Jeremy Duane Cooper

Author:

Jeremy Cooper

ISBN #:

0094613702

Author:

Jeremy Cooper

ISBN #:

0500013543

Author:

Jeremy Cooper

ISBN #:

0500234906

Author:

Jeremy Cooper

ISBN #:

0500270465

Author:

Jeremy Cooper

ISBN #:

0500280223

Author:

Jeremy Cooper

ISBN #:

0566055074

Author:

Jeremy Cooper

ISBN #:

0421303506

Author:

Jeremy Cooper

ISBN #:

0631142991

US Patent:

8362409, Jan 29, 2013

Filed:

Apr 22, 2010

Appl. No.:

12/765756

Inventors:

Jeremy R. Cooper - Issaquah WA, US
Paul Goodwin - Shore Line WA, US

Assignee:

Applied Precision, Inc. - Issaquah WA

International Classification:

G02B 7/04
G03B 13/00
G03B 21/53

US Classification:

2502014, 396137

Abstract:

Embodiments of the present invention are directed to autofocus subsystems within optical instruments that continuously monitor the focus of the optical instruments and adjust distances within the optical instrument along the optical axis in order to maintain a precise and stable optical-instrument focus at a particular point or surface on, within, or near a sample. Certain embodiments of the present invention operate asynchronously with respect to operation of other components and subsystems of the optical instrument in which they are embedded.

US Patent:

8558154, Oct 15, 2013

Filed:

Aug 30, 2011

Appl. No.:

13/221710

Inventors:

Jeremy Cooper - Issaquah WA, US
Paul Goodwin - Shoreline WA, US
Stephen G. Goodson - Seattle WA, US

Assignee:

Applied Precision, Inc. - Issaquah WA

International Classification:

G02B 27/64

US Classification:

2502014

Abstract:

The current application is directed to autofocus subsystems within optical instruments that continuously monitor the focus of the optical instruments and adjust distances within the optical instrument along the optical axis in order to maintain a precise and stable optical-instrument focus at a particular point or surface on, within, or near a sample. Certain autofocus implementations operate asynchronously with respect to operation of other components and subsystems of the optical instrument in which they are embedded. The described autofocus subsystems employ multiple calibration curves to precisely adjust the z-position of an optical instrument.

US Patent:

20100238681, Sep 23, 2010

Filed:

Mar 12, 2010

Appl. No.:

12/723604

Inventors:

Ronald Seubert - Sammamish DC, US
Jeremy Cooper - Issaquah WA, US

International Classification:

G02B 6/04

US Classification:

362554, 362555

Abstract:

Various embodiments of the present invention are directed to optical-fiber-based light sources for use in microscopy, spectrometry, and other scientific and technical instruments, devices, and processes. Light-emitting diodes (“LEDs”) and other light sources are, in various embodiments of the present invention, incorporated on or within an optical fiber or fiber-optic cable in order to produce a bright optical-fiber-based light source. By incorporating light-emitting devices on or within an optical fiber, a significantly greater photon flux can be obtained, within the optical fiber or fiber-optic cable, than can be obtained by directing light from equivalent, external light-emitting elements into the optical fiber or fiber-optic cable, and the optical-fiber-based light sources of the present invention provide desirable characteristics of the light sources embedded on or within them.

US Patent:

20120176672, Jul 12, 2012

Filed:

Dec 28, 2011

Appl. No.:

13/338664

Inventors:

JEREMY R. COOPER - ISSAQUAH WA, US

Assignee:

APPLIED PRECISION, INC. - ISSAQUAH WA

International Classification:

G02B 21/08

US Classification:

359385

Abstract:

Correction elements that can be incorporated in objective-based TIRF microscopy instruments to correct for chromatic aberrations are described. A correction element can be placed between a multiple wavelength excitation beam source and the microscope objective lens. In one aspect, the thickness of the correction element is defined to compensate for different axial positions of the focal points associated with each excitation wavelengths traveling along the outer edge of lenses comprising a microscope objective lens. In another aspect, the correction element can be angled and/or configured so that the different wavelengths of multiple wavelength excitation light are shifted to adjust the angle of incidence for each wavelength at the specimen/substrate interface.

US Patent:

20120176673, Jul 12, 2012

Filed:

Jan 12, 2012

Appl. No.:

13/348750

Inventors:

JEREMY R. COOPER - ISSAQUAH WA, US

Assignee:

APPLIED PRECISION, INC. - ISSAQUAH WA

International Classification:

G02B 21/06
G02B 27/28

US Classification:

359386, 35949201, 35949002, 35948908, 359385

Abstract:

Various superimposing beam controls that can superimpose beams of light with different optical properties are described. In one aspect, a beam control receives a beam of light and outputs one or more beams. Each beam is output in a different polarization state and with different optical properties. Superimposing beam controls can be incorporated in fluorescence microscopy instruments to split a beam of excitation light into one or more beams of excitation light. Each beam of excitation light has a different polarization and is output with different optical properties so that each excitation beam can be used to execute a different microscopy technique.

US Patent:

20130286456, Oct 31, 2013

Filed:

Dec 29, 2011

Appl. No.:

13/979098

Inventors:

Jeremy R. Cooper - Issaquah WA, US

Assignee:

Applied Precision Inc. - Issaquah WA

International Classification:

G02B 21/00
G02B 26/10

US Classification:

3592051

Abstract:

Various light-scanning systems that can be used to perform rapid point-by-point illumination of a focal plane within a specimen are disclosed. The light-scanning systems can be incorporated in confocal microscopy instruments to create an excitation beam pivot axis that lies within an aperture at the back plate of an objective lens. The light-scanning systems receive a beam of excitation light from a light source and direct the excitation beam to pass through the pivot point in the aperture of the back plate of the objective lens while continuously scanning the focused excitation beam across a focal plane.

US Patent:

20130335797, Dec 19, 2013

Filed:

Jan 16, 2012

Appl. No.:

14/002534

Inventors:

Jeremy R. Cooper - Issaquah WA, US

International Classification:

G02B 21/00
G02B 21/06
G02B 26/10

US Classification:

3591992, 3592041, 3591993, 359388

Abstract:

Various beam selectors for selectively placing one of at least two beams of light along the same output path are disclosed. In one aspect, a beam selector receives at least two substantially parallel beams of light. The beam selector includes a plate with an aperture so that when one of the at least two beams is selected for transmission, the beam selector directs only the selected beam along an output path through the aperture. The plate can also serve to block transmission of unselected beams. The output path through the aperture is the same for each of the at least two beams when each beam is selected. Beam selectors can be incorporated into fluorescence microscopy instruments to selectively place particular excitation beams along the same path through the microscope objective lens and into a specimen to excite fluorescence of fluorescent probes attached to a particular component of the specimen.

US Patent:

20130335798, Dec 19, 2013

Filed:

Jan 16, 2012

Appl. No.:

14/002615

Inventors:

Jeremy R. Cooper - Issaquah WA, US

Assignee:

Applied Precision, Inc. - Issaquah WA

International Classification:

G02B 26/08
G02B 26/10

US Classification:

3592051, 3592262, 3592212

Abstract:

Irradiance control systems (“ICSs”) that control the irradiance of a beam of light are disclosed. ICSs include in a beam translator and a beam launch. The beam translator translates the beam substantially perpendicular to the propagating direction of the beam with a desired displacement so that the beam launch can remove a portion of the translated beam and the beam can be output with a desired irradiance. The beam launch attenuates the irradiance of the beam based on the amount by which the beam is translated. ISCs can be incorporated into fluorescent microscopy instruments to provide high-speed, fine-tune control over the irradiance of excitation beams.