Lionel Riviere

US Patent:

20120219917, Aug 30, 2012

Filed:

Feb 28, 2011

Appl. No.:

13/036604

Inventors:

Patrick J. McGuinness - Austin TX, US
Lionel J. Riviere Cazaux - Austin TX, US

Assignee:

FREESCALE SEMICONDUCTOR, INC. - Austin TX

International Classification:

G03F 7/20
G06F 17/50

US Classification:

430312, 716 55

Abstract:

Disclosed techniques for performing a multiple patterning consistency analysis of an integrated circuit design identify, in a standard cell array of the integrated circuit design, a set of standard cells for multiple patterning consistency analysis. The technique may also identify cell groups in the set where all of the cells in a cell group share a common multiple patterning orientation. The technique may identify unused elements in the standard cell array that are associated with or otherwise available for use in shifting at least some of the standard cells. The technique may shift the unused elements with respect to the cell groups, e.g., insert an unused element between a preferred orientation cell group and a non-preferred orientation cell group to shift the non-preferred group by one standard cell array element and thereby change the multiple patterning orientation of the cell group. The technique may shift the unused elements with the specific objective of reducing the prevalence of cell groups having the non-preferred multiple patterning orientation.