Peter K Lison

US Patent:

6784984, Aug 31, 2004

Filed:

Mar 29, 2002

Appl. No.:

10/112210

Inventors:

Ronald N. Parente - Bolton MA
Paul Boyd - Oak Creek WI
David F. Botros - Burlington MA
Peter K. Lison - Methuen MA

Assignee:

Nortel Networks, Ltd. - St. Laurent

International Classification:

G01N 2100

US Classification:

356 731

Abstract:

A novel method and apparatus has been developed for testing optical circuit modules. More particularly, with the present invention, a given test pack is adapted to âsimultaneouslyâ test a plurality of DUTs, by simultaneously apply a given optical signal to each of the plurality of DUTs and allowing each of the DUTs to simultaneously undergo its own testing; the test pack then serially queries each of the DUTs to obtain test results and, if desired, can provide feedback to one or more of the DUTs, whereby the DUTs can be calibrated with the assistance of the test pack. In one preferred form of the invention, all of the plurality of DUTs simultaneously undergoing testing on a given test pack are housed in a single environmental enclosure, permitting all of the DUTs to be simultaneously brought âup to temperatureâ so as to increase testing throughput.

US Patent:

52242358, Jul 6, 1993

Filed:

Jun 28, 1991

Appl. No.:

7/722961

Inventors:

Peter K. Lison - Methuen MA
Keith T. Baines - Winchendon MA

Assignee:

Digital Equipment Corporation - Maynard MA

International Classification:

A47L 700

US Classification:

15302

Abstract:

A local area of an electronic assembly, including a single electronic component or a cluster of components mounted to a printed wiring board, is cleaned. A shroud is positioned about the local area and aqueous cleaning solution is sprayed on the lead joints of the electronic component. To remove the cleaning liquids, a vacuum is drawn from the shroud through a central baffle which is positioned close to the electronic component. Adjustable gates are provided about the base of the shroud to permit air flow into the shroud. Adjustment of the gates controls turbulence of the cleaning solution and subsequent direction of air flow for drying of the electronic component, leads and board. Shroud/baffle assemblies are selected and nozzle assemblies are tilted to correspond to different sizes of electronic components.