Ryan B Noraas

US Patent:

20200173885, Jun 4, 2020

Filed:

Dec 3, 2018

Appl. No.:

16/207452

Inventors:

- Farmington CT, US
Anya B. Merli - Wethersfield CT, US
Ryan B. Noraas - Hartford CT, US
Michael J. Giering - Bolton CT, US
Olusegun T. Oshin - Manchester CT, US

International Classification:

G01M 15/14
G06N 3/08
G06N 3/04

Abstract:

A tool for monitoring a part condition includes a computerized device having a processor and a memory. The computerized device includes at least one of a camera and an image input and a network connection configured to connect the computerized device to a data network. The memory stores instructions for causing the processor to perform the steps of providing an initial micrograph of a part to a trained model, providing a data set representative of operating conditions of the part to the trained model, and outputting an expected state of the part from the trained model based at least in part on the input data set and the initial micrograph.

US Patent:

20200055614, Feb 20, 2020

Filed:

Aug 17, 2018

Appl. No.:

16/104435

Inventors:

- Farmington CT, US
Ryan B. Noraas - Hartford CT, US
Michael J. Giering - Bolton CT, US

International Classification:

B64F 5/10
G06T 3/40
G06T 7/00
G06K 9/62
G05B 19/4097
G06N 3/08

Abstract:

A method for designing a material for an aircraft component includes training a neural network to correlate microstructural features of an alloy with material properties of the alloy by at least providing a set of images of the alloy to the neural network. Each of the images in the set of images has varied constituent compositions. The method further includes providing the neural network with a set of determined material properties corresponding to each image, associating the microstructural features of each image with the set of empirically determined data corresponding to the image, and determining non-linear relationships between the microstructural features and corresponding empirically determined material properties via a machine learning algorithm, receiving a set of desired material properties of the alloy for aircraft component, and determining a set of microstructural features capable of achieving the desired material properties of the alloy based on the determined non-linear relationships.

US Patent:

20190378267, Dec 12, 2019

Filed:

Aug 23, 2019

Appl. No.:

16/549332

Inventors:

- Farmington CT, US
Ryan B. Noraas - Hartford CT, US
Kishore K. Reddy - Vernon CT, US
Edgar A. Bernal - Webster NY, US

International Classification:

G06T 7/00
G06T 7/13
G06T 7/12
G06K 9/62

Abstract:

A material characterization system includes an imaging unit, a material characterization controller, and an imaging unit controller. The electronic imaging unit generates a test image of a specimen composed of a material. The electronic material characterization controller determines values of a plurality of parameters and maps the parameters to corresponding ground truth labeled outputs. The mapped parameters are applied to at least one test image to predict a presence of at least one target attribute of the specimen in response to applying the learned parameters. The test image is convert to a selected output image format so as to generate a synthetic image including the predicted at least one attribute. The electronic imaging unit controller performs a material characterization analysis that characterizes the material of the specimen based on the predicted at least one attribute included in the synthetic image.

US Patent:

20190096056, Mar 28, 2019

Filed:

Sep 25, 2017

Appl. No.:

15/714339

Inventors:

- Farmington CT, US
Ryan B. Noraas - Hartford CT, US
Kishore K. Reddy - Vernon CT, US
Edgar A. Bernal - Webster NY, US

International Classification:

G06T 7/00
G06T 7/13
G06T 7/12
G06K 9/62

Abstract:

A material characterization system includes an imaging unit, a material characterization controller, and an imaging unit controller. The electronic imaging unit generates a test image of a specimen composed of a material. The electronic material characterization controller determines values of a plurality of parameters and maps the parameters to corresponding ground truth labeled outputs. The mapped parameters are applied to at least one test image to predict a presence of at least one target attribute of the specimen in response to applying the learned parameters. The test image is convert to a selected output image format so as to generate a synthetic image including the predicted at least one attribute. The electronic imaging unit controller performs a material characterization analysis that characterizes the material of the specimen based on the predicted at least one attribute included in the synthetic image.

US Patent:

20190061026, Feb 28, 2019

Filed:

Aug 28, 2017

Appl. No.:

15/687602

Inventors:

- Farmington CT, US
Stephen Ali - Plantsville CT, US
Ryan B. Noraas - Hartford CT, US
Lauren Ketschke - Salem CT, US

International Classification:

B23D 43/02
B23D 43/00

Abstract:

Aspects of the disclosure are directed to a first chip ring that includes a first through slot, a second chip ring that includes a second through slot, and a component disposed between the first chip ring and the second chip ring that includes a component through slot, where the first, second and component through slots are coaxial along a slot axis this is oriented at a non-zero valued angle relative to a planar surface of the component facing at least one of the first and second chip rings.

US Patent:

20190050753, Feb 14, 2019

Filed:

Dec 13, 2017

Appl. No.:

15/840132

Inventors:

- Farmington CT, US
Edgar A. Bernal - Webster NY, US
Michael J. Giering - Bolton CT, US
Ryan B. Noraas - Vernon CT, US

Assignee:

UNITED TECHNOLOGIES CORPORATION - Farmington CT

International Classification:

G06N 99/00

Abstract:

A sensor system may comprise a sensor; a processor in electronic communication with the sensor; and/or a tangible, non-transitory memory configured to communicate with the processor, the tangible, non-transitory memory having instructions stored thereon that, in response to execution by the processor, cause the processor to perform operations. The operations may comprise recording, by the sensor, a preliminary type data sample; and/or applying, by the processor, a mapping function having a plurality of tuned parameters to the preliminary type data sample, producing a desired type data output.

US Patent:

20190050973, Feb 14, 2019

Filed:

Nov 8, 2017

Appl. No.:

15/807359

Inventors:

- Farmington CT, US
Kishore K. Reddy - Vernon CT, US
Michael J. Giering - Bolton CT, US
Ryan B. Noraas - Hartford CT, US
Kin Gwn Lore - Manchester CT, US

Assignee:

UNITED TECHNOLOGIES CORPORATION - Farmington CT

International Classification:

G06T 5/20
G06K 9/62
H04N 7/18
H04N 5/232

Abstract:

A sensor system may comprise a sensor; a processor in electronic communication with the sensor; and/or a tangible, non-transitory memory configured to communicate with the processor, the tangible, non-transitory memory having instructions stored thereon that, in response to execution by the processor, cause the processor to perform operations. The operations may comprise recording, by the sensor, a low quality data sample; and/or applying, by the processor, a mapping function having a plurality of tuned parameters to the low quality data sample, producing a high quality data output.