Search

Howard R Beratan

age ~70

from Woodland Hills, CA

Also known as:
  • Howard R Beraton
  • Roy Beratan Howard

Howard Beratan Phones & Addresses

  • Woodland Hills, CA
  • 2111 Belt Line Rd, Richardson, TX 75081 • 972 680-8072
  • 2111 E Belt Line Rd #106B, Richardson, TX 75081 • 972 680-8072
  • 125 Cherry Valley Rd, Pittsburgh, PA 15221 • 412 731-1628
  • Andrews, TX
  • 125 Cherry Valley Rd, Pittsburgh, PA 15221 • 214 349-8251

Work

  • Position:
    Clerical/White Collar

Education

  • Degree:
    High school graduate or higher

Us Patents

  • Micro-Bolometer Cell Structure

    view source
  • US Patent:
    6361825, Mar 26, 2002
  • Filed:
    Aug 20, 1996
  • Appl. No.:
    08/699960
  • Inventors:
    Howard R. Beratan - Richardson TX
    Charles M. Hanson - Richardson TX
  • Assignee:
    Texas Instruments Incorporated - Dallas TX
  • International Classification:
    C23C 1640
  • US Classification:
    4271261, 427162, 4273762, 42725531, 42725535, 42725536
  • Abstract:
    A pyroelectric detector system, the pyroelectric detector element therefor and the method of making the detector element which comprises an integrated circuit ( ) and a pyroelectric detector element ( ) coupled to the integrated circuit and thermally isolated from the integrated circuit. The element includes a lead-containing pyroelectric layer having a pair of opposing surfaces and having a thickness to provide a resonant cavity for radiations in a predetermined frequency range. A bottom electrode ( ) opaque to radiations in the predetermined frequency range is secured to one of the pair of opposing surfaces and a top electrode ( ) is secured to the other of the pair of opposing surfaces which is semi-transparent to radiations in the predetermined frequency range. The top electrode is taken from the group consisting of platinum and nichrome. The lead-containing pyroelectric layer is preferably lead titanate.
  • Electrode Interface For High-Dielectric-Constant Materials

    view source
  • US Patent:
    6362068, Mar 26, 2002
  • Filed:
    Feb 17, 1998
  • Appl. No.:
    09/024799
  • Inventors:
    Scott R. Summerfelt - Dallas TX
    Howard Roy Beratan - Richardson TX
  • Assignee:
    Texas Instruments Incorporated - Dallas TX
  • International Classification:
    H01L 2120
  • US Classification:
    438396, 438 3, 438244, 438387, 438253
  • Abstract:
    A capacitor dielectric with multiple layers of differing high dielectric constant materials such as SrTiO3 and BaSrTiO3 in which an inner layer has a higher dielectric constant but also higher leakage current than outer layers on each side of the inner layer which have lower leakage currents but also lower dielectric constants.
  • Pb Substituted Perovskites For Thin Films Dielectrics

    view source
  • US Patent:
    6432473, Aug 13, 2002
  • Filed:
    Jun 1, 1995
  • Appl. No.:
    08/458999
  • Inventors:
    Scott R. Summerfelt - Dallas TX
    Howard R. Beratan - Richardson TX
    Bernard M. Kulwicki - N. Attleboro MA
  • Assignee:
    Texas Instruments Incorporated - Dallas TX
  • International Classification:
    B05D 512
  • US Classification:
    427100, 4271263, 4273762
  • Abstract:
    The invention described is a method of forming an improved dielectric material by adding lead to an original perovskite material having an original critical grain size to form a lead enhanced perovskite material, then forming a layer of the lead enhanced perovskite material having an average grain size less than the original critical grain size whereby the dielectric constant of the layer is substantially greater than the dielectric constant of the original perovskite material with an average grain size similar to the average grain size of the layer. The critical grain size, as used herein, means the largest grain size such that the dielectric constant starts to rapidly decrease with decreasing grain sizes. Preferably, the lead enhanced perovskite material is further doped with one or more acceptor dopants whereby the resistivity is substantially increased and/or the loss tangent is substantially decreased. Preferably, the original perovskite material has a chemical composition ABO , where A is one or more monovalent, divalent or trivalent elements, and B is one or more pentavalent, tetravalent, trivalent or divalent elements.
  • Lightly Donor Doped Electrodes For High-Dielectric-Constant Materials

    view source
  • US Patent:
    6593638, Jul 15, 2003
  • Filed:
    Jun 7, 1995
  • Appl. No.:
    08/477957
  • Inventors:
    Scott R. Summerfelt - Dallas TX
    Howard R. Beratan - Richardson TX
    Bruce Gnade - Rowlett TX
  • Assignee:
    Texas Instruments Incorporated - Dallas TX
  • International Classification:
    H01L 2900
  • US Classification:
    257532, 257 43, 257917, 257310, 427 79, 4271263, 427226
  • Abstract:
    A preferred embodiment of this invention comprises a conductive lightly donor doped perovskite layer (e. g. lightly La doped BST ), and a high-dielectric-constant material layer (e. g. undoped BST ) overlaying the conductive lightly donor doped perovskite layer. The conductive lightly donor doped perovskite layer provides a substantially chemically and structurally stable electrical connection to the high-dielectric-constant material layer. A lightly donor doped perovskite generally has much less resistance than undoped, acceptor doped, or heavily donor doped HDC materials. The amount of donor doping to make the material conductive (or resistive) is normally dependent on the process conditions (e. g. temperature, atmosphere, grain size, film thickness and composition). This resistivity may be further decreased if the perovskite is exposed to reducing conditions.
  • Infrared Detector With Amorphous Silicon Detector Elements, And A Method Of Making It

    view source
  • US Patent:
    6777681, Aug 17, 2004
  • Filed:
    Apr 25, 2001
  • Appl. No.:
    09/844171
  • Inventors:
    Thomas R. Schimert - Ovilla TX
    Howard R. Beratan - Richardson TX
    Charles M. Hanson - Dallas TX
    Kevin L. Soch - Nevada City CA
    John H. Tregilgas - Richardson TX
  • Assignee:
    Raytheon Company - Waltham MA
  • International Classification:
    G01J 502
  • US Classification:
    2503384, 250330, 250332, 2503381
  • Abstract:
    An infrared detector ( ) includes a substrate ( ) having thereon an array of detector elements ( ). Each detector element has a membrane ( ), which includes an amorphous silicon layer ( ) in contact with at least two electrodes ( ) that are made of a titanium/aluminum alloy which absorbs infrared radiation. In order to obtain a desired temperature coefficient of resistance (TCR), the amorphous silicon layer may optionally be doped. The effective resistance between the electrodes is set to a desired value by appropriate configuration of the electrodes and the amorphous silicon layer. The membrane includes two outer layers ( ) made of an insulating material. Openings ( ) may optionally be provided through the membrane.
  • Integrated Circuit Ferroelectric Infrared Detector And Method

    view source
  • US Patent:
    6802987, Oct 12, 2004
  • Filed:
    Oct 21, 1999
  • Appl. No.:
    09/422380
  • Inventors:
    K R Udayakumar - Dallas TX
    Howard R. Beratan - Richardson TX
    Charles M. Hanson - Richardson TX
  • Assignee:
    Texas Instruments Incorporated - Dallas TX
  • International Classification:
    C04B 35465
  • US Classification:
    252 629R, 501136
  • Abstract:
    Ferroelectric materials useful in monolithic uncooled infrared imaging use Ca and Sn substitutions in PbTiO3 and also have alternatives with dopants such as Dy, Ho, Bi, Ce, and Fe. The ferroelectrics may also be used in non-volatile integrated circuit memories.
  • Optically Transitioning Thermal Detector Structures

    view source
  • US Patent:
    8513605, Aug 20, 2013
  • Filed:
    Apr 28, 2010
  • Appl. No.:
    12/799628
  • Inventors:
    Howard Beratan - Pittsburgh PA, US
  • Assignee:
    L-3 Communications Corporation - New York NY
  • International Classification:
    G01J 5/20
  • US Classification:
    2503384, 2503381
  • Abstract:
    A thermal absorption structure of a radiation thermal detector element may include an optically transitioning material configured such that optical conductivity of the thermal absorption structure is temperature sensitive and such that the detector element absorbs radiation less efficiently as its temperature increases, thus reducing its ultimate maximum temperature.
  • Optically Transitioning Thermal Detector Structures

    view source
  • US Patent:
    20130292789, Nov 7, 2013
  • Filed:
    Jun 28, 2013
  • Appl. No.:
    13/930844
  • Inventors:
    Howard Beratan - Pittsburgh PA, US
  • International Classification:
    H01L 37/00
  • US Classification:
    257467, 438 54, 438 55
  • Abstract:
    A thermal absorption structure of a radiation thermal detector element may include an optically transitioning material configured such that optical conductivity of the thermal absorption structure is temperature sensitive and such that the detector element absorbs radiation less efficiently as its temperature increases, thus reducing its ultimate maximum temperature.

Get Report for Howard R Beratan from Woodland Hills, CA, age ~70
Control profile