Friedrich J Taenzler

US Patent:

20100082278, Apr 1, 2010

Filed:

Sep 30, 2008

Appl. No.:

12/241479

Inventors:

Ganesh Parasuram Srinivasan - Richardson TX, US
Friedrich Johannes Taenzler - Plano TX, US

International Classification:

G06F 19/00
G06F 15/00

US Classification:

702 82, 702189

Abstract:

An apparatus for evaluating a system. The apparatus can include a storage element for receiving at least one time-varying output characteristic of the system, the time-varying output characteristic comprising a plurality of raw data points representing a plurality of measurements at a plurality of times; and a processing element communicatively coupled to the storage element. The processing element can be configured for partitioning the plurality of raw data points into a plurality of segments, calculating a plurality of estimated data points based on a plurality of mathematical expressions, and characterizing the system based on at least one figure of merit (FOM) computed from the plurality of estimated data points. In the apparatus, at least one of the plurality of mathematical expressions is associated with each of the plurality of segments.

US Patent:

20100228515, Sep 9, 2010

Filed:

Mar 6, 2009

Appl. No.:

12/399687

Inventors:

GANESH P. SRINIVASAN - DALLAS TX, US
FRIEDRICH J. TAENZLER - PLANO TX, US

Assignee:

TEXAS INSTRUMENTS INC - DALLAS TX

International Classification:

G01R 31/00
G06F 19/00

US Classification:

702124, 324537

Abstract:

A method of generating multi-frame test signals, a testing apparatus, and method for testing integrated circuits (ICs) with the multi-frame test signals. An analog source generates an analog source signal at a constant power and a constant frequency that is modulated with a first modulating signal (e.g., I) to output a first test signal having first signal parameters including a power level, a frequency and a modulation scheme. The modulating is repeated with a second modulating signal (e.g., Q) to output a second test signal having second signal parameters including a power level, a frequency and a modulation scheme. At least one of the first and second signal parameters are different. The modulating signals are generated by a digital signal source. The first and second test signal are combined by placing the first test signal on the first frame (frame ) and the second test signal on the second frame (frame ) of the multi-frame test signal.

US Patent:

20120169359, Jul 5, 2012

Filed:

Dec 29, 2010

Appl. No.:

12/980638

Inventors:

Bruce C. Kim - Tuscaloosa AL, US
Ganesh Srinivasan - Dallas TX, US
Friedrich Taenzler - Plano TX, US

Assignee:

The Board of Trustees of the University of Alabama for and on behalf of the University of Alabama - Tuscaloosa AL

International Classification:

G01R 31/28

US Classification:

32475001

Abstract:

Embodiments include a method and system for testing an electric circuit. A carrier signal of a first frequency is modulated with a multi-tone signal to generate a test signal. The test signal is applied to an input of a circuit under test (CUT). A crest factor of an output signal that corresponds to the test signal received at an output of the CUT is measured. A crest factor differential between the measured crest factor and a reference crest factor is determined. If the crest factor differential exceeds a threshold value, the CUT is determined to be defective.