Steven E Kennedy

US Patent:

7383159, Jun 3, 2008

Filed:

Dec 13, 2005

Appl. No.:

11/301977

Inventors:

Scott Shelton - Apex NC, US
Henry Fu - Chapel Hill NC, US
Steven Kennedy - Wendell NC, US
Jason Figge - Cary NC, US
Michael Chaves - Cary NC, US
Harold Lee - Holly Springs NC, US

Assignee:

Teradata US, Inc. - Miamisburg OH

International Classification:

G06F 15/82
G06F 7/00

US Classification:

702189, 707 10, 707102, 707200

Abstract:

Techniques are presented for reusing business measures within a data store. A measure is associated with a measure type. Each measure is associated with a particular data store schema or schema element and includes metadata for fields and calculations against those fields. Requestors can select existing measures, create new measures, delete existing measures, and/or modify existing measures. A measure, when processed against the data store, produces results from a data store that are associated with the data store schema or the schema element and which conform to the fields and calculations defined within the measure's metadata.