Lawrence D Thorp

US Patent:

40603270, Nov 29, 1977

Filed:

Sep 13, 1976

Appl. No.:

5/722944

Inventors:

Lawrence Jacobowitz - Poughkeepsie NY
Einar S. Mathisen - Poughkeepsie NY
Lawrence D. Thorp - Yorktown NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01J 342
G01J 312

US Classification:

356 96

Abstract:

A spectrophotometer includes an illumination section for illuminating a test sample, and a spectrometer portion for receiving light from a test sample and measuring the radiant energy thereof as a function of wavelength. The spectrometer includes an entrance slit and two stationary gratings for dispersing light admitted through the slit into two separate dispersed beams or spectra. The separate beams are focused upon linear arrays of photodiodes providing outputs proportional to the intensity of the light rays at the different wavelengths received thereby. The gratings produce different primary orders of dispersion so that the efficiency of operation thereof is relatively high across a relatively wide band of radiant energy.

US Patent:

51684543, Dec 1, 1992

Filed:

Oct 30, 1989

Appl. No.:

7/428686

Inventors:

Mark J. LaPlante - Walden NY
Mark G. LaVine - Milton VT
David C. Long - Wappingers Falls NY
Poyang Lu - Hopewell Junction NY
John J. Seksinsky - Poughkeepsie NY
Lawrence D. Thorp - Yorktown Heights NY
Gerhard Weiss - La Grangeville NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

C06F 1546
B23K 2600

US Classification:

36447408

Abstract:

An apparatus and method for accurately and rapidly machining a workpiece, particularly for drilling holes smaller than can be formed by other methods, by using a high power pulsed Nd:YAG laser. A low power HeNe laser is joined to the optical path of the high power laser. The colinear beams then scan along one axis of the workpiece. The low power beam is partially split off to a location determining device before final deflection to the workpiece. Deflection in a second axis is achieved by linearly moving the workpiece so that the beam will impinge upon the desired location of the workpiece.

US Patent:

52206173, Jun 15, 1993

Filed:

Sep 4, 1991

Appl. No.:

7/754793

Inventors:

Kenneth A. Bird - New Paltz NY
Douglas Y. Kim - Poughkeepsie NY
Stephen J. Kish - Hyde Park NY
Julius J. Lambright - Hopewell Junction NY
Kurt R. Muller - Hopewell Junction NY
Lawrence D. Thorp - Yorktown Heights NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G06K 900

US Classification:

382 8

Abstract:

A method and apparatus for the inspection and handling of surface level defects is taught. Briefly stated, the object to be inspected is positioned. A Laser light is polarized into at least one orientation and then reflected off of a rotated polygon mirror. This causes the light to "move" over the area of interest. A plurality of fiber optic bundles are used to receive and conduct the reflected light back to photomultipliers. The photomultipliers convert the light into electrical signals while associated electronics digitize the signals, keeping track of pixels which are produced. By keeping track of pixel edge boundaries and determining if certain thresholds are exceeded or not met as appropriate, the area of interest can be checked for a variety of defects. By comparison of the defects to a reference base, the defects and hence the items inspected can be categorized.

US Patent:

52164853, Jun 1, 1993

Filed:

Sep 4, 1991

Appl. No.:

7/754794

Inventors:

Kenneth A. Bird - New Paltz NY
Douglas Y. Kim - Poughkeepsie NY
Stephen J. Kish - Hyde Park NY
Julius J. Lambright - Hopewell Junction NY
Kurt R. Muller - Hopewell Junction NY
Lawrence D. Thorp - Yorktown Heights NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01N 2188

US Classification:

356394

Abstract:

A method and apparatus for the inspection and handling of surface level defects is taught. Briefly stated, the object to be inspected is positioned. A Laser light is polarized into at least one orientation and then reflected off of a rotated polygon mirror. This causes the light to "move" over the area of interest. A plurality of fiber optic bundles are used to receive and conduct the reflected light back to photomultipliers. The photomultiplers convert the light into electrical signals while associated electronics digitize the signals, keeping track of pixels which are produced. By keeping track of pixel edge boundaries and determining if certain thresholds are exceeded or not met as appropriate, the area of interest can be checked for a variety of defects. By comparison of the defects to a reference base, the defects and hence the items inspected can be categorized.