Eric A Reyes

US Patent:

20210390458, Dec 16, 2021

Filed:

Jun 15, 2021

Appl. No.:

17/348493

Inventors:

- Boston MA, US
Lingjun Kang - Fairfax VA, US
Andrey Mukomolov - Munich, DE
Joseph O'Hallaron - Denver CO, US
Eric Reyes - Boston MA, US
Rohit Sharma - Copenhagen, DK
Kevin Stofan - Saint Petersburg FL, US
Pavel Tyslacki - Minsk, BY

International Classification:

G06N 20/00
G06F 16/29
G06F 16/28

Abstract:

Automated spatial feature engineering techniques may include (1) automatically deriving new features (e.g., spatial lags) based on spatial relationships between or among observations, (2) using parameter optimization techniques to optimize parameters of the spatial feature engineering process (e.g., parameters relating to the size of spatial neighborhoods and/or to the orders of spatial lags), (3) automatically deriving new spatial features representing geometric properties and/or spatial statistics associated with individual spatial observations, (4) determining the feature importance of location features, and/or (5) automatically partitioning spatial datasets such that spatial leakage is reduced, which generally leads to the development of more accurate spatial models. Such techniques may involve joint treatment of distinct location coordinate features as a single location feature for purposes of determining feature importance.

Author:

Eric Reyes

ISBN #:

0425202658