Kurt H Copley

age ~51

from Harvest, AL

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Kurt Copley Phones & Addresses

105 Lavender Sky, Harvest, AL 35749 • 256 885-6818
813 Bristol Dr, Smyrna, TN 37167 • 615 751-5831
1606 Tennessee Blvd, Murfreesboro, TN 37130 • 615 893-3809
Nashville, TN
Rutherford, TN
Huntsville, AL

Work

Company:

Synapse wireless - Huntsville, AL
2013
Position:

Sr software engineer

Education

School / High School:

ITT Technical Institute- Donelson, TN
1994
Specialities:

Bachelor of Applied Sciences in Electrical Engineering Technology

Skills

Embedded Systems: Throughput analysis an... • Memory recovery • C • C++ • MISRA Compliance • Assembly • Disassembly • Micrium uC OS II RTOS • Nucleus RTOS • OSA RTOS • SPI • I2C • DMA • ADC's • RS232 • RS485 • 802-15-4 (Zigbee radios) • Mesh networking

Software: C... • Subversion • GIT • Team Foundation Server • Visual Studio 2008 • Source Safe • Perforce • Quality Center • Win Runner • AT Easy • MATLAB • DOS • Windows • Microsoft Office • VBA • Access

Processors: Microchi... • PIC18 • PIC24 • PIC32) • ARM Cortex-M3 and M4 (STM32 Family) • ARM 7 (NXP2368) • 68HC908 • Atmel Atmega169V • Atmega128RFA1 • Atmega128RFR2 family

Develo... • IAR Embedded Workbench Compiler and IDE • Microchip MPLab and Compilers • Real View Compiler and IDE • WinAVR compiler with AVR Studio 4 • Signum Chameleon Trace • Code Wright • Slick Edit • Araxis Merge • PC Lint • Enterprise Architect (UML) with some exp... • User interface • Metering Algorithms in AC Systems • IEEE and IEC Standards • Learning and evaluating new tools • FCC • EMC and Environmental Testing • Automated and Manual Testing of Firmware • Hardware and Software • PCB Validation • Modbus • UML • Calibration schemes • Peer reviews • Coding standards • Data Acquisition Systems • Digital Signal Processing (DSP)

Us Patents

System And Method For Frequency Measurement Based On Quadratic Forms
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US Patent:

8489351, Jul 16, 2013
Filed:

Sep 30, 2010
Appl. No.:

12/895030
Inventors:

Ronald W. Carter - Russellville AR, US
Kurt H. Copley - Smyrna TN, US
Assignee:

Schneider Electric USA, Inc. - Palatine IL
International Classification:

G01R 23/00
US Classification:

702 75
Abstract:

A system and methods for determining points for an algorithm to calculate the frequency of a waveform measured from a monitoring device. Data points are measured from the waveform. A last point of interest from the previous cycle of the waveform is referenced. Four points of interest at equally spaced phase angles from the current cycle of the waveform are determined by calculating the average of the data points around each of the respective equally spaced phase angles of the current cycle of the waveform. The average value of the points of interest in the current cycle is subtracted from the four points of interest and the last point of interest from the previous cycle to compensate for DC bias. A frequency of the waveform is determined based on the determined four points of interest of the current cycle and the last point of interest from the previous cycle. The correction factor for determining sample frequency may be reduced for subsequent cycles in order to increase stability.

Method For Measurement Of Total Harmonic Distortion
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US Patent:

20120081104, Apr 5, 2012
Filed:

Oct 1, 2010
Appl. No.:

12/896060
Inventors:

Kurt H. Copley - Smyrna TN, US
Donovan Eugene Wilkerson - Nolensville TN, US
Assignee:

Schneider Electric USA, Inc. - Palatine IL
International Classification:

G01R 23/16
US Classification:

324 7612
Abstract:

A method of measuring the total harmonic distortion in an electrical distribution system. The distribution system is sampled regularly to generate a set of data. The data is filtered using a narrow band filtering algorithm to measure the energy in fundamental and other harmonic frequencies. Due to the filtering, the energy in harmonic frequencies can be measured without interference from broadband noise, which provides an improvement in the measurement of total harmonic distortion at low current or voltage levels. A method is provided to sum the energy in identified frequencies in a multi-pass configuration, such that only a subset of all monitored frequencies are filtered and summed in each pass, with the balance being filtered and measured in subsequent passes. After all subsets are measured, the total harmonic distortion is calculated.

Quantizing Sampled Inputs Using Fixed Frequency Analog To Digital Conversions Through Interpolation
view source
US Patent:

20120081153, Apr 5, 2012
Filed:

Sep 30, 2010
Appl. No.:

12/894856
Inventors:

Ronald W. Carter - Russellville AR, US
Kurt H. Copley - Smyrna TN, US
Assignee:

SCHNEIDER ELECTRIC USA, INC. - Palatine IL
International Classification:

G11C 27/02
US Classification:

327 91
Abstract:

A system and methods for synchronizing quantized sampled data in a monitoring device. A variable frequency output signal is coupled to an analog to digital converter. A fixed frequency clock is coupled to the analog to digital converter. The analog to digital converter samples the output signal at a fixed frequency to produce high speed samples. A group of initial high speed samples is stored from the analog to digital converter over a fixed window of time. The group of initial high speed samples is interpolated to produce a group of fewer low speed samples from the initial group of high speed samples over the fixed window of time. The group of low speed samples is stored as a representation of the variable frequency output signal.

Name / Title

Company / Classification

Phones & Addresses

Kurt Copley
Principal

Kmac Music Distributors
Whol Nondurable Goods

813 Bristol Dr, Smyrna, TN 37167

Resumes

Kurt Copley Harvest, AL

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Work:

Synapse Wireless
Huntsville, AL
2013 to 2015
Sr Software Engineer 3SAE
Franklin, TN
2012 to 2013
Firmware Engineer Schneider Electric
Lavergne, TN
2012 to 2012
Consulting Firmware Engineer Cyber Sciences
Murfreesboro, TN
2011 to 2012
Consulting Firmware Engineer Barrett
Murfreesboro, TN
2010 to 2012
Consulting Firmware Engineer Schneider Electric

1999 to 2012
Staff Firmware Engineer DPI Power

2010 to 2010
Consulting Firmware Engineer ITT Technical Institute
Nashville, TN
1998 to 1999
Electronics Instructor Heatcraft
Murfreesboro, TN
1995 to 1998
Associate Engineer

Education:

ITT Technical Institute
Donelson, TN
1994 to 1997
Bachelor of Applied Sciences in Electrical Engineering Technology Alice Lloyd College
Pippa Passes, KY
1991 to 1992
Pre-engineering

Skills:

Embedded Systems: Throughput analysis and improvement, Memory recovery, C, C++, MISRA Compliance, Assembly, Disassembly, Micrium uC OS II RTOS, Nucleus RTOS, OSA RTOS, SPI, I2C, DMA, ADC's, RS232, RS485, 802-15-4 (Zigbee radios), Mesh networking Software: Caliber Requirements Manager, Subversion, GIT, Team Foundation Server, Visual Studio 2008, Source Safe, Perforce, Quality Center, Win Runner, AT Easy, MATLAB, DOS, Windows, Microsoft Office, VBA, Access Processors: Microchip (PIC16, PIC18, PIC24, PIC32), ARM Cortex-M3 and M4 (STM32 Family), ARM 7 (NXP2368), 68HC908, Atmel Atmega169V, Atmega128RFA1, Atmega128RFR2 family Developer tools: Cosmic Compiler, IAR Embedded Workbench Compiler and IDE, Microchip MPLab and Compilers, Real View Compiler and IDE, WinAVR compiler with AVR Studio 4, Signum Chameleon Trace, Code Wright, Slick Edit, Araxis Merge, PC Lint, Enterprise Architect (UML) with some exposure to Python and PEP-8 General: Stepper motor controllers, User interface, Metering Algorithms in AC Systems, IEEE and IEC Standards, Learning and evaluating new tools, FCC, EMC and Environmental Testing, Automated and Manual Testing of Firmware, Hardware and Software, PCB Validation, Modbus, UML, Calibration schemes, Peer reviews, Coding standards, Data Acquisition Systems, Digital Signal Processing (DSP)