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Lawrence F Wagner

age ~86

from Wappingers Falls, NY

Also known as:
  • Lawrence Wagner Tr
  • Lawrenc E Wagner
  • Larry Wagner
  • Laurence Wagner
  • Lawrence Wanger

Lawrence Wagner Phones & Addresses

  • Wappingers Falls, NY
  • Fishkill, NY
Name / Title
Company / Classification
Phones & Addresses
Lawrence A. Wagner
LITTLE JACKIE HOMES, LLC

Lawyers & Attorneys

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Lawrence Wagner - Lawyer

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ISLN:
923145056
Admitted:
1987

Resumes

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Tool And Processing Engineer

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Work:

Tool and Processing Engineer
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Lawrence Wagner

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Lawrence Wagner

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Lawrence Wagner

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Location:
United States
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Lawrence Wagner

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Location:
United States
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Lawrence Wagner

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Location:
United States

Isbn (Books And Publications)

  • Failure Analysis Of Integrated Circuits: Tools And Techniques

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  • Author:
    Lawrence C. Wagner
  • ISBN #:
    0412145618

Us Patents

  • Method Of Checking The Layout Versus The Schematic Of Multi-Fingered Mos Transistor Layouts Using A Sub-Circuit Based Extraction

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  • US Patent:
    20050216873, Sep 29, 2005
  • Filed:
    Mar 23, 2004
  • Appl. No.:
    10/807478
  • Inventors:
    Raminderpal Singh - Essex Junction VT, US
    Yue Tan - Poughkeepsie NY, US
    Jean-Oliver Plouchart - New York NY, US
    Lawrence Wagner - Fishkill NY, US
    Mohamed Talbi - Poughkeepsie NY, US
    John Safran - Wappingers Falls NY, US
    Kun Wu - Poughkeepsie NY, US
  • International Classification:
    G06F017/50
  • US Classification:
    716005000, 716004000, 716008000
  • Abstract:
    A sub-circuit based extraction method which extracts a multi-finger MOS transistor directly as a sub-circuit is described. By adding three marking layers, the method provides the layout extracted netlist with a complete list of device geometric parameters corresponding to the device properties as presented in the sub-circuit model based schematic netlist. By performing a layout-versus-schematic comparison based on all geometric parameters extracted, the layout checking is performed in a complete and accurate way where each device parameter is checked against the corresponding design schematic. This complete and accurate geometric parameter comparison enhances the confidence level of the layout physical verification.
  • Method For Use In Simulation Of An Soi Device

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  • US Patent:
    60235772, Feb 8, 2000
  • Filed:
    Sep 26, 1997
  • Appl. No.:
    8/938676
  • Inventors:
    George E. Smith - Wappingers Falls NY
    Lawrence F. Wagner - Fishkill NY
    Timothy L. Walters - Poughkeepsie NY
    Fariborz Assaderaghi - Mahopac NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G06G 748
  • US Classification:
    39550035
  • Abstract:
    A method for use in electronic design models encoded into design software for use in SOI based FET logic design includes simulation of an SOI device and setting a floating body voltage to any desired value at any time during the simulation, by adding to the model an ideal voltage source, whose value is a desired body voltage, in series with an ideal current source, whose value is a constant times the voltage across itself. When the constant is zero no current can flow, and any additional components have no effect on the circuit. When the constant is non-zero, said ideal current source appears to be the same as a resistor such that, current can flow in to or out from the body node, setting its voltage. The constant is kept zero at all times, except when it is desired to change the body voltage. The body voltage can be reset at any time to solve the problem of successive delays in one simulation run and resetting the voltage before each delay measurement starts.
  • Novel Vertical-Gate Cmos Compatible Lateral Bipolar Transistor

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  • US Patent:
    53410238, Aug 23, 1994
  • Filed:
    Jun 18, 1992
  • Appl. No.:
    7/900881
  • Inventors:
    Chang-Ming Hsieh - Fishkill NY
    Louis L. C. Hsu - Fishkill NY
    Ronald W. Knepper - LaGrangeville NY
    Lawrence F. Wagner - Fishkill NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    H01L 2972
  • US Classification:
    257559
  • Abstract:
    A lateral bipolar transistor has an extrinsic base layer on either side of a centrally disposed emitter layer and an intrinsic base and a collector oriented perpendicularly to the extrinsic base and collector layers.
  • Method Of Forming A Novel Vertical-Gate Cmos Compatible Lateral Bipolar Transistor

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  • US Patent:
    53710223, Dec 6, 1994
  • Filed:
    Feb 28, 1994
  • Appl. No.:
    8/203129
  • Inventors:
    Chang-Ming Hsieh - Fishkill NY
    Louis L. G. Hsu - Fishkill NY
    Ronald W. Knepper - LaGrangeville NY
    Lawrence F. Wagner - Fishkill NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    H01L 21265
  • US Classification:
    437 32
  • Abstract:
    A transistor with silicon on insulator (SOI) intrinsic base and a collector each formed by a low temperature epitaxial process and each orientated vertically with respect to the (SOI) substrate. The base width can be as narrow as in a conventional vertical transistor. Similarly, the collector width can be precisely controlled.
  • Method For Use In Simulation Of An Soi Device

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  • US Patent:
    61416320, Oct 31, 2000
  • Filed:
    Sep 2, 1999
  • Appl. No.:
    9/388594
  • Inventors:
    George E. Smith - Wappingers Falls NY
    Fariborz Assaderaghi - Mahopac NY
    Paul D. Muench - Poughkeepsie NY
    Lawrence F. Wagner - Fishkill NY
    Timothy L. Walters - Poughkeepsie NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G06G 748
  • US Classification:
    703 14
  • Abstract:
    A method for use in electronic design models encoded into design software for use in SOI based FET logic design includes simulation of an SOI device by and setting a floating body voltage to any desired value at any time during the simulation, by adding to the model an ideal voltage source, whose value is a desired body voltage, in series with an ideal current source, whose value is a constant times the voltage across itself. When the constant is zero, no current can flow, and any additional components have no effect on the circuit. When the constant is non-zero, said ideal current source appears to be the same as a resistor such that current can flow in to or out from the body node, setting its voltage. The constant is kept zero at all times, except when it is desired to change the body voltage. The body voltage can be reset at any time to solve the problem of successive delays in one simulation run and resetting the voltage before each delay measurement starts.
  • Soi Fet Design To Reduce Transient Bipolar Current

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  • US Patent:
    57708819, Jun 23, 1998
  • Filed:
    Sep 12, 1996
  • Appl. No.:
    8/712538
  • Inventors:
    Mario M. A. Pelella - Poughkeepsie NY
    Fariborz Assaderaghi - Mahopac NY
    Lawrence Federick Wagner - Fishkill NY
  • Assignee:
    International Business Machines Coproration - Armonk NY
  • International Classification:
    H01L 2701
  • US Classification:
    257347
  • Abstract:
    Producing a gap between a source and/or drain region of a silicon-on-insulator (SOI) field effect transistor which is less than the thickness of a depletion region normally surrounding the source and/or drain region, preferably at zero volts bias, permits gain of a parasitic bipolar transistor formed therewith to be transiently reduced and the effective base-emitter junction capacitance to be transiently increased during only modes of operation in which the parasitic bipolar conduction dominates normal operation of the field effect transistor. Such transient reduction of gain coupled with a transient reduction of high frequency response reduces the parasitic bipolar current spike to a degree greater than previously achievable and is fully compatible with other techniques of reducing such current spike. As applied to an SOICMOS SRAM, the transistor structure including such a gap is effective in suppressing half-select write disturb effects while maintaining the benefits of excess charge storage and floating body effects in the transistor.
  • Vertical-Gate Cmos Compatible Lateral Bipolar Transistor

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  • US Patent:
    54463122, Aug 29, 1995
  • Filed:
    Jun 24, 1994
  • Appl. No.:
    8/264885
  • Inventors:
    Chang-Ming Hsieh - Fishkill NY
    Louis L. G. Hsu - Fishkill NY
    Ronald W. Knepper - LaGrangeville NY
    Lawrence F. Wagner - Fishkill NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    H01L 2970
  • US Classification:
    257559
  • Abstract:
    A transistor with silicon on insulator (SOI) intrinsic base and a collector each formed by a low temperature epitaxial process and each orientated vertically with respect to the (SOI) substrate. The base width can be as narrow as in a conventional vertical transistor. Similarly, the collector width can be precisely controlled.
  • Gate Controlled Schottky Barrier Diode

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  • US Patent:
    52586405, Nov 2, 1993
  • Filed:
    Sep 2, 1992
  • Appl. No.:
    7/939214
  • Inventors:
    Chang-Ming Hsieh - Fishkill NY
    Louis L. Hsu - Fishkill NY
    Phung T. Nguyen - Poughkeepsie NY
    Lawrence F. Wagner - Fishkill NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    H01L 2948
    H01L 2956
  • US Classification:
    257471
  • Abstract:
    An integrated gate and semiconductor barrier layer diode which functions as a regular diode when the gate is turned off and as, a Schottky barrier diode with the gate turned on.

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Youtube

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Don't Cry For Me, Argentina: arr. Lawrence W...

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Plaxo

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Lawrence Wagner

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Atlanta, GeorgiaCorporate Graphics International

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Lawrence Stash Wagner

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Myspace

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Lawrence wagner

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Locality:
STATEN ISLAND, NEW YORK
Gender:
Male
Birthday:
1939
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Lawrence Wagner

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Locality:
Indiana
Gender:
Male
Birthday:
1948
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Lawrence Wagner

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Locality:
WOODBRIDGE, Virginia
Gender:
Male
Birthday:
1930
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Lawrence Wagner

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Locality:
Pagadian City, Zamboanga del Sur
Gender:
Male
Birthday:
1906
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Lawrence Wagner

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Gender:
Male
Birthday:
1939

Classmates

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Lawrence Wagner

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Schools:
Joyce Kilmer Elementary School Chicago IL 1952-1959
Community:
Len Hoisman, Bill Schey, Roberta Berkson
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Lawrence Wagner

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Schools:
Hague High School Hague Afghanistan 1960-1964
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Lawrence Wagner | Clarenc...

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Union College, Barbourvil...

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Graduates:
Daniel Plumley (1968-1972),
Barbara Campbell (1970-1974),
Lawrence Wagner (1975-1978)
Lawrence Wagner Photo 34

Hague High School, Hague,...

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Graduates:
Lawrence Wagner (1960-1964),
William Zacharias (1957-1961),
Kirstee Sawatzky (1991-1995),
Andrea Hamm (1994-1998)
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Joyce Kilmer Elementary S...

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Graduates:
Lawrence Wagner (1952-1959),
Dan Chernow (1978-1984),
Frances Campbell (1943-1949),
Kristine Simmons (1965-1973),
Peter Meyers (1954-1961)
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North Albion Collegiate H...

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Graduates:
Lawrence Wagner (1983-1987),
Fuad Yusuf (1985-1989),
Karman Jiri (1994-1998),
Himal Patel (2003-2007),
Steve Fabian (1987-1991)
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Clarenceville High School...

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Graduates:
Lawrence Wagner (1950-1954),
Jeffrey Ryzinski (1973-1977),
Renea McDonald (2004-2008)

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