- Chandler AZ, US Nick GHAEMI - Germantown MD, US Hyuck-In KWON - Seoul, KR Jin-Ook KIM - Seoul, KR
Assignee:
VIAVI SOLUTIONS INC. - Chandler AZ
International Classification:
H04L 43/0852 H04L 41/22
Abstract:
A test device for performing a bling scan includes a digital blind scan circuit. The blind scan circuit includes digital detectors for multiple cellular technologies that simultaneously perform correlation in a baseband frequency range to detect whether received RF signals include a channel of the technologies. The test device launches, responsive to detecting a channel from the blind scan, a signal analysis or a spectrum analysis application for the channel according to a carrier frequency and a technology identified for the channel by the blind scan.