Robert P O'Reilly

US Patent:

20020139169, Oct 3, 2002

Filed:

Mar 30, 2001

Appl. No.:

09/822117

Inventors:

Richard Lueth - Walpole MA, US
Brian Beucler - Sandown NH, US
Robert Malone - Westford MA, US
Robert O'Reilly - Natick MA, US
Christopher Hanle - Chelmsford MA, US

International Classification:

G01P021/00
G01N029/00

US Classification:

073/001380, 073/663000, 073/001820

Abstract:

An automatic integrated mechanical and electrical angular motion detector test system includes a test fixture for holding an angular motion detector to be mechanically and electrically tested; a handler subsystem for feeding an angular motion detector to the test fixture; a motor having a rotatable shaft attached to the test fixture for rotating it and the angular motion detector it holds; and an electrical tester for testing the angular motion detector while it is rotating.

US Patent:

58958584, Apr 20, 1999

Filed:

Mar 10, 1997

Appl. No.:

8/815996

Inventors:

Robert Malone - Westford MA
Brian Johnson - Upton MA
Brian Beucler - Sandown NH
Robert O'Reilly - Natick MA
Normand Boucher - Lowell MA
Sarkis Ourfalian - Watertown MA

Assignee:

Analog Devices, Inc. - Norwood MA

International Classification:

G01P 2100

US Classification:

73 138

Abstract:

An automatic and integrated mechanical and electrical accelerometer test system including a test fixture for holding the accelerometers to be mechanically and electrically tested; a handler subsystem for automatically feeding the accelerometers to the test fixture; a shaker subsystem for mechanically testing the accelerometers, the shaker subsystem linked to the test fixture, the shaker subsystem automatically vibrating the test fixture; and a tester for electrically testing the accelerometers while the accelerometers are vibrating.