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
H01L 2310 H01L 2334
US Classification:
257707
Abstract:
Provided is a multi-piece integrated heat spreader/stiffener assembly which is bonded to the substrate and die in a semiconductor package following electrical bonding of the die to the substrate, a packaging method using the integrated heat spreader/stiffener, and a semiconductor package incorporating the integrated heat spreader/stiffener. In a preferred embodiment, the integrated heat spreader/stiffener assembly has two pieces, both composed of a high modulus, high thermal conductivity material shaped to attach to each other and a die on the surface of a packaging substrate. A first piece of this assembly is bonded to the substrate surface adjacent to an electrically connected die and to the top surface of the die prior to the dispensation and curing of underfill material which provides the mechanical connection between the die and the substrate. With the first piece of the assembly in place, access may still be had to at least one edge of the die to dispense and cure the underfill epoxy. Once the underfill material is cured by heating, the second piece of the assembly is placed and bonded on the substrate either abutting or overlapping with the first piece.
Apparatus And Method For Improving Ball Joints In Semiconductor Packages
Sunil A. Patel - Los Altos CA Chok J. Chia - Cupertino CA Kishor V. Desai - Fremont CA
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
H01L 2144
US Classification:
438614
Abstract:
Provided is an apparatus and method for modifying the manufacture of chip carrier bond pads to increase the quality and reliability of semiconductor packages and ball joints in particular. This is accomplished by minimizing the corrosion of the barrier metal layer on the functional bond pads during gold deposition with the use of sacrificial pads electrically connected with the functional bond pads. According to one embodiment of the invention, a semiconductor package has copper conductive pads on a substrate that are exposed through a dielectric. Both functional and sacrificial (nonfunctional) copper conductive pads are provided. A barrier metal layer composed of nickel is electrolessly plated onto these conductive pads, and a bond metal layer of gold is deposited onto the nickel using electroless, generally immersion, gold plating. The surface area of the nickel on the sacrificial pads is less than that on the functional pads, and the nickel on the sacrificial pads corrodes first during electroless gold deposition. Without nickel corrosion on the functional bond pad, gold can more uniformly be deposited on the surface of the nickel layer.
Kishor V. Desai - Fremont CA Sunil Patel - Los Altos CA Ramaswamy Ranganathan - Saratoga CA
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
H05K 118
US Classification:
361760
Abstract:
A semiconductor package is present along with an associated method. The package comprises a substrate with a top surface and a bottom surface, the substrate having a plurality of electrically conductive vias extending from the top surface of the substrate to the bottom surface of the substrate. A semiconductor device having an active surface, the active surface having a plurality of bonding pads, is attached to the substrate by an adhesive that bas holes that align with the vias. The vias are also aligned with the bonding pads. Solder serves to electrically and mechanically couple each of the bonding pads with a corresponding via. Each of the vias, in turn, is coupled to a solder ball formed on the bottom of the substrate.
Kishor V. Desai - Livermore CA Sunil A. Patel - Los Altos CA John P. McCormick - Palo Alto CA
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
H01L 2312
US Classification:
257704
Abstract:
Provided is a die clip for use in semiconductor flip chip packaging as a replacement for the conventional combination of a heat spreader and stiffener, a packaging method using the die clip, and a semiconductor package incorporating the die clip. In a preferred embodiment, the die clip is a piece of high modulus, high thermal conductivity material shaped to attach over a die on the surface of a packaging substrate. The die clip closely engages the die while leaving some space open around the perimeter to provide access to the die. An underfill material may then be dispensed into the gap between the die and the substrate through an opening in the die clip. The underfill material is then cured, the die clip providing a heat sink and keeping the die and substrate flat and immobile during and after the curing process. A BGA process may then be used to apply solder balls to the underside of the substrate for subsequent bonding of the package to a circuit board for use.
Mobile Device Locating Using Limited Access Points
- San Diego CA, US Sunil A. PATEL - Fremont CA, US Gaurav LAMBA - Los Altos CA, US
Assignee:
QUALCOMM Incorporated - San Diego CA
International Classification:
H04W 4/04 H04W 4/02
Abstract:
A method of determining a present location of a mobile device within a structure includes: obtaining a prior location of the mobile device, the prior location being on a first floor of the structure; and in response to the prior location being indicative of the present location being remote from a floor transition, using a first set of access points to determine the present location, the first set of access points disposed only on the first floor; or in response to the prior location being indicative of the present location being proximate to the floor transition, using a second set of access points to determine the present location of the mobile device, the second set of access points comprising one or more access points disposed on the first floor and one or more access points disposed on the second floor, the second floor being separate from the first floor.
Method And Apparatus For Optimizing Positioning Based On Positioning Compatibility Classification
- San Diego CA, US Sundar Raman - Fremont CA, US Chandrakant Mehta - Santa Clara CA, US Arie Rahmat - San Diego CA, US Sunil Patel - Santa Clara CA, US
International Classification:
G01S 5/02
Abstract:
Method, device, computer program product, and apparatus for performing and processing mobile device positioning are described. A mobile device can request vertical positioning assistance. The mobile device can receive vertical positioning assistance from a transmitter classified for vertical positioning assistance. The mobile device can receive optimized assistance data created in response to a particular positioning request. The optimized assistance data may be optimized for vertical position, horizontal positioning, or both usage types. The mobile device can receive usage type classifications directly from a transmitter. A server can receive and determine a request is a vertical positioning request. Vertical positioning can include determining one or more of: an altitude, floor, level, or any combination thereof, within the environment. Assistance data associated with a plurality of transmitters, vertical positioning assistance data from a transmitter classified for providing vertical assistance is selected and provided as vertical positioning assistance data.
Oct 2012 to 2000 Laboratory Analyst/TechnicianBlaine Tech Services Carson, CA Nov 2009 to Jan 2012 Environmental Sampling TechnicianUnited States Forest Service
Mar 2007 to Jun 2007 Research Assistant for Dr. Ken Baerenklau (UCR)Circuit City Moreno Valley, CA 2004 to 2005 Retail Sales
Education:
University of California Riverside, CA Jun 2008 BS in Environmental Science
2006 to 2006 General CounselHURLEY & PATEL Lake Forest, CA 2004 to 2006 PartnerHARTMANN, GIBBS & CAULEY, P.L.C Newport Beach, CA 2001 to 2004 Associate AttorneyPOTASH & GETZ Cape Town, Western Cape Dec 2000 to Feb 2001 Summer AssociateThe National Dan's List Cape Town, Western Cape Sep 2000 to Nov 2000 Member
Education:
University of California at Irvine Irvine, CA 1997 Bachelor of Science in Biological Sciences
ITT Technical Institute West Covina, CA Dec 2010 to Sep 2012 Chair - School of Drafting and DesignITT Technical Institute West Covina, CA Feb 2010 to Dec 2010 DeanITT Technical Institute San Bernardino, CA 2000 to 2010Indesign Consultants Mumbai, Maharashtra 1983 to 2000 PresidentPhilips India Mumbai, Maharashtra 1979 to 1983 Industrial Designer
Education:
Art Center at Night 2006 Game DesignNational Institute of Design Ahmedabad, Gujarat 1975 to 1979 Masters in Industrial DesignIndian Institute of Technology 1970 to 1975 Bachelors in Mechanical Engineering
47% , a clinical-stage company developing novel therapeutics that target cancer stem cells (CSCs), or tumor-initiating cells, today announced that Sunil Patel, Chief Financial Officer, Senior Vice President, Corporate Development and Finance of On
Sunil Patel had never been published before he decided to go to Syria in August 2012 to become a war correspondent. Before his trip, the 25-year-old worked as a community-support officer for the London Police, lived with his mom and dad, and occasionally volunteered in Palestinian and Kurdish