Piero U Simoni from 4208 121St St, Milwaukee, WI 53228, age 53, Phone: 414 321-5731

Resumes

Engineer Leader, Women's Health And X-Ray

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Location:

Milwaukee, WI

Work:

Ge Healthcare
Engineer Leader, Women's Health and X-Ray

Education:

University of Virginia 1996 - 1999
Doctorates, Doctor of Philosophy, Philosophy

Senior Systems Engineer At Ge Healthcare

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Position:

Senior Systems Engineer at GE Healthcare

Location:

Greater Milwaukee Area

Industry:

Medical Devices

Work:

GE Healthcare
Senior Systems Engineer

Education:

University of Virginia 1993 - 1999

Us Patents

Row-Wise Full Helical View Weighting Method And Apparatus For Ct Scanners
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US Patent:

6522714, Feb 18, 2003
Filed:

Nov 9, 2001
Appl. No.:

10/037032
Inventors:

Sharon Wang - Brookfield WI
Stephen Metz - Greenfield WI
Thomas Toth - Brookfield WI
Piero U. Simoni - New Berlin WI
Jianying Li - New Berlin WI
Assignee:

GE Medical Systems Global Technologies Company LLC - Waukesha WI
International Classification:

A61B 603
US Classification:

378 15, 378 19, 378901
Abstract:

A method and apparatus for performing image reconstruction using data obtained by an N beam helical scan, the method including generating projection data arrays for each of the N row in a CT detector, weighting the data arrays using a unique weighting function that is applicable to detectors having many different numbers of rows N to generate helical weighted arrays for each row, weighting the helical weighted arrays by applying a conjugate weighting function to generate conjugate arrays for each detector row and then combining the conjugate weighted arrays, filtering and back-projecting to generate a slice image.

Method And Apparatus Of Determining And Displaying A Helical Artifact Index
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US Patent:

6680995, Jan 20, 2004
Filed:

Oct 31, 2001
Appl. No.:

09/682914
Inventors:

Thomas L. Toth - Brookfield WI
Piero Simoni - New Berlin WI
Assignee:

GE Medical Systems Global Technology Co., LLC - Waukesha WI
International Classification:

G61B 600
US Classification:

378 4, 378901, 382141
Abstract:

An apparatus and process for determining and displaying a helical artifact index to a system operator are provided. The HAI is determined by acquiring and processing imaging data of a phantom. The HAI is then displayed to the operator on a console so that the operator may, if necessary, reset the scanning parameters or select a new scanning protocol that will result in a reconstructed image of a subject having reduced artifact presence. By providing a likelihood of artifact presence to the system operator, the present invention eliminates the need for the operator to recall those scanning profiles that are susceptible to high artifact presence.

High Speed Z-Smoothing Method And Apparatus For Ct Imaging System
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US Patent:

6885764, Apr 26, 2005
Filed:

Nov 21, 2001
Appl. No.:

09/990979
Inventors:

Sharon X. Wang - Brookfield WI, US
Piero U. Simoni - New Berlin WI, US
Thomas Toth - Brookfield WI, US
Stephen Metz - Greenfield WI, US
Assignee:

GE Medical Systems Global Technology Company, LLC - Waukesha WI
International Classification:

G06K009/00
US Classification:

382131, 382173, 378 4, 25037009
Abstract:

A method and apparatus for quickly rendering thick CT slice images wherein the data corresponding to an optimal number of slice images to be combined to generate a thick image and the data set required to generate the thick image are determined as a function of an optimal Z-smoothing factor and wherein Z-smoothing is implemented in software that performs quickly and is useable with any helical weighting algorithm and Z-smoothing function.

Method Of Determining And Displaying A Helical Artifact Index
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US Patent:

6983180, Jan 3, 2006
Filed:

Oct 18, 2002
Appl. No.:

10/065450
Inventors:

Thomas L. Toth - Brookfield WI, US
Piero Simoni - New Berlin WI, US
Assignee:

General Electric Company - Milwaukee WI
International Classification:

A61B 6/00
US Classification:

600407, 600425, 128922, 378 4, 378901, 382131, 382260
Abstract:

An apparatus and process for determining and displaying a helical artifact index to a system operator are provided. The HAI is determined by acquiring and processing imaging data of a phantom. The HAI is then displayed to the operator on a console so that the operator may, if necessary, reset the scanning parameters or select a new scanning protocol that will result in a reconstructed image of a subject having reduced artifact presence. By providing a likelihood of artifact presence to the system operator, the present invention eliminates the need for the operator to recall those scanning profiles that are susceptible to high artifact presence.

Methods And Apparatus For Reconstructing An Image Of An Object
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US Patent:

7013034, Mar 14, 2006
Filed:

Oct 10, 2002
Appl. No.:

10/268323
Inventors:

Sharon X. Wang - Schaumburg IL, US
Thomas L. Toth - Brookfield WI, US
Piero U. Simoni - New Berlin WI, US
Stephen W. Metz - Greenfield WI, US
Assignee:

GE Medical Systems Global Technology Company, LLC - Waukesha WI
International Classification:

G06K 9/00
US Classification:

382131, 382274, 378 4, 25037009
Abstract:

A method for reconstructing an image of an object utilizing a computed tomographic (CT) imaging system having a radiation source configured to project a beam of radiation through an object and towards a multislice detector array configured to sense attenuation of the radiation passing through the object; the method includes helically scanning an object to acquire a plurality of slices of projection data, generating a separate projection dataset for each of N separate detector rows wherein the separate projection datasets include detector row projection data and detector row conjugate projection data, combining the detector row projection data and the detector row conjugate projection data, and helically weighting the combined projection data using a combined helical weighting and conjugate data weighting algorithm such that a greater weight is applied to combined center row projection data than to at least one outermost detector row projection data.

Methods For Spectrally Calibrating Ct Imaging Apparatus Detectors
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US Patent:

7086780, Aug 8, 2006
Filed:

May 20, 2004
Appl. No.:

10/850009
Inventors:

Xiaoye Wu - Rexford NY, US
Neil Barry Bromberg - Milwaukee WI, US
Alexander Kolker - Milwaukee WI, US
Piero Ugo Simoni - Greenfield WI, US
Thomas Louis Toth - Brookfield WI, US
Assignee:

General Electric Company - Schenectady NY
International Classification:

G01D 18/00
US Classification:

378207, 378 5, 378 18, 378 19, 25036309
Abstract:

A method for calibrating a computed tomographic imaging apparatus having a gantry, a radiation source operable at a plurality of kVp's, and a detector array having a plurality of detector elements includes using a system detection function to estimate signals of each detector element that would have been detected through air and through a given thickness of water to determine estimated datasets. The estimated datasets are used to determine data pair sets each comprising a normalized water projection value and an ideal projection value for each detector element. The method further includes determining and storing a representation of a mapping function of the normalized water projections values to the ideal projection values in a memory of the computed tomographic imaging apparatus as a spectral calibration of the computed tomographic imaging apparatus.

Method And Apparatus For Correcting For Beam Hardening In Ct Images
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US Patent:

7391844, Jun 24, 2008
Filed:

Jan 14, 2005
Appl. No.:

11/036618
Inventors:

Xiaoye Wu - Rexford NY, US
Piero Ugo Simoni - Greenfield WI, US
Thomas Louis Toth - Brookfield WI, US
Neil Barry Bromberg - Milwaukee WI, US
Assignee:

General Electric Company - Schenectady NY
International Classification:

A61B 6/00
US Classification:

378 18, 378207
Abstract:

A method for determining a correction for beam hardening in CT images includes obtaining air scans at a plurality of kVp's, determining detection efficiencies for detector elements of the CT imaging apparatus, and estimating projection values through a combination of at least two different materials of different thicknesses. The method further includes determining a transfer function that translates the estimated projection values into ideal projection values for at least two of the different materials and storing the transfer function as the beam hardening correction for images of the CT imaging apparatus.

Method And Apparatus Of Determining And Displaying An Artifact Index
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US Patent:

7593761, Sep 22, 2009
Filed:

Jun 6, 2005
Appl. No.:

11/160027
Inventors:

Thomas L. Toth - Brookfield WI, US
Piero Simoni - Brookfield WI, US
Assignee:

General Electric Company - Schenectady NY
International Classification:

A61B 6/00
US Classification:

600407, 600425, 378 4, 378901, 382131, 382260
Abstract:

An apparatus and process for determining and displaying an artifact index (AI) to a system operator are provided. The AI is determined by acquiring and processing imaging data of a phantom. The AI is then displayed to the operator on a console so that the operator may, if necessary, reset the scanning parameters or select a new scanning protocol that will result in a reconstructed image of a subject having reduced artifact presence. By providing a likelihood of artifact presence to the system operator, the present invention eliminates the need for the operator to recall those scanning profiles that are susceptible to high artifact presence.