Locke K Lowman

US Patent:

20060232279, Oct 19, 2006

Filed:

Nov 21, 2005

Appl. No.:

11/284789

Inventors:

Douglas Garcia - Beaverton OR, US
Kyung Kim - Portland OR, US
Locke Lowman - San Marcos CA, US

International Classification:

H01H 31/02

US Classification:

324555000

Abstract:

A method automatically tests a parameter of an electronic component to determine whether the component has an acceptable value. The method employs an automatic electronic component testing machine having at least first and second measurement positions where the parameter can be measured. The testing process itself may falsely cause the value to appear to be unacceptable when the value is actually acceptable. The method places the component in a first measurement position and measures the parameter in the first position, thereby generating a first measured parameter value. The method also places the component in a second measurement position and measures the parameter in the second position, thereby generating a second measured parameter value. The method rejects the component only if all measured values are unacceptable, whereby the probability of falsely rejecting the component is less than if only a single measuring step were performed.