John W Hyde

US Patent:

7307528, Dec 11, 2007

Filed:

Dec 15, 2004

Appl. No.:

11/014075

Inventors:

Robert M. Glidden - Rancho Palos Verdes CA, US
Dennis Kiyoshi Hara - Bellevue WA, US
Ronald A. Oliver - Seattle WA, US
Jay A. Kuhn - Seattle WA, US
John D. Hyde - Corvallis OR, US

Assignee:

IMPINJ, Inc. - Seattle WA

International Classification:

G01R 31/26

US Classification:

3405721, 324765, 324537, 324754, 324759, 324763

Abstract:

Technologies suitable for on-wafer testing in the ubiquitous computing era are disclosed. Among the inventive features disclosed are: 1) clustering of wafer test probe landing area sites for parallel test sequencing; 2) on wafer test wiring that runs along the wafer's scribe regions; 3) on-wafer test wiring that can be scribed and yet thwart the spread of contamination into the product die; 4) an RFID tag design that allows for on-wafer testing without imposing substantial semiconductor surface area penalty; 5) an RFID tag design that includes built-in self test (BIST) circuitry for the RFID tag's non-volatile memory.

US Patent:

7307529, Dec 11, 2007

Filed:

Dec 17, 2004

Appl. No.:

11/016546

Inventors:

Vadim Gutnik - Irvine CA, US
John D. Hyde - Corvallis OR, US
David D. Dressler - Shoreline WA, US
Alberto Pesavento - Seattle WA, US
Ronald A. Oliver - Seattle WA, US
Scott Anthony Cooper - Seattle WA, US
Kurt Eugene Sundstrom - Woodinville WA, US

Assignee:

IMPINJ, Inc. - Seattle WA

International Classification:

G08B 13/14

US Classification:

3405721, 365 96

Abstract:

An RFID tag has a fuse that is adapted to store configuration data in a way that survives loss of power. The fuse can be one time programmable or many times programmable, and be implemented with a non-volatile memory. The configuration data becomes available to an operational component of the tag, such as at power up, controlling its performance.

US Patent:

20060133140, Jun 22, 2006

Filed:

Dec 17, 2004

Appl. No.:

11/015293

Inventors:

Vadim Gutnik - Irvine CA, US
John Hyde - Corvallis OR, US
David Dressler - Shoreline WA, US
Alberto Pesavento - Seattle WA, US
Ronald Oliver - Seattle WA, US
Scott Cooper - Seattle WA, US
Kurt Sundstrom - Woodinville WA, US

International Classification:

G11C 11/34
G11C 14/00

US Classification:

365185080

Abstract:

An RFID tag has a Non Volatile Memory (NVM) array that can store data in a way that survives loss of power. The data is configuration data that controls the operation of an operational component of the tag. A performance of the operational component is thus adjusted according to the configuration data, and the adjustment is retained.

US Patent:

60645075, May 16, 2000

Filed:

Dec 7, 1998

Appl. No.:

9/206912

Inventors:

Donald G. Heflinger - Torrance CA
Phillip D. Hayashida - Torrance CA
Todd E. Humes - Thousand Oaks CA
John D. Hyde - Corvallis OR

Assignee:

TRW Inc. - Redondo Beach CA

International Classification:

G02B 2600

US Classification:

359237

Abstract:

A high speed differential optoelectronic receiver comprises a first photodetector responsive to a first incident amplitude modulated optical signal and operative to develop a first electrical signal, a second photodetector responsive to a second incident amplitude modulated optical signal that is complementary to the first optical signal and operative to develop a second electrical signal, and an amplifier having a first input that is responsive to the first electrical signal and a second input that is responsive to the second electrical signal and is operative to provide a differential output signal that is proportional to the difference between the first and the second electrical signals. Also, a method for transforming complementary amplitude modulated optical signals into a complementary electrical output signal is invented.