Chien Chiang - Fremont CA Chuanbin Pan - Santa Clara CA Vicky M. Ochoa - Pleasanton CA Sychyi Fang - Palo Alto CA David B. Fraser - Danville CA Joyce C. Sum - Cupertino CA Gary William Ray - Mountain View CA Jeremy A. Theil - Menlo Park CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H01L 2128
US Classification:
438623
Abstract:
An interconnect system is provided. The interconnect system includes a silicon substrate and a first dielectric layer formed upon the silicon substrate. The interconnect system also includes a first level of at least two electrically conductive lines formed upon the first dielectric layer. The interconnect system further includes a region of low dielectric constant material formed between the at least two electrically conductive lines. The interconnect system also includes a first hard mask formed upon the polymer region.
Interconnect Structure With Hard Mask And Low Dielectric Constant Materials
Chien Chiang - Fremont CA Chuanbin Pan - Santa Clara CA Vicky M. Ochoa - Pleasanton CA Sychyi Fang - Palo Alto CA David B. Fraser - Danville CA Joyce C. Sum - Cupertino CA Gary William Ray - Mountain View CA Jeremy A. Theil - Menlo Park CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H01L 23485
US Classification:
257759
Abstract:
An interconnect system is provided. The interconnect system includes a silicon substrate and a first dielectric layer formed upon the silicon substrate. The interconnect system also includes a first level of at least two electrically conductive lines formed upon the first dielectric layer. The interconnect system further includes a region of low dielectric constant material formed between the at least two electrically conductive lines. The interconnect system also includes a first hard mask formed upon the polymer region.