John M Visher

US Patent:

7830310, Nov 9, 2010

Filed:

Jul 1, 2005

Appl. No.:

11/173182

Inventors:

Daniel F. Sievenpiper - Santa Monica CA, US
Joseph S. Colburn - Malibu CA, US
Bryan Ho Lim Fong - Los Angeles CA, US
Matthew W. Ganz - Marina del Rey CA, US
Mark F. Gyure - Oak Park CA, US
Jonathan J. Lynch - Oxnard CA, US
John Ottusch - Malibu CA, US
John L. Visher - Malibu CA, US

Assignee:

HRL Laboratories, LLC - Malibu CA

International Classification:

H01Q 1/38

US Classification:

343700MS, 343909

Abstract:

An artificial impedance structure and a method for manufacturing same. The structure contains a dielectric layer having generally opposed first and second surfaces, a conductive layer disposed on the first surface, and a plurality of conductive structures disposed on the second surface to provide a preselected impedance profile along the second surface.

US Patent:

7911407, Mar 22, 2011

Filed:

Jun 12, 2008

Appl. No.:

12/138083

Inventors:

Bryan Ho Lim Fong - Los Angeles CA, US
Joseph S. Colburn - Malibu CA, US
Paul R. Herz - Santa Monica CA, US
John J. Ottusch - Malibu CA, US
Daniel F. Sievenpiper - Santa Monica CA, US
John L. Visher - Malibu CA, US

Assignee:

HRL Laboratories, LLC - Malibu CA

International Classification:

H01Q 15/02
H01Q 1/38

US Classification:

343909, 343700 MS, 343754

Abstract:

A method for designing artificial impedance surfaces is disclosed. The method involves matching impedance component values required for a given far-field radiation pattern (determined, for example, by holographic means) with measured or simulated impedance component values for the units of a lattice of conductive structures used to create an artificial impedance surface, where the units of the lattice have varied geometry. For example, a unit could be a square conductive structure with a slice (removed or missing material) through it. The measured or simulated impedance components are determined by measuring wavevector values for test surfaces in three or more directions over any number of test surfaces, where each unit of a given test surface has the same geometric shape and proportions as all of the other units of that test surface, but each test surface has some form of variation in the unit geometry from the other test surfaces. These test measurements create a table of geometry vs. impedance components that are used to design the artificial impedance structure.

US Patent:

7929147, Apr 19, 2011

Filed:

May 31, 2008

Appl. No.:

12/156445

Inventors:

Bryan H. Fong - Los Angeles CA, US
Joseph S. Colburn - Malibu CA, US
John Ottusch - Malibu CA, US
Daniel F. Sievenpiper - Los Angeles CA, US
John L. Visher - Malibu CA, US

Assignee:

HRL Laboratories, LLC - Malibu CA

International Classification:

G01B 11/02
H01Q 15/02
H01Q 15/24

US Classification:

356496, 343909

Abstract:

A method and system for determining an optimized artificial impedance surface is disclosed. An artificial impedance pattern is calculated on an impedance surface using an optical holographic technique given an assumed surface wave profile and a desired far field radiation pattern. Then, an actual surface wave profile produced on the impedance surface from the artificial impedance pattern, and an actual far field radiation pattern produced by the actual surface wave profile are calculated. An optimized artificial impedance pattern is then calculated by iteratively re-calculating the artificial impedance pattern from the actual surface wave profile and the desired far field radiation pattern. An artificial impedance surface is determined by mapping the optimized artificial impedance pattern onto a representation of a physical surface.

US Patent:

20070001909, Jan 4, 2007

Filed:

Jul 1, 2005

Appl. No.:

11/173187

Inventors:

Daniel Sievenpiper - Santa Monica CA, US
Joseph Colburn - Malibu CA, US
Bryan Fong - Los Angeles CA, US
Matthew Ganz - Marina del Rey CA, US
Mark Gyure - Oak Park CA, US
Jonathan Lynch - Oxnard CA, US
John Ottusch - Malibu CA, US
John Visher - Malibu CA, US

International Classification:

H01Q 1/38

US Classification:

3437000MS, 343909000

Abstract:

A method for guiding waves over objects, a method for improving a performance of an antenna, and a method for improving a performance of a radar are disclosed. The methods disclosed teach how an impedance structure can be used to guide waves over objects.

Author:

John S. Visher

ISBN #:

0806507438

Author:

John S. Visher

ISBN #:

0809255936

Author:

John S. Visher

ISBN #:

0876301901

Author:

John S. Visher

ISBN #:

0876304897

Author:

John S. Visher

ISBN #:

0876306490

Author:

John S. Visher

ISBN #:

0876307993

Author:

John S. Visher

ISBN #:

0934878102