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Steven D Sturm

age ~76

from Columbus, OH

Also known as:
  • Steven P Sturm
  • Stephen P Sturm
  • Steve P Sturm
  • Steven Strum

Steven Sturm Phones & Addresses

  • Columbus, OH
  • 5511 Aryshire Ct APT 24, Dublin, OH 43017 • 614 766-1999
  • 5511 Aryshire Ct, Dublin, OH 43017
  • Powell, OH

Us Patents

  • Methods And Apparatus For Determining Mineral Components In Sheet Material

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  • US Patent:
    6377652, Apr 23, 2002
  • Filed:
    Jan 5, 2000
  • Appl. No.:
    09/477956
  • Inventors:
    Steven Perry Sturm - Dublin OH
  • Assignee:
    ABB Automation Inc. - Columbus OH
  • International Classification:
    G01N 2306
  • US Classification:
    378 53, 378 51, 378157
  • Abstract:
    A method and system for on-line measurements of mineral additives in or on a paper web utilizing shaped spectrum x-rays and solid-state PIN detectors. Each of three detectors are cover by a filter used to shape the spectrums of x-rays received by the detectors. The filters are selected to maximize sensitivity differences between detectors for the desired detectable mineral additives. A computer processes signals from the detectors and from basis weight and moisture measuring instruments to determine total mineral content, and the individual amounts of mineral additives in or on (e. g. coating) the paper web.
  • Infrared Measuring Apparatus And Method For On-Line Application In Manufacturing Processes

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  • US Patent:
    6960769, Nov 1, 2005
  • Filed:
    Oct 3, 2002
  • Appl. No.:
    10/264080
  • Inventors:
    Gary Neil Burk - Powell OH, US
    Thomas Michael Domin - Galena OH, US
    Rodney Dale Maxson - Columbus OH, US
    Dennis Charles Daugherty - Grove City OH, US
    Steven Perry Sturm - Dublin OH, US
  • Assignee:
    ABB Inc. - Columbus, Inc. OH
  • International Classification:
    G01J005/02
  • US Classification:
    25033907, 25033906, 2503381, 2503361, 2503391, 25033912, 250353, 250228, 356429
  • Abstract:
    A single vane shutter flag is asynchronously controlled so that a measuring system light source is interrupted for a minimum necessary amount of time for standardization/calibration and normalization of InGaAs system detectors. Source/detector hemispheres or serially connected randomly oriented fiber bundles homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controlling the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.
  • System And Method Of Composition Correction For Beta Gauges

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  • US Patent:
    7005639, Feb 28, 2006
  • Filed:
    Jul 28, 2003
  • Appl. No.:
    10/628197
  • Inventors:
    Steven Perry Sturm - Dublin OH, US
  • Assignee:
    ABB Inc. - Columbus OH
  • International Classification:
    G01N 23/00
  • US Classification:
    250308
  • Abstract:
    Beta gauge composition correction is performed using signals from a plurality of detectors that are positioned so that the ratio of radiation received by the detectors depends on the composition of material through which the radiation passes before reaching the detectors. Radiation is measured at the detectors and the differences between radiation received by the detectors is used to compensate the beta gauge to correct for composition variations. An array of detectors is divided into inner detectors generally aligned with the central portion of a beta radiation beam and at least one set of outer detectors surrounding, at least in part, the inner detectors. Measurements are made including all the detectors, the inner detectors and the at least one set of outer detectors with the difference between the measurements made by the inner detectors and the outer detectors being used to compensate the total measurement made by all the detectors.
  • Measuring Apparatus

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  • US Patent:
    7301164, Nov 27, 2007
  • Filed:
    Jan 30, 2004
  • Appl. No.:
    10/768450
  • Inventors:
    Dennis Charles Daugherty - Grove City OH, US
    Rodney Dale Maxson - Columbus OH, US
    Steven Perry Sturm - Dublin OH, US
  • Assignee:
    ABB Inc. - Columbus OH
  • International Classification:
    G01N 21/86
    G01N 21/84
  • US Classification:
    25055901, 356430
  • Abstract:
    A measuring apparatus is provided having an illumination unit including a source of electromagnetic radiation, fiber optic apparatus and sensing apparatus. The fiber optic apparatus includes first fiber optic structure having an input end for receiving at least a portion of electromagnetic radiation emitted from the radiation source and an output end for directing the received radiation to a web of material, and second fiber optic structure having an input end for receiving radiation reflected from the web of material and an output end for directing the reflected radiation to the sensing apparatus. The sensing apparatus includes a first detector for sensing electromagnetic radiation of a first wavelength band and generating a corresponding first output signal and a second detector for sensing electromagnetic radiation of a second wavelength band and generating a corresponding second output signal indicative of a first property to be measured of the web of material.
  • Method And Apparatus For On-Line Web Property Measurement

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  • US Patent:
    8148690, Apr 3, 2012
  • Filed:
    Sep 24, 2009
  • Appl. No.:
    12/566180
  • Inventors:
    Steven P. Sturm - Dublin OH, US
    Michael S. O'Hora - Dundalk, IE
    Rodney D. Maxson - Supply VA, US
  • Assignee:
    ABB, Ltd. - Dublin
  • International Classification:
    G01N 21/86
  • US Classification:
    25033907
  • Abstract:
    Web measurement system monitors properties of a web during manufacture without chopping measuring radiation during web measurement. A single chop is performed at each sheet edge or every nsheet edge to measure edge temperature and edge thermal radiation for correction for Planckian radiation. Correction factors, including Planckian radiation correction factors, are derived for each point in a web profile. The measuring system also enables derivation of correction factors during operation in a single point and similar machine operating modes.
  • Methods And Apparatus For Measuring Characteristics Of Moving Webs

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  • US Patent:
    52331954, Aug 3, 1993
  • Filed:
    Feb 25, 1992
  • Appl. No.:
    7/841366
  • Inventors:
    Ake A. Hellstrom - Columbus OH
    Wim Muller - Westendorp, NL
    Steven P. Sturm - Columbus OH
    Alan M. Reid - Columbus OH
  • Assignee:
    ABB Process Automation, Inc. - Columbus OH
  • International Classification:
    G01N 2316
    G21F 5015
  • US Classification:
    2503601
  • Abstract:
    Characteristics of moving webs are measured using a radiation source shutter which is rotatably movable between an opened-shutter position and a closed-shutter position and structured to permit access to the radiation source in the closed-shutter position. The source is configured to produce a fan-shaped radiation beam which passes through the web to a detector. The sizing of the fan-shaped beam and the detector together with the spacing the source and the detector are such that the beam width is substantially less than the detector while its length is greater than the detector. This novel beam shaping, detector arrangement provides composition insensitivity, increases solid beam angle and superior streak detection by aligning the beam length dimension with the direction of web movement. Alignment insensitivity is obtained by tuning the radiation beam using concentric rings or crossed strips of material which is semi-transparent to the radiation to compensate for geometric characteristics of the radiation source/beam and the detector. Air within an open portion of a measuring column extending between the radiation source and detector is conditioned and also used to condition electronics associated with the detector.
  • Methods And Apparatus For Measuring And Controlling Curing Of Polymeric Materials

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  • US Patent:
    45825203, Apr 15, 1986
  • Filed:
    Sep 10, 1984
  • Appl. No.:
    6/648626
  • Inventors:
    Steven P. Sturm - Columbus OH
  • Assignee:
    Owens-Corning Fiberglas Corporation - Toledo OH
  • International Classification:
    C03C 2502
    G01J 100
  • US Classification:
    65 343
  • Abstract:
    The degree of cure of a traveling carbonaceous polymeric material (on 48), formed (at 34) from a plurality of chemical reactants (32) and subjected to a curing process (at 42 and 44) is determined by directing (with 86 and 88) into the traveling material radiations including a first infrared radiation (A1) from the group thereof adapted to selectively interact with molecular resonance vibrations at frequencies that are characteristic of respective terminal functional groups of atoms involved in reactions that take place in the material during the curing process. Also directed into the material is a second infrared radiation that is either of the kind (R) that does not exhibit substantial selective interaction with molecular resonance vibrations in the material or of the kind (A2) that is adapted to selectively interact with molecular resonance vibrations at a frequency that is characteristic of groups of atoms forming the backbones of the polymeric molecules in the material. Received (at 102) from the traveling material are radiations (148) that have interacted with the material. Produced (at 116, 118 and 122) from the received radiations are first and second responses to the first and second radiations.
  • Infrared Analysis Of Paper Printability

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  • US Patent:
    49654527, Oct 23, 1990
  • Filed:
    Sep 22, 1989
  • Appl. No.:
    7/410790
  • Inventors:
    Steven P. Sturm - Columbus OH
  • Assignee:
    Process Automation Business, Inc. - Columbus OH
  • International Classification:
    G01N 2135
  • US Classification:
    250339
  • Abstract:
    The printability of paper coated with kaolinite clay is dependent upon the flatness of kaolinite alumino-silicate clay platelets on the surface thereof. The flatness is determined by calculating the ratio of two infrared absorption bands from two specific types of structural hydroxyls characteristic of kaolinite clay platelet crystals.

Resumes

Steven Sturm Photo 1

Steven Sturm

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Isbn (Books And Publications)

  • American Defense Policy

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  • Author:
    Steven R. Sturm
  • ISBN #:
    0801827574
  • American Defense Policy

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  • Author:
    Steven R. Sturm
  • ISBN #:
    0801827582

Myspace

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Steven Sturm

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Locality:
san diego, California
Gender:
Male
Birthday:
1936

Youtube

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for inf. pleas feel free to contact me at 714 787 6230"white hackle"s"...

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    2m 24s

Steve Sturm Interview

Steve Sturm is a multi-instrument... who has worked for many national...

  • Duration:
    13m 27s

steve sturm white hackles

pure white hackles frome steve strum" 714 787 6230.

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    5s

Steve Sturm Kearney Whitehackel

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    7s

Steven Tyler, Slash, and Train Dream On at th...

Aerosmith frontman Steven Tyler brings out Slash and the band Train fo...

  • Duration:
    5m 11s

Presidents Week 2013, Steve Sturm Following P...

On our way back to camp from Crazy Keven's we ran through the big bowl...

  • Duration:
    4m 22s

Facebook

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Steven Sturm

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Steven Sturm Photo 4

Steven Sturm

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Steven Sturm Photo 5

Steven J. Sturm

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Steven Sturm Photo 6

Steven Sturm

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Steven Sturm Photo 7

Steven Sturm

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Friends: Gina West Edwards, Chad Dorsey, Matt Levin, John Shubert, Teresa Stiggers
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Steven Sturm

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Classmates

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Steven Sturm

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Schools:
Monterey Elementary School Burbank CA 1971-1975, Luther Burbank Junior High School Burbank CA 1975-1978
Community:
Tom Evans
Steven Sturm Photo 10

Monterey Elementary Schoo...

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Graduates:
Tamara Watts (1971-1975),
Julie Wiekamp (1971-1977),
Steven Sturm (1971-1975),
Ron Jacobs (1966-1972)

Googleplus

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Steven Sturm

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Steven Sturm

Relationship:
Single
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Steven Sturm (Ssturmsc)

Flickr


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