Huan V Nguyen

US Patent:

7751891, Jul 6, 2010

Filed:

Jul 28, 2004

Appl. No.:

10/902221

Inventors:

Randolph K. Armstrong - Houston TX, US
Albert W. Guzman - League City TX, US
Huan D. Nguyen - Houston TX, US

Assignee:

Cyberonics, Inc. - Houston TX

International Classification:

A61N 1/378

US Classification:

607 29

Abstract:

A method and an apparatus for projecting an end of service (EOS) and/or an elective replacement indication (ERI) of a component in an implantable device and for determining an impedance experienced by a lead associated with the implantable device. An active charge depletion of an implantable device is determined. An inactive charge depletion of the implantable device is determined. A time period until an end of service (EOS) and/or elective replacement indication (ERI) of a power supply associated with the IMD based upon the active charge depletion, the inactive charge depletion, and the initial and final (EOS) battery charges, is determined. Furthermore, to determine the impedance described above, a substantially constant current signal is provided through a first terminal and a second terminal of the lead. A voltage across the first and second terminals is measured. An impedance across the first and second terminals is determined based upon the constant current signal and the measured voltage.

US Patent:

7869885, Jan 11, 2011

Filed:

Apr 28, 2006

Appl. No.:

11/414393

Inventors:

Jason D. Begnaud - Houston TX, US
Chris G. Dupont - League City TX, US
Jerry J. Kolafa - Richmond TX, US
Huan D. Nguyen - Houston TX, US

Assignee:

Cyberonics, Inc - Houston TX

International Classification:

A61N 1/36

US Classification:

607118, 607 46

Abstract:

Methods and systems for determining an optimal therapeutic window of parameter settings for nerve stimulation therapy are described herein. The disclosed techniques generally utilize one or more parameter sweeps to determine upper and lower threshold settings. The determination of the optimal therapeutic window may be performed during or after implantation.

US Patent:

8086310, Dec 27, 2011

Filed:

May 21, 2010

Appl. No.:

12/785244

Inventors:

Randolph K. Armstrong - Houston TX, US
Albert W. Guzman - League City TX, US
Huan D. Nguyen - Houston TX, US

Assignee:

Cyberonics, Inc. - Houston TX

International Classification:

A61N 1/378

US Classification:

607 29, 607 4, 607 5, 607 27

Abstract:

A method and an apparatus for projecting an end of service (EOS) and/or an elective replacement indication (ERI) of a component in an implantable device and for determining an impedance experienced by a lead associated with the implantable device. An active charge depletion of an implantable device is determined. An inactive charge depletion of the implantable device is determined. A time period until an end of service (EOS) and/or elective replacement indication (ERI) of a power supply associated with the IMD based upon the active charge depletion, the inactive charge depletion, and the initial and final (EOS) battery charges, is determined. Furthermore, to determine the impedance described above, a substantially constant current signal is provided through a first terminal and a second terminal of the lead. A voltage across the first and second terminals is measured. An impedance across the first and second terminals is determined based upon the constant current signal and the measured voltage.