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Matthew V Schulmerich

age ~43

from Niskayuna, NY

Also known as:
  • Matthew Vaughan Schulmerich
  • Matthew V Schulmerick
  • Matthew V Michelle
Phone and address:
2417 Parkville Pl, Schenectady, NY 12309

Matthew Schulmerich Phones & Addresses

  • 2417 Parkville Pl, Schenectady, NY 12309
  • Niskayuna, NY
  • Jackson, MI
  • Mahomet, IL
  • Champaign, IL
  • Evansville, IN
  • Belleville, MI
  • Rochester, NY

Work

  • Company:
    Ge healthcare
    Mar 2017 to May 2017
  • Position:
    Automation engineer

Education

  • School / High School:
    University of Illinois at Urbana - Champaign
    2009 to 2010
  • Specialities:
    Engineering

Skills

Spectroscopy • Microscopy • Raman • Optics • Ftir • Characterization • Analytical Chemistry • Chemometrics • Chemistry • Laboratory • Collaborative Innovation • Matlab • Digital Imaging • Nanoparticles • Labview • Ir • Protein Chemistry • Experimentation • Design of Experiments • Nanotechnology • Microfluidics • Afm • Uv/Vis • Uv/Vis Spectroscopy

Ranks

  • Certificate:
    Machine Shop Certification (Click To See)

Industries

Research

Us Patents

  • Method And System For Measuring Sub-Surface Composition Of A Sample

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  • US Patent:
    20090219523, Sep 3, 2009
  • Filed:
    Feb 23, 2006
  • Appl. No.:
    12/066915
  • Inventors:
    Michael D. Morris - Ann Arbor MI, US
    William F. Finney - Chicago IL, US
    Matthew Schulmerich - Jackson MI, US
  • Assignee:
    THE REGENTS OF THE UNIVERSITY OF MICHIGAN - Ann Arbor MI
  • International Classification:
    G01J 3/00
  • US Classification:
    356300
  • Abstract:
    In a method for measuring a composition of a sample, an illumination surface area of the sample is illuminated using a light source, and light from a plurality of emitting surface areas of the sample is received, each emitting surface area at a different location, the received light scattered by the sample. A cumulative area of the illumination surface area is greater than a cumulative area of two emitting surface areas of the plurality of emitting surface areas. For each emitting surface area, spectral content information associated with received light corresponding to that emitting surface area is determined, and composition information corresponding to a sub-surface region of the sample is determined based on the determined spectral content information. Different shapes of illumination surface areas as well as the plurality of emitting surface areas may advantageously be utilized for various specimen or sample geometries or illumination sources.
  • Transmission Raman Spectroscopy Analysis Of Seed Composition

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  • US Patent:
    20120092663, Apr 19, 2012
  • Filed:
    Oct 14, 2011
  • Appl. No.:
    13/273684
  • Inventors:
    Linda S. Kull - Charleston IL, US
    Rohit Bhargava - Urbana IL, US
    Bridget Owen - Champaign IL, US
    Matthew Schulmerich - Champaign IL, US
    Dennis Thompson - Mahomet IL, US
    John McKinney - Champaign IL, US
  • International Classification:
    G01J 3/44
    G01N 21/01
  • US Classification:
    356301, 356244
  • Abstract:
    The disclosure provides instrumentation for the Raman spectroscopy analysis of seeds or grains, which can be used to determine the composition of the seed, such as its protein and oil content. In some examples the instrumentation includes an illumination device that emits light in the near infrared range, a sample holder to hold the seeds, and a collection device (e.g., Raman spectrograph) that captures the lights emitted by the seeds. Methods of determining the composition of seeds, such as soybeans, using Raman spectroscopy, are also provided.
  • System And Method For Performing Laser Induced Breakdown Spectroscopy During Laser Ablation Coating Removal

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  • US Patent:
    20170247797, Aug 31, 2017
  • Filed:
    Feb 26, 2016
  • Appl. No.:
    15/055291
  • Inventors:
    - Schenectady NY, US
    Hongqiang Chen - Niskayuna NY, US
    Matthew Vaughan Schulmerich - Niskayuna NY, US
    Jason Christopher Gritti - West Chester OH, US
  • International Classification:
    C23F 4/00
  • Abstract:
    A system and method for performing laser induced breakdown spectroscopy during laser ablation of a coating, such as a TBC coating, deposited on a surface of a component, particularly to enable obtained spectrometry signals of the ablated coating to be used to monitor and control the laser ablation removal process in real-time. The system includes a laser energy source and a scan head interconnected with the laser energy source to receive a laser beam therefrom and then direct the laser beam onto the surface of the coated component. Collection optics collect radiation emitted from a laser-induced plasma generated by the laser beam at the surface of the coated component. The system is further equipped to spectrally analyze the radiation and generate a feedback signal for control and optimization of one or more operational parameters of the laser energy source in real-time.
  • Method For Monitoring Cooking In An Oven Appliance

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  • US Patent:
    20170130968, May 11, 2017
  • Filed:
    Nov 10, 2015
  • Appl. No.:
    14/936815
  • Inventors:
    - Schenectady NY, US
    Zhexiong Tang - Niskayuna NY, US
    Manuel Alfredo Palacios - Clifton Park NY, US
    Igor Tokarev - Waterford NY, US
    Matthew Vaughan Schulmerich - Niskayuna NY, US
  • International Classification:
    F24C 15/20
    F24C 15/18
    F24C 7/08
  • Abstract:
    A method for monitoring cooking in an oven appliance includes drawing cooking vapors or gases from a cooking chamber to a fluid analysis assembly and exposing a plurality of fluid sensors of the fluid analysis assembly to the cooking vapors or gases. The method also includes establishing a response pattern of the plurality of fluid sensors with a machine or statistical learning model(s) and determining a cooking status of the food item within the cooking chamber based upon the response pattern of the plurality of fluid sensors.

Resumes

Matthew Schulmerich Photo 1

Lead Advanced Manufacturing Engineer

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Location:
Schenectady, NY
Industry:
Research
Work:
Ge Healthcare Mar 2017 - May 2017
Automation Engineer

Ge Healthcare Mar 2017 - May 2017
Lead Advanced Manufacturing Engineer

Ge Jul 1, 2016 - Feb 2017
Analytical Chemist at Ge

Ge Jul 2013 - Jul 2016
Analytical Chemist

University of Illinois at Urbana-Champaign Apr 2011 - Jun 2013
Department of Defense Fellow
Education:
University of Illinois at Urbana - Champaign 2009 - 2010
University of Michigan 2004 - 2008
Doctorates, Doctor of Philosophy, Chemistry
St. John Fisher College 2000 - 2004
Bachelors, Bachelor of Arts, Bachelor of Science, Biology, Chemistry
Skills:
Spectroscopy
Microscopy
Raman
Optics
Ftir
Characterization
Analytical Chemistry
Chemometrics
Chemistry
Laboratory
Collaborative Innovation
Matlab
Digital Imaging
Nanoparticles
Labview
Ir
Protein Chemistry
Experimentation
Design of Experiments
Nanotechnology
Microfluidics
Afm
Uv/Vis
Uv/Vis Spectroscopy
Certifications:
Machine Shop Certification (Click To See)
Labview Certified Associate Developer
Six Sigma Green Belt
Initiating and Planning Projects
Budgeting and Scheduling Projects
Managing Project Risks and Changes
Lean Six Sigma Black Belt
License 100-313-066
License 100-313-066 / 100-316-16587
License Tp9Mnlunf28X
License Knwa85Uh5Msu

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