Robert A Washenko

US Patent:

7145986, Dec 5, 2006

Filed:

May 4, 2004

Appl. No.:

10/838893

Inventors:

James A. Wear - Madison WI, US
Robert A. Washenko - Madison WI, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

H05G 1/64
G01N 23/087
G01T 1/24

US Classification:

378 988, 378 53, 378 989, 25037009, 25037013

Abstract:

A monolithic detector uses a grid to block x-rays from inter-pixel regions such as are believed to cause electrical noise in the pixel signals.

US Patent:

7196332, Mar 27, 2007

Filed:

May 4, 2004

Appl. No.:

10/838892

Inventors:

James A. Wear - Madison WI, US
Robert A. Washenko - Madison WI, US
Randall K. Payne - Madison WI, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

G01T 1/24
H01L 27/146

US Classification:

25037001, 25037012, 25037013

Abstract:

A monolithic solid-state detector using a staggered arrangement of pixels in multiple rows improves spatial resolution without requiring reduction in pixel size. Parallelogram shapes of CZT monolith allow tiling in one dimension without inefficient zones between monoliths. A scanning device using linear array of detectors with non-rectangular shape and staggered rows of detection elements such that no dead zones occur within a scan field.

US Patent:

8165266, Apr 24, 2012

Filed:

Sep 10, 2009

Appl. No.:

12/557314

Inventors:

James Wear - Madison WI, US
David Ergun - Verona WI, US
Robert Washenko - Madison WI, US
Michael Bucholz - Oregon WI, US
Darrell Gorsuch - Pardeeville WI, US
Randall Payne - Madison WI, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G01N 23/06

US Classification:

378 55, 378 988, 25037013

Abstract:

A scanning bone densitometer includes an x-ray source to produce x-rays and an x-ray detector receiving x-rays emitted from the x-ray source. The x-ray detector includes a cadmium tellurium (CdTe) semiconductor. The scanning bone densitometer also includes a controller moving the x-ray source and the x-ray detector along a transverse scanning path to acquire a plurality of scan images of an object of interest.

US Patent:

8295570, Oct 23, 2012

Filed:

Sep 10, 2009

Appl. No.:

12/557272

Inventors:

Paul Markwardt - Verona WI, US
Randall Payne - Madison WI, US
Robert Washenko - Madison WI, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

G06K 9/00

US Classification:

382128, 128922, 378 4

Abstract:

Methods and apparatus for measuring body circumference are provided. One method includes acquiring dual-energy two-dimensional (2D) scan information from a dual-energy x-ray scan of a body and generating a dual-energy image of the body using the 2D scan information. The method further includes determining a circumference of at least one portion of the body based on the dual-energy scan information and the generated dual-energy image.

US Patent:

20050096527, May 5, 2005

Filed:

Oct 25, 2004

Appl. No.:

10/972902

Inventors:

Scott Zeller - Madison WI, US
Grant Stevens - Verona WI, US
Paul Markwardt - Verona WI, US
Russell Nord - Ft. Atkinson WI, US
Robert Washenko - Madison WI, US
David Ergun - Verona WI, US

International Classification:

G01B015/02
G01N023/06
A61B005/05

US Classification:

600407000

Abstract:

An x-ray densitometry system provides improved analysis of bone images taken of a patient over a course of time by comparing the images to deduce positioning errors and/or to correct positioning errors for improved quantitative assessment of the bone.

US Patent:

60815825, Jun 27, 2000

Filed:

Nov 6, 1998

Appl. No.:

9/187535

Inventors:

Richard B. Mazess - Madison WI
Joseph P. Bisek - Madison WI
David L. Ergun - Verona WI
Robert A. Washenko - Madison WI

Assignee:

Lunar Corporation - Madison WI

International Classification:

G01B 1502

US Classification:

378146

Abstract:

A scanning densitometer provides transverse scanning of the patient with a small angle fan beam to significantly reduce parallax and image overlap blurring. Additional reduction of artifacts in the region of combined scans is obtained by a varying overlap of the scans when they are merged determined by a best matching of an identified structure within the scan. The matching process which reveals an ideal overlap provides height data of the structure allowing correction of magnification for structures which change in height within the patient over the scan.

US Patent:

62467476, Jun 12, 2001

Filed:

Oct 10, 2000

Appl. No.:

9/685267

Inventors:

James A. Wear - Madison WI
Daniel R. Lenz - Stoughton WI
Randall K. Payne - Madison WI
Robert A. Washenko - Madison WI

Assignee:

GE Lunar Corporation - Madison WI

International Classification:

H05G 164

US Classification:

378 989

Abstract:

An energy discriminator, for distinguishing between high and low x-ray energies in a energy sensitive x-ray machine divides high energies into asymmetric regions. The flux rates in each of the asymmetric regions being used to locate the high-energy region in the appropriate high-energy location even in regions of spectral monotonicity. Because two clearly defined spectral peaks need not be present for accurate location of spectral regions in the output of the detector, less filtering and lower tube loading is required.