Arthur J Kamp

US Patent:

42933790, Oct 6, 1981

Filed:

Mar 26, 1980

Appl. No.:

6/134046

Inventors:

Kerry J. Kelly - Midland MI
Arthur J. Kamp - Oakley CA

Assignee:

The Dow Chemical Company - Midland MI

International Classification:

G01N 23222

US Classification:

376159

Abstract:

Sodium is determined, virtually without known interferences, based on neutron activation of liquid sample to produce radioactive. sup. 23 Ne activation product from. sup. 23 Na, sparging of the sample whereby a headspace gas mixture comprising. sup. 23 Ne in an inert sparging gas is collected, and remote analysis of the headspace gas mixture to determine total parent sodium based on monitoring radiation emissions of. sup. 23 Ne. As an illustration of utility, the analysis is demonstrated as applicable to determinations of sodium in aqueous or organic matrices at concentrations of 1 part per thousand and greater using preferred forms of. sup. 241 Am/Be radioactive isotope as the activation source.

US Patent:

42285127, Oct 14, 1980

Filed:

May 3, 1978

Appl. No.:

5/902312

Inventors:

John W. Thompson - Midland MI
Arthur J. Kamp - Midland MI
Edward R. Sederlund - Saginaw MI

Assignee:

The Dow Chemical Company - Midland MI

International Classification:

G06F 1546

US Classification:

364527

Abstract:

A nuclear pulse counting experiment, such as typified by the art of X-ray fluorescence empolys a multichannel analog to digital converter (ADC) which is interfaced with a microprocessor to yield sample/matrix concentration data, as an illustrative example, with a precision which is given by the theoretical nuclear decay statistical limits. In specific regard to X-ray fluorescence analysis, the ADC characterizes each pulse or count according to magnitude without conventional backscatter peak gain stabilization. The data is transferred through a buffer to the microprocessor, which scans the higher energy characterizations for maximum count, identifies that characterization as the peak,. +-. 1 characterization, and interpolates to develop a refined backscatter peak, stated to at least 1/10 of a characterization, and from which data base all ensuing calculations are predicated.

US Patent:

40668983, Jan 3, 1978

Filed:

Apr 12, 1976

Appl. No.:

5/676036

Inventors:

Arthur J. Kamp - Midland MI
Philip G. Mischler - Midland MI

Assignee:

The Dow Chemical Company - Midland MI

International Classification:

G01N 2300

US Classification:

250359

Abstract:

An apparatus and method based on X-ray transmission is disclosed for determining the thickness, or equivalently, the weight per unit area, of a substance containing atoms of a non-radioactive element of atomic number of 11 or greater applied to a fabric, such as a calcium- and/or aluminum-containing latex coating on a carpet. The apparatus employs a source of radiation which emits a single predominant X-ray within the range of 12-19 Kev, such as zirconium which fluoresces at 16 Kev when bombarded with 60 Kev radiation from americium-241; a detector sensitive to the radiation emitted and having resolution at least as sharp as about 20 percent, such as a Kr/CO. sub. 2 proportional counter; and a suitable electronic circuit to convert the charge pulse output of the detector to a readout signal related to the amount of the substance on the fabric.