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Michael M Zelina

age ~54

from Lakewood, OH

Also known as:
  • Mike Zelina
  • Micahel Zalina
Phone and address:
1041 Forest Cliff Dr, Cleveland, OH 44107

Michael Zelina Phones & Addresses

  • 1041 Forest Cliff Dr, Lakewood, OH 44107
  • Cleveland, OH
  • Moreland Hills, OH
  • Chardon, OH
  • 1739 Pierce Ave, Cambria, CA 93428
  • Smithfield, RI
  • San Luis Obispo, CA
  • 564 Water St APT 210, Chardon, OH 44024

Resumes

Michael Zelina Photo 1

Michael Zelina

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Michael Zelina Photo 2

Software Director At Design Net Technical Products, Inc.

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Location:
Cleveland/Akron, Ohio Area
Industry:
Consumer Electronics

Us Patents

  • Ocular Surface Interferometry (Osi) Devices And Systems For Imaging And Measuring Ocular Tear Film Layer Thickness(Es)

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  • US Patent:
    8215774, Jul 10, 2012
  • Filed:
    Apr 1, 2010
  • Appl. No.:
    12/798324
  • Inventors:
    Donald R. Korb - Boston MA, US
    William L. Weber - Olivebridge NY, US
    Randal B. Chinnock - Southbridge MA, US
    Benjamin T. Gravely - Raleigh NC, US
    Stephen M. Grenon - Durham NC, US
    Michael Zelina - Lakewood OH, US
  • Assignee:
    TearScience, Inc. - Morrisville NC
  • International Classification:
    A61B 3/14
    A61B 3/10
  • US Classification:
    351206, 351205, 351221
  • Abstract:
    Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image.
  • Ocular Surface Interferometry (Osi) Methods For Imaging And Measuring Ocular Tear Film Layer Thickness(Es)

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  • US Patent:
    20100259723, Oct 14, 2010
  • Filed:
    Apr 1, 2010
  • Appl. No.:
    12/798326
  • Inventors:
    Donald R. Korb - Boston MA, US
    William L. Weber - Olivebridge NY, US
    Randal B. Chinnock - Southbridge MA, US
    Benjamin T. Gravely - Raleigh NC, US
    Stephen M. Grenon - Durham NC, US
    Michael Zelina - Lakewood OH, US
  • Assignee:
    TearScience, Inc. - Morrisville NC
  • International Classification:
    A61B 3/14
  • US Classification:
    351206
  • Abstract:
    Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).
  • Hand-Held Device For The Endurance Training And The Determination Of Endurance Metrics

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  • US Patent:
    20170020439, Jan 26, 2017
  • Filed:
    Jun 26, 2015
  • Appl. No.:
    14/752772
  • Inventors:
    Kenneth Chatham - Usk, GB
    Michael Zelina - Chardon OH, US
    Robert J. Bouthillier - Smithfield RI, US
    Jorge Tomas - Wrentham MA, US
  • International Classification:
    A61B 5/00
    A61B 5/11
    A61B 5/087
    A61B 5/08
    A63B 23/18
    A61B 5/097
  • Abstract:
    A method and device for determining respiratory airflow metrics during a single inspiratory breath and using those metrics to calculate indicators of aerobic capacity and athletic endurance as well as a method and device for strengthening the respiratory muscles.
  • Tire-Condition Ascertaining Appliance

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  • US Patent:
    20160011067, Jan 14, 2016
  • Filed:
    Jul 10, 2015
  • Appl. No.:
    14/796617
  • Inventors:
    - Solon OH, US
    Jessica Lauren Mann - Pepper Pike OH, US
    Michael Zelina - Lakewood OH, US
  • International Classification:
    G01L 17/00
    G01M 17/02
  • Abstract:
    A tire-condition ascertaining appliance for ascertaining a condition of a tire includes a housing defining an inner compartment that is substantially hollow. The housing is positioned within an inflation chamber defined between sidewalls of the tire and the rim. The appliance includes an electronics platform received within the inner compartment of the housing. The electronics platform ascertains a fluid condition of the tire and generates fluid-condition data, and processes the fluid-condition data. An antenna is connected to the electronics platform. The antenna receives the fluid-condition data indicative of the fluid condition and transmits the fluid-condition data to a remote location.
Name / Title
Company / Classification
Phones & Addresses
Michael Zelina
Owner
Zelina Design Group
Engineering Services
1739 Pierce Ave, Cambria, CA 93428

Youtube

Michael Zelina On Secrets To His Success, Hav...

LIVE & UNEDITED WITH BROKER, MICHAEL ZELINA Big shout out and thanks t...

  • Duration:
    1h 6m 9s

Million-Dollar Vegas Real Estate Broker, Mich...

Luxury Real Estate Showcase Event @ Vu at MacDonald Highlands Guest Sp...

  • Duration:
    28m 18s

How 9/11 changed Zelina Vega's life: WWE Excl...

Zelina Vega talks about how her close relationship with her father, wh...

  • Duration:
    6m 45s

Meet Zelina Vegas family: WWE Hometown Supers...

Zelina Vega returns home to Queens, N.Y., to visit with her family ahe...

  • Duration:
    6m 8s

Queen Zelina & Carmella VS Nikki A.S.H. & Rhe...

WWE Monday Night RAW November 22, 2021.

  • Duration:
    8m 42s

Sasha Banks & Naomi VS Rhea Ripley & Liv Morgan

WWE Monday Night RAW April 18, 2022.

  • Duration:
    8m 32s

Facebook

Michael Zelina Photo 3

Gina Zelina Michael

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Friends:
Gene Orlandi, Michele Wise Lemley, Amie O'Neal Rollins, Jacki Novacich
Michael Zelina Photo 4

Michael Zelina

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Myspace

Michael Zelina Photo 5

michael zelina

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Locality:
COLUMBUS, Ohio
Gender:
Male
Birthday:
1938

Googleplus

Michael Zelina Photo 6

Michael Zelina

Classmates

Michael Zelina Photo 7

Tulane University, New or...

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Graduates:
Eugenio Salvioli (1992-1993),
Christopher McCormick (1987-1991),
Thomas Sparks (1993-1997),
Michael Zelina (1971-1975),
Joyce Donnelly (1983-1984)
Michael Zelina Photo 8

Enfield High School, Enfi...

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Graduates:
Mike Zelina (1980-1984),
Michael Amarello (1972-1976)

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