Xiaohong Wu

US Patent:

20040193977, Sep 30, 2004

Filed:

Jun 18, 2003

Appl. No.:

10/464212

Inventors:

Murari Kejariwal - Austin TX, US
John Melanson - Austin TX, US
Ammisetti Prasad - Austin TX, US
Xiaohong Sherry Wu - Austin TX, US

Assignee:

Cirrus Logic, Inc. - Austin TX

International Classification:

G01R031/28

US Classification:

714/724000

Abstract:

A method of testing an internal block of an integrated circuit includes testing an internal block under a selected operating condition by setting a selected operating parameter to a value emulating operation of the internal block under another operating condition to detect potential failure of the internal block under the another operating condition.