A method of fabricating high aspect ratio ceramic structures in which a selected portion of perovskite or perovskite-like crystalline material is exposed to a high energy ion beam for a time sufficient to cause the crystalline material contacted by the ion beam to have substantially parallel columnar defects. Then selected portions of the material having substantially parallel columnar defects are etched leaving material with and without substantially parallel columnar defects in a predetermined shape having high aspect ratios of not less than 2 to 1. Etching is accomplished by optical or PMMA lithography. There is also disclosed a structure of a ceramic which is superconducting at a temperature in the range of from about 10Â K. to about 90Â K. with substantially parallel columnar defects in which the smallest lateral dimension of the structure is less than about 5 microns, and the thickness of the structure is greater than 2 times the smallest lateral dimension of the structure.
Vitalii K. Vlasko-Vlasov - Downers Grove IL, US Ulrich Welp - Lisle IL, US George W. Crabtree - Chicago IL, US
Assignee:
The United States of America as represented by the United States Department of Energy - Washington DC
International Classification:
G01R033/032 G01R033/02
US Classification:
3242441, 324260, 324753
Abstract:
A device and method for mapping magnetic fields of a sample at a resolution less than the wavelength of light without altering the magnetic field of the sample is disclosed. A device having a tapered end portion with a magneto-optically active particle positioned at the distal end thereof in communication with a fiber optic for transferring incoming linearly polarized light from a source thereof to the particle and for transferring reflected light from the particle is provided. The fiber optic has a reflective material trapping light within the fiber optic and in communication with a light detector for determining the polarization of light reflected from the particle as a function of the strength and direction of the magnetic field of the sample. Linearly polarized light from the source thereof transferred to the particle positioned proximate the sample is affected by the magnetic field of the sample sensed by the particle such that the difference in polarization of light entering and leaving the particle is due to the magnetic field of the sample. Relative movement between the particle and sample enables mapping.
Name / Title
Company / Classification
Phones & Addresses
George W. Crabtree Associate Division Director, Materials Science Div
Argonne National Labs Testing Laboratory
9700 S Cass Ave, Lemont, IL 60439
Resumes
Senior Scientist And Distinguished Fellow At Argonne National Laboratory
Senior Scientist and Distinguished Fellow at Argonne National Laboratory
Location:
Greater Chicago Area
Industry:
Research
Work:
Argonne National Laboratory since 1990
Senior Scientist and Distinguished Fellow
Argonne National Laboratory 2001 - 2008
Division Director, Materials Science
Northern Illinois University 1989 - 2003
Professor of Physics (25%)
Education:
University of Illinois at Chicago 1969 - 1974
Ph.D., Condensed Matter Physics
Honor & Awards:
U.S. Department of Energy Awards for Outstanding Scientific Accomplishment in Solid State Physics, 1982, 1985, 1995, 1997
Fellow, American Physical Society, 1983
R&D 100 Award, “Magnetic Flux Imaging System,” 1996
Federal Laboratory Consortium Award for Technology Transfer, “Magnetic Flux Imaging System,” 1997
ISI Highly Cited Researcher in Physics since 2001
Kamerlingh Onnes Prize, 2003 (awarded once every three years)
Member, National Academy of Sciences, elected 2008
Kilpatrick Lecturer, Illinois Institute of Technology, 2005
Vaden Miles Lecturer, Wayne State University, Detroit MI, 2009
Birnbaum Lecturer, University of Illinois at Urbana-Champaign, 2009