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Ravindranadh Tagore Eluri

age ~43

from Tempe, AZ

Also known as:
  • Ravindranadh T Eluri
  • Ravindran T Eluri
Phone and address:
1122 W Dawn Dr, Tempe, AZ 85284

Ravindranadh Eluri Phones & Addresses

  • 1122 W Dawn Dr, Tempe, AZ 85284
  • Chandler, AZ
  • Corvallis, OR
  • Maricopa, AZ

Work

  • Company:
    Intel corporation
    Jan 2013
  • Position:
    Senior process engineer

Education

  • Degree:
    Doctorates, Doctor of Philosophy
  • School / High School:
    Oregon State University
    2007 to 2012
  • Specialities:
    Industrial Engineering, Philosophy

Skills

Materials Science • Characterization • Powder X Ray Diffraction • Scanning Electron Microscopy • Nanotechnology • Nanomaterials • Nanoparticles • Tem • Mechanical Testing • Design of Experiments • Experimentation • Failure Analysis • Ftir • Microsoft Office • Uv/Vis • Electrochemistry • Research • Electron Microscopy • Powder Metallurgy • Xrd • Image Analysis • Microfluidics • Edx • Microfabrication • Differential Scanning Calorimetry • Vacuum • Metallurgy • Imagej • Nanofabrication • Dls • Surface Analysis • Fib • Jmp • Thermal • Sputtering

Languages

Telugu • Tamil • Hindi • English

Interests

Cooking • Trekking • Browsing • Long Drives

Industries

Semiconductors

Resumes

Ravindranadh Eluri Photo 1

Senior Process Engineer

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Location:
Chandler, AZ
Industry:
Semiconductors
Work:
Intel Corporation
Senior Process Engineer

Oregon State University Apr 2012 - Jan 2013
Postdoctoral Research Associate

Oregon State University Oct 2007 - Mar 2012
Graduate Research Assistant

Advanced Center For Powder Metallurgy and New Materials Dec 2006 - Sep 2007
Scientist

Nonferrous Material Technology Development Center Jul 2006 - Dec 2006
Senior Research Associate
Education:
Oregon State University 2007 - 2012
Doctorates, Doctor of Philosophy, Industrial Engineering, Philosophy
Indian Institute of Technology, Kanpur 2004 - 2006
Masters, Master of Technology, Metallurgical Engineering
National Institute of Technology, Tiruchirappalli 2000 - 2004
Bachelors, Bachelor of Technology, Engineering
Vidwan Residential College 1998 - 1999
Skills:
Materials Science
Characterization
Powder X Ray Diffraction
Scanning Electron Microscopy
Nanotechnology
Nanomaterials
Nanoparticles
Tem
Mechanical Testing
Design of Experiments
Experimentation
Failure Analysis
Ftir
Microsoft Office
Uv/Vis
Electrochemistry
Research
Electron Microscopy
Powder Metallurgy
Xrd
Image Analysis
Microfluidics
Edx
Microfabrication
Differential Scanning Calorimetry
Vacuum
Metallurgy
Imagej
Nanofabrication
Dls
Surface Analysis
Fib
Jmp
Thermal
Sputtering
Interests:
Cooking
Trekking
Browsing
Long Drives
Languages:
Telugu
Tamil
Hindi
English

Us Patents

  • Surface Finishes With Low Rbtv For Fine And Mixed Bump Pitch Architectures

    view source
  • US Patent:
    20230015619, Jan 19, 2023
  • Filed:
    Sep 23, 2022
  • Appl. No.:
    17/952080
  • Inventors:
    - Santa Clara CA, US
    Robert MAY - Chandler AZ, US
    Sashi KANDANUR - Phoenix AZ, US
    Sri Ranga Sai BOYAPATI - Chandler AZ, US
    Srinivas PIETAMBARAM - Chandler AZ, US
    Steve CHO - Chandler AZ, US
    Jung Kyu HAN - Chandler AZ, US
    Thomas HEATON - Mesa AZ, US
    Ali LEHAF - Phoenix AZ, US
    Ravindranadh ELURI - Chandler AZ, US
    Hiroki TANAKA - Chandler AZ, US
    Aleksandar ALEKSOV - Chandler AZ, US
    Dilan SENEVIRATNE - Chandler AZ, US
  • International Classification:
    H01L 23/00
    H01L 23/522
    H01L 21/768
  • Abstract:
    Embodiments described herein include electronic packages and methods of forming such packages. An electronic package includes a package substrate, first conductive pads formed over the package substrate, where the first conductive pads have a first surface area, and second conductive pads over the package substrate, where the second conductive pads have a second surface area greater than the first surface area. The electronic package also includes a solder resist layer over the first and second conductive pads, and a plurality of solder resist openings that expose one of the first or second conductive pads. The solder resist openings of the electronic package may include conductive material that is substantially coplanar with a top surface of the solder resist layer. The electronic package further includes solder bumps over the conductive material in the solder resist openings, where the solder bumps have a low bump thickness variation (BTV).
  • Chemical Mechanical Polishing Using Fluorescence-Based Endpoint Detection

    view source
  • US Patent:
    20210260718, Aug 26, 2021
  • Filed:
    Feb 21, 2020
  • Appl. No.:
    16/797925
  • Inventors:
    - Santa Clara CA, US
    Sashi Shekhar Kandanur - Chandler AZ, US
    Rahul N. Manepalli - Chandler AZ, US
    Ravindranadh T. Eluri - Tempe AZ, US
    Dilan Seneviratne - Chandler AZ, US
    Clark Linde - Gilbert AZ, US
    ABDIAS J. ACOSTA - Maricopa AZ, US
    Francoise Bainye Angoua - Chandler AZ, US
  • Assignee:
    INTEL CORPORATION - Santa Clara CA
  • International Classification:
    B24B 37/04
    B24B 37/20
  • Abstract:
    A polishing tool and methodology are disclosed, particularly useful for chemical mechanical polish (CMP) applications (e.g., polishing and planarizing). In an embodiment, the tool includes a carrier structure configured to support a workpiece, a polishing pad configured to rotate and polish at least a portion of the workpiece, a source configured to generate excitation radiation directed towards the workpiece, and a detector configured to receive fluorescence radiation from the workpiece. The fluorescence radiation is generated by absorption of the excitation radiation by a polymer material on the workpiece. The polishing tool also includes a controller configured to, based on a magnitude of the received fluorescence radiation, change at least one operating condition of the polishing tool. For instance, the controller can speed or slow the polishing process, and stop the polishing process when a target thickness is achieved.
  • Semiconductor Packages With Embedded Interconnects

    view source
  • US Patent:
    20210082797, Mar 18, 2021
  • Filed:
    Sep 29, 2017
  • Appl. No.:
    16/642770
  • Inventors:
    - Santa Clara CA, US
    Dilan Seneviratne - Chandler AZ, US
    Ravindranadh T. Eluri - Chandler AZ, US
  • International Classification:
    H01L 23/498
    H01L 23/00
    H01L 21/48
  • Abstract:
    A semiconductor package may include a semiconductor package first side, an embedded bridge interconnect, a first via, and a second via. The bridge interconnect may include a bridge interconnect first side with a conductive pad and a bridge interconnect second side. The distance between the bridge interconnect first side and the semiconductor package first side may be less than a distance between the bridge interconnect second side and the semiconductor package first side. The first and second vias may each include a first end that is narrower than a second end. The semiconductor package first side may be closer to the first end of the first via than the second end of the first via, and closer to the second end of the second via than the first end of the second via. The first side of the semiconductor package may be configured to electrically couple to a die.
  • Controlled Synthesis Of Nanoparticles Using Ultrasound In Continuous Flow

    view source
  • US Patent:
    20140255293, Sep 11, 2014
  • Filed:
    Mar 11, 2014
  • Appl. No.:
    14/203900
  • Inventors:
    - Corvallis OR, US
    Brian K. Paul - Corvallis OR, US
    Ravindranadh Tagore Eluri - Corvallis OR, US
  • International Classification:
    C01G 11/02
    B06B 3/00
  • US Classification:
    4235661, 422128, 977896, 977773
  • Abstract:
    Apparatuses and methods for synthesizing nanoparticles are provided.

Vehicle Records

  • Ravindranadh Eluri

    view source
  • Address:
    600 W Grv Pkwy APT 2065, Tempe, AZ 85283
  • Phone:
    541 223-5416
  • VIN:
    4T1BD1FK5CU055564
  • Make:
    TOYOTA
  • Model:
    CAMRY HYBRID
  • Year:
    2012

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