George C Emo

US Patent:

42322626, Nov 4, 1980

Filed:

Oct 12, 1978

Appl. No.:

5/950724

Inventors:

George C. Emo - Gahanna OH
Thomas G. Grau - Mendam Township, Morris Township NJ

International Classification:

G01R 3104
G01R 2702
G01R 1067

US Classification:

324 65P

Abstract:

Apparatus for testing connectors to detect the presence of contamination films and foreign material on the contact terminals of a connector. The testing apparatus comprises electrode apparatus (2) for use in engaging the contact terminals (701) of a connector (700) and support apparatus (3) intended to receive a connector and hold the connector in a fixed relationship to the electrode apparatus. The testing apparatus further comprises guide apparatus (4) for supporting electrodes (221) of the electrode apparatus and positioning apparatus (5) for enabling the guide apparatus to align the electrodes with the connector contact terminals and for enabling the electrode apparatus to engage the aligned electrodes with the connector contact terminal. Coupling apparatus (6) comprises a controller (60) arranged to selectively couple the engaged electrodes with electrical resistance measuring circuitry (100) to measure the resistance of a contamination film and foreign material appearing on the connector contact terminals.

US Patent:

42186536, Aug 19, 1980

Filed:

Oct 12, 1978

Appl. No.:

5/950723

Inventors:

George C. Emo - Gahanna OH

Assignee:

Bell Telephone Laboratories, Incorporated - Murray Hill NJ

International Classification:

G01R 3102

US Classification:

324421

Abstract:

Probe apparatus having a pair of folded electrodes is arranged for use in detecting and measuring contamination films and foreign material appearing on connector contact terminals. The probe apparatus (1) comprises an insulation support member (2) positioned between two dielectric elements (31, 41) each having a surface plated with electrically conducting elements (32, 42) joined at one end of the insulation member to form a folded electrode (33, 43) and left free at the other end to form two lead-in terminals (34, 35, 44, 45). The combined insulator support member and dielectric contact elements are mounted in a test head assembly so that operation of the test head assembly inserts the probe apparatus into a connector contact terminal to engage the two folded electrodes with the connector contact terminal. Electrical resistance measuring equipment coupled to the lead-in terminals measures the electrical resistance of contamination films and foreign material appearing on the connector contact terminal between the pair of folded electrodes.