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Michael Zelina

age ~52

from Lakewood, OH

Also known as:
  • Mike Zelina
  • Micahel Zalina
Phone and address:
1041 Forest Cliff Dr, Cleveland, OH 44107

Michael Zelina Phones & Addresses

  • 1041 Forest Cliff Dr, Lakewood, OH 44107
  • Cleveland, OH
  • Moreland Hills, OH
  • Chardon, OH
  • San Luis Obispo, CA
  • Smithfield, RI
  • Cambria, CA
  • Schaumburg, IL
  • Redondo Beach, CA
  • 564 Water St APT 210, Chardon, OH 44024

Resumes

Michael Zelina Photo 1

Michael Zelina

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Michael Zelina Photo 2

Software Director At Design Net Technical Products, Inc.

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Location:
Cleveland/Akron, Ohio Area
Industry:
Consumer Electronics

Us Patents

  • Ocular Surface Interferometry (Osi) Devices And Systems For Imaging And Measuring Ocular Tear Film Layer Thickness(Es)

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  • US Patent:
    8215774, Jul 10, 2012
  • Filed:
    Apr 1, 2010
  • Appl. No.:
    12/798324
  • Inventors:
    Donald R. Korb - Boston MA, US
    William L. Weber - Olivebridge NY, US
    Randal B. Chinnock - Southbridge MA, US
    Benjamin T. Gravely - Raleigh NC, US
    Stephen M. Grenon - Durham NC, US
    Michael Zelina - Lakewood OH, US
  • Assignee:
    TearScience, Inc. - Morrisville NC
  • International Classification:
    A61B 3/14
    A61B 3/10
  • US Classification:
    351206, 351205, 351221
  • Abstract:
    Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image.
  • Ocular Surface Interferometry (Osi) Methods For Imaging And Measuring Ocular Tear Film Layer Thickness(Es)

    view source
  • US Patent:
    20100259723, Oct 14, 2010
  • Filed:
    Apr 1, 2010
  • Appl. No.:
    12/798326
  • Inventors:
    Donald R. Korb - Boston MA, US
    William L. Weber - Olivebridge NY, US
    Randal B. Chinnock - Southbridge MA, US
    Benjamin T. Gravely - Raleigh NC, US
    Stephen M. Grenon - Durham NC, US
    Michael Zelina - Lakewood OH, US
  • Assignee:
    TearScience, Inc. - Morrisville NC
  • International Classification:
    A61B 3/14
  • US Classification:
    351206
  • Abstract:
    Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source can be controlled to illuminate the ocular tear film. Light emitted from the multi-wavelength light source undergoes optical wave interference interactions in the tear film. An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a tear film layer thickness (TFLT), including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT).
Name / Title
Company / Classification
Phones & Addresses
Michael Zelina
Owner
Zelina Design Group
Engineering Services
1739 Pierce Ave, Cambria, CA 93428

Youtube

Just Above - Freedom (George Michael cover)

  • Category:
    Music
  • Uploaded:
    26 Jun, 2010
  • Duration:
    6m 18s

Michael Jackson Compilation - ArleneZelina Li...

Tribute to the late Michael Jackson by ArleneZelina live at Arcadia Ho...

  • Category:
    People & Blogs
  • Uploaded:
    06 Aug, 2010
  • Duration:
    2m 59s

1970: Ohio State v. Michigan (Drive-Thru)

www.ourhonordefe... Revenge, bitches. Revenge. 1969 can suck it. OFFE...

  • Category:
    Sports
  • Uploaded:
    29 Jul, 2009
  • Duration:
    9m 12s

WOLFGANG AMADEUS MOZART Don Giovanni

Naxos Deutschland GmbH Neuheiten zum 21.09.2009 WOLFGANG AMADEUS MOZAR...

  • Category:
    Music
  • Uploaded:
    27 Sep, 2009
  • Duration:
    3m 11s

buhor 25, webra 32, aerodrom zelina, ivanic g...

  • Category:
    People & Blogs
  • Uploaded:
    15 Mar, 2010
  • Duration:
    4m 13s

Michael Zelina On Secrets To His Success, Hav...

LIVE & UNEDITED WITH BROKER, MICHAEL ZELINA Big shout out and thanks t...

  • Duration:
    1h 6m 9s

Million-Dollar Vegas Real Estate Broker, Mich...

Luxury Real Estate Showcase Event @ Vu at MacDonald Highlands Guest Sp...

  • Duration:
    28m 18s

How 9/11 changed Zelina Vega's life: WWE Excl...

Zelina Vega talks about how her close relationship with her father, wh...

  • Duration:
    6m 45s

Facebook

Michael Zelina Photo 3

Gina Zelina Michael

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Friends:
Gene Orlandi, Michele Wise Lemley, Amie O'Neal Rollins, Jacki Novacich
Michael Zelina Photo 4

Michael Zelina

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Myspace

Michael Zelina Photo 5

michael zelina

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Locality:
COLUMBUS, Ohio
Gender:
Male
Birthday:
1938

Googleplus

Michael Zelina Photo 6

Michael Zelina

Classmates

Michael Zelina Photo 7

Tulane University, New or...

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Graduates:
Eugenio Salvioli (1992-1993),
Christopher McCormick (1987-1991),
Thomas Sparks (1993-1997),
Michael Zelina (1971-1975),
Joyce Donnelly (1983-1984)
Michael Zelina Photo 8

Enfield High School, Enfi...

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Graduates:
Mike Zelina (1980-1984),
Michael Amarello (1972-1976)

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