James M Dwornick

US Patent:

20130091957, Apr 18, 2013

Filed:

Oct 14, 2011

Appl. No.:

13/273649

Inventors:

Charles E. Beyer - Rochester MI, US
James M. Dwornick - Brownstown MI, US
Murthy Kowsika - Troy MI, US
R. Elliott Crews - Ypsilanti MI, US
David T. Chuey - Brownstown MI, US

Assignee:

CHRYSLER GROUP LLC - Auburn Hills MI

International Classification:

G01L 1/24

US Classification:

73800

Abstract:

In at least one implementation, a method for determining the stiffness of a structure may include connecting a test member to the structure, directing a beam of light at a measurement surface carried by at least one of the test member or the structure, impacting an impact surface carried by the test member with a known impact force, and determining the movement of the measurement surface that is caused by the impact. The movement of the measurement surface may be determined as a function of changes in the length of the beam of light and the stiffness of the structure may be a function of the magnitude of the measurement surface movement.