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Leonard J Wardzala

age ~63

from Burlington, WI

Also known as:
  • Leonard L Wardzala
  • Leo J Wardzala
Phone and address:
2431 Partridge Woods Ct, Lyons, WI 53105
262 767-7450

Leonard Wardzala Phones & Addresses

  • 2431 Partridge Woods Ct, Burlington, WI 53105 • 262 767-7450
  • Ely, MN
  • Chicago, IL
  • Fontana, WI
  • 37W345 Big Timber Rd, Elgin, IL 60123
  • 7727 W Jerome St, Chicago, IL 60631 • 773 610-2464

Work

  • Position:
    Sales Occupations

Us Patents

  • Nano-Porous Alumina Sensor

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  • US Patent:
    8132457, Mar 13, 2012
  • Filed:
    Aug 11, 2008
  • Appl. No.:
    12/228225
  • Inventors:
    Michael Haji-Sheikh - DeKalb IL, US
    Anima Bose - DeKalb IL, US
    Leonard Wardzala - DeKalb IL, US
  • Assignee:
    Northern Illinois University - DeKalb IL
  • International Classification:
    G01N 19/00
  • US Classification:
    7333504
  • Abstract:
    A nano-sensor including a substrate including pores formed thereon and a detecting mechanism for detecting changes in capacitance due to the presence of a substance. A method of measuring humidity by sampling air with the nano-sensor, detecting changes in capacitance, and determining the relative humidity of air. A method of detecting the presence of a substance by taking a sample with the nano-sensor, detecting changes in capacitance, and determining the presence of a substance. A method of making the nano-sensor by forming nano-pores on a substrate, and forming, on the surface of the substrate, a detecting mechanism for detecting changes in capacitance due to the presence of a substance.
  • Method For Fabricating Thick Film Alumina Structures Used In High Frequency, Low Loss Applications And A Structure Resulting Therefrom

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  • US Patent:
    20040251230, Dec 16, 2004
  • Filed:
    Jun 16, 2003
  • Appl. No.:
    10/462447
  • Inventors:
    Leonard Wardzala - Burlington WI, US
    Gregory Ballard - Belvidere IL, US
    Kurt Friel - Sycamore IL, US
  • International Classification:
    H01B013/00
  • US Classification:
    216/013000
  • Abstract:
    A method for fabricating thick film alumina structures used in high frequency, low loss applications is provided. More particularly, the invention is directed to a co-fire process for fabricating, or laminating, thick film structures to one another by printing a conductor layer between two thick film circuits, drying the layer, and co-firing the combined structure. This process is particularly useful in fabricating high frequency (e.g. 10 gigabit) fiber optic transmitters.
  • Method For Fabricating Thick Film Alumina Structures Used In High Frequency, Low Loss Applications And A Structure Resulting Therefrom

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  • US Patent:
    20070237480, Oct 11, 2007
  • Filed:
    Feb 21, 2007
  • Appl. No.:
    11/709331
  • Inventors:
    Leonard Wardzala - Burlington WI, US
    Gregory Ballard - Belvidere IL, US
    Kurt Friel - Sycamore IL, US
  • International Classification:
    G02B 6/12
    C23C 26/00
  • US Classification:
    385129000, 427096100
  • Abstract:
    A method for fabricating thick film alumina structures used in high frequency, low loss applications is provided. More particularly, the invention is directed to a co-fire process for fabricating, or laminating, thick film structures to one another by printing a conductor layer between two thick film circuits, drying the layer, and co-firing the combined structure. This process is particularly useful in fabricating high frequency (e.g. 10 gigabit) fiber optic transmitters.
Name / Title
Company / Classification
Phones & Addresses
Leonard Wardzala
Executive Vice-President
Nano Micro Solutions, LLC
Thick Film Engineering Design and Manufacture · Business Services
590 E Gdn St, Dekalb, IL 60115
PO Box 4894, Wheaton, IL 60189
1812 Challenger Ct, Wheaton, IL 60189

Youtube

Highlights from the Green Ribbon Cutting

Thank you to everyone that joined us last week for the Green Ribbon Cu...

  • Category:
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  • Uploaded:
    27 Apr, 2010
  • Duration:
    2m 2s

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