Gene A. Robillard - Stoneham MA Richard S. Holland - Framingham MA Robert N. Graney - Northboro MA John W. Marciniec - Framingham MA John D. Mullarkey - Salem MA Paul H. Rourke - Pelham NH
Assignee:
BAE Systems Information and Electronic Systems Integration Inc. - Nashua NH
International Classification:
F25D 2312
US Classification:
622592, 438 73, 25033903, 250352, 165 81
Abstract:
Techniques for minimizing stress induced by temperature changes in an integrated circuit (e. g. , focal plane array or processor) or other such assemblies that include materials having mismatched coefficients of thermal expansion/contraction are disclosed. A thermal interface including a flexible comb-like pattern enables compensation for mismatched coefficients thereby reducing thermal-related stress.
Raymond J. Silva - Saugus MA, US Dennis Bowler - Sudbury MA, US Gene Robillard - Stoneham MA, US
Assignee:
BAE Systems Information and Electronic Systems Integration Inc. - Nashua NH
International Classification:
H04N 3/14 H04N 5/335
US Classification:
348294, 348298, 348308
Abstract:
A composite focal plane assembly with an expandable architecture has a multi-layer, double-sided aluminum nitride (AlN) substrate and vertical architecture to achieve the dual function of focal plane and electronics backplane. Imaging dice and other electrical components are mounted and wire bonded to one surface and then direct backplane connectivity is provided on the opposing surface through a matrix of electrical contacts. In one embodiment, a flexible connector is sandwiched between the AlN focal plane and a FR-4 backplane is used to compensate for differences in coefficient of thermal expansion (CTE) between the AlN and commercially available high density circuit card connectors that are commonly manufactured from materials with CTE properties more closely approximating FR-4. In an alternate embodiment, the FR-4 and flexible connectors are eliminated by using high density circuit card connectors that are fabricated out of materials more closely matching the CTE of AlN.
BAE Systems Information and Electronic Systems Integration Inc. - Nashua NH, US Dennis P. Bowler - Sudbury MA, US Gene A. Robillard - Stoneham MA, US
Assignee:
BAE Systems Information and Electronic Systems Integration Inc. - Nashua NH
International Classification:
H01L 25/065 H04N 5/225
US Classification:
348374, 257443
Abstract:
A composite focal plane assembly with an expandable architecture has a multi-layer, double-sided aluminum nitride (AlN) substrate and vertical architecture to achieve the dual function of focal plane and electronics backplane. Imaging dice and other electrical components are mounted and wire bonded to one surface and then direct backplane connectivity is provided on the opposing surface through a matrix of electrical contacts. In one embodiment, a flexible connector is sandwiched between the AlN focal plane and a FR-4 backplane is used to compensate for differences in coefficient of thermal expansion (CTE) between the AlN and commercially available high density circuit card connectors that are commonly manufactured from materials with CTE properties more closely approximating FR-4. In an alternate embodiment, the FR-4 and flexible connectors are eliminated by using high density circuit card connectors that are fabricated out of materials more closely matching the CTE of AlN.
An improved method for providing electrical connection to a photodetector in a Dewar flask is disclosed. A plurality of conductive paths are formed on the inner flask of the Dewar. Each of the conductive paths extends from the side surface on to the top surface of the inner flask. A photodetector having lead tabs is mounted to the top surface of the inner flask with the lead tabs aligned with the conductive paths. The lead tabs are bonded to the conductive paths to provide electrical connection to the photodetector.
Method For Fabricating Lead Through For Dewar Flask
Gordon J. Burrer - Wayland MA Gene A. Robillard - Stoneham MA
Assignee:
Honeywell Inc. - Minneapolis MN
International Classification:
H01R 4300
US Classification:
29628
Abstract:
An improved method for fabricating lead throughs in a Dewar flask is disclosed. Each lead through is provided with a contact portion which is essentially parallel to the side surface of the inner flask. The contact portion is bonded to a conductive path on the side surface of the inner flask.
Robert F. Baur - Lynn MA David M. Comey - Concord MA Gene A. Robillard - Stoneham MA
Assignee:
Honeywell Inc. - Minneapolis MN
International Classification:
H01L 2714
US Classification:
357 30
Abstract:
An electromagnetic radiation detector has a first surface which receives incident electromagnetic radiation. The sides of the detector are sloped such that incident radiation does not initially strike the sides.
Process For Applying Electrical Conductors For Dewar Flask
An improved method for providing electrical conductive paths in a Dewar flask is disclosed. A thin metal film is deposited over the side and top of the inner flask of the Dewar. Portions of the metal film are then selectively removed to provide electrical conductive paths which extend from the side on to the top of the inner flask.
An improved method for providing electrical connection to a photodetector in a Dewar flask is disclosed. A plurality of conductive paths are formed on the inner flask of the Dewar. Each of the conductive paths extends from the side surface on to the top surface of the inner flask. A photodetector having lead tabs is mounted to the top surface of the inner flask with the lead tabs aligned with the conductive paths. The lead tabs are bonded to the conductive paths to provide electrical connection to the photodetector.