David K Talent

US Patent:

6757612, Jun 29, 2004

Filed:

Jul 8, 2002

Appl. No.:

10/189381

Inventors:

David L. Talent - Houston TX
Ken C. K. Cheung - Kailua HI
Daron L. Nishimoto - Kula HI

Assignee:

Oceanit Laboratories, Inc. - Honolulu HI

International Classification:

G06F 1900

US Classification:

702 2, 702 3

Abstract:

An orbital debris impact risk assessment and management model is provided for low-Earth orbit (LEO). The model is phenomenologically based, meaning real, theoretical and historical data of the LEO environment is used in conjunction with thermodynamic based code architecture to perform impact risk assessments. The format of the model is developed such that user friendliness and user adaptability are maximized. The model can be used as a stand-alone program (software) or run over the World-Wide Web as an application service provider (ASP). The model may be used to examine trends in the evolution of the LEO environment or to calculate likelihood of impacts for specific on-orbit assets or groups of assets.